Secondary ion mass spectrometry of sodium nitrate: comparison of ReO4− and Cs+ primary ions

Speciation of Nitrogen-Bearing Species Using Negative and Positive Secondary Ion Spectra with Nano Secondary Ion Mass Spectrometry

In this study, we demonstrate that Nano Secondary Ion Mass Spectrometry (NanoSIMS) can be used to differentiate different nitrogen-containing species commonly observed in atmospheric aerosol particles with micrometer or submicrometer spatial resolution, on the basis of the relative intensity of secondary ion signals, both in negative and positive secondary ion mode, without the need to chemically or physically separate the samples. Compounds tested include nitrate, nitrite, ammonium salts, urea, amino acids, sugars, organic acids, amides, triazine, imidazole, protein, and biological tissue. We show that NO2(-) secondary ions are unique to the decomposition of nitrate and nitrite salts, whereas NH4(+) secondary ions are unique to samples containing ammonium ions, with low signal intensities observed from amino groups but none from biological tissue. CN(-) signals are obtained from all nitrogen-bearing compounds, but relative signal intensities are the highest for organic nitrogen-containing compounds. We demonstrate that quantitative determination of the elemental fractions of carbon, oxygen, and nitrate in nanometer-sized aerosol samples using normalized secondary ion intensities is possible. We further demonstrate that stable isotope ratios measured on in-house standards of unknown isotopic composition using the (12)C(15)N(-)/(12)C(14)N(-) ratio (all nitrogen-containing species), the (15)N(16)O2(-)/(14)N(16)O2(-) ratio (nitrate and nitrite species), and the (15)NH4(+)/(14)NH4(+) ratio (ammonium salts, amino acids, and urea) are stable and sufficiently precise for nitrogen isotope analysis.

Cluster secondary ion mass spectrometry of polymers and related materials

Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the characterization of polymeric materials over the last decade, allowing for the ability to obtain spatially resolved surface and in-depth molecular information from many polymer systems. With the advent of new molecular sources such as C(60)(+), Au(3)(+), SF(5)(+), and Bi(3)(+), there are considerable increases in secondary ion signal as compared to more conventional atomic beams (Ar(+), Cs(+), or Ga(+)). In addition, compositional depth profiling in organic and polymeric systems is now feasible, without the rapid signal decay that is typically observed under atomic bombardment. The premise behind the success of cluster SIMS is that compared to atomic beams, polyatomic beams tend to cause surface-localized damage with rapid sputter removal rates, resulting in a system at equilibrium, where the damage created is rapidly removed before it can accumulate. Though this may be partly true, there are actually much more complex chemistries occurring under polyatomic bombardment of organic and polymeric materials, which need to be considered and discussed to better understand and define the important parameters for successful depth profiling. The following presents a review of the current literature on polymer analysis using cluster beams. This review will focus on the surface and in-depth characterization of polymer samples with cluster sources, but will also discuss the characterization of other relevant organic materials, and basic polymer radiation chemistry.

Comparison of primary monoatomic with primary polyatomic ions for the characterisation of polyesters with static secondary ion mass spectrometry

Static secondary ion mass spectrometry (S-SIMS) emerges as one of the most adequate methods for the surface characterisation of polymers with an information depth of essentially one monolayer. The continuing search for increased analytical sensitivity and specificity has led to exploring the use of polyatomic primary ions as an alternative to the traditionally applied monoatomic projectiles. As part of a systematic investigation on polyatomic bombardment of organic and inorganic solids, this paper focuses on selected polyesters. Mass spectra and ion yields are compared for layers deposited on silicon wafers by spincoating solutions with different concentrations of poly(epsilon-caprolactone) (PCL), poly(butylene adipate) (PBA) and poly(ethylene adipate) (PEA). Accurate mass measurements have been used to support the assignment of the ions and link the composition of the detected ions to the analyte structure. Use of polyatomic projectiles increases the yield of structural ions with a factor of +/-15, +/-30 and +/-10 for PCL, PBA and PEA, respectively, in comparison to bombardment with Ga+ primary ions, while the molecular specificity is improved by the detection of additional high m/z ions.

Hydration of Alumina Cluster Anions in the Gas Phase

Hydration reactions of anionic aluminum oxide clusters were measured using a quadrupole ion trap secondary ion mass spectrometer, wherein the number of Lewis acid sites were determined. The extent of hydration varied irregularly as cluster size increased and indicated that the clusters possessed condensed structures where the majority of the Al atoms were fully coordinated, with a limited number of undercoordinated sites susceptible to hydrolysis. For maximally hydrated ions, the number of OH groups per Al decreased in an exponential fashion from 4.0 in Al(1) cluster to 1.4 in the Al(9) cluster, which was greater than that expected for a highly hydroxylated surface but less than that for solution phase alumina clusters.

Systematization of the Mass Spectra for Speciation of Inorganic Salts with Static Secondary Ion Mass Spectrometry

The analytical use of mass spectra from static secondary ion mass spectrometry for the molecular identification of inorganic analytes in real life surface layers and microobjects requires an empirical insight in the signals to be expected from a given compound. A comprehensive database comprising over 50 salts has been assembled to complement prior data on oxides. The present study allows the systematic trends in the relationship between the detected signals and molecular composition of the analyte to be delineated. The mass spectra provide diagnostic information by means of atomic ions, structural fragments, molecular ions, and adduct ions of the analyte neutrals. The prediction of mass spectra from a given analyte must account for the charge state of the ions in the salt, the formation of oxide-type neutrals from oxy salts, and the occurrence of oxidation-reduction processes.

Ion-molecule reactions of gas-phase chromium oxyanions. CrxOyHz-+ O2

Chromium oxyanions, Cr(x)O(y)H(z)(-), were generated in the gas-phase using a quadrupole ion trap secondary ion mass spectrometer (IT-SIMS), where they were reacted with O(2). Only CrO(2)(-) of the Cr(1)O(y)H(z)(-) envelope was observed to react with oxygen, producing primarily CrO(3)(-). The rate constant for the reaction of CrO(2)(-) with O(2) was approximately 38% of the Langevin collision constant at 310 K. CrO(3)(-), CrO(4)(-), and CrO(4)H(-) were unreactive with O(2) in the ion trap. In contrast, Cr(2)O(4)(-) was observed to react with O(2) producing CrO(3)(-) + CrO(3) via oxidative degradation at a rate that was approximately 15% efficient. The presence of background water facilitated the reaction of Cr(2)O(4)(-) + H(2)O to form Cr(2)O(5)H(2)(-); the hydrated product ion Cr(2)O(5)H(2)(-) reacted with O(2) to form Cr(2)O(6)(-) (with concurrent elimination of H(2)O) at a rate that was 6% efficient. Cr(2)O(5)(-) also reacted with O(2) to form Cr(2)O(7)(-) (4% efficient) and Cr(2)O(6)(-) + O (2% efficient); these reactions proceeded in parallel. By comparison, Cr(2)O(6)(-) was unreactive with O(2), and in fact, no further O(2) addition could be observed for any of the Cr(2)O(6)H(z)(-) anions. Generalizing, Cr(x)O(y)H(z)(-) species that have low coordinate, low oxidation state metal centers are susceptible to O(2) oxidation. However, when the metal coordination is >3, or when the formal oxidation state is > or =5, reactivity stops.

Detection of fatty acids from intact microorganisms by molecular beam static secondary ion mass spectrometry

We report the use of a surface analysis approach, static secondary ion mass spectrometry (SIMS) equipped with a molecular (ReO(4)(-)) ion primary beam, to analyze the surface of intact microbial cells. SIMS spectra of 28 microorganisms were compared to fatty acid profiles determined by gas chromatographic analysis of transesterfied fatty acids extracted from the same organisms. The results indicate that surface bombardment using the molecular primary beam cleaved the ester linkage characteristic of bacteria at the glycerophosphate backbone of the phospholipid components of the cell membrane. This cleavage enables direct detection of the fatty acid conjugate base of intact microorganisms by static SIMS. The limit of detection for this approach is approximately 10(7) bacterial cells/cm(2). Multivariate statistical methods were applied in a graded approach to the SIMS microbial data. The results showed that the full data set could initially be statistically grouped based upon major differences in biochemical composition of the cell wall. The gram-positive bacteria were further statistically analyzed, followed by final analysis of a specific bacterial genus that was successfully grouped by species. Additionally, the use of SIMS to detect microbes on mineral surfaces is demonstrated by an analysis of Shewanella oneidensis on crushed hematite. The results of this study provide evidence for the potential of static SIMS to rapidly detect bacterial species based on ion fragments originating from cell membrane lipids directly from sample surfaces.

Secondary ion mass spectrometry of zeolite materials: observation of abundant aluminosilicate oligomers using an ion trap

Oligomeric oxyanions were observed in the secondary ion mass spectra (SIMS) of zeolite materials. The oxyanions have the general composition AlmSinO2(m+n)H(m-1)(-)(m+n = 2 to 8) and are termed dehydrates. For a given mass, multiple elemental compositions are possible because (Al + H) is an isovalent and isobaric substitute for Si. Using 18 keV Ga+ as a projectile, oligomer abundances are low relative to the monomers. Oligomer abundance can be increased by using the polyatomic projectile ReO4- (approximately 5 keV). Oligomer abundance can be further increased using an ion trap (IT-) SIMS; in this instrument, long ion lifetimes (tens of ms) and relatively high He pressure result in significant collisional stabilization and increased high-mass abundance. The dehydrates rapidly react with adventitious H2O present in the IT-SIMS to form mono-, di-, and trihydrates. The rapidity of the reaction and comparison to aluminum oxyanion hydration suggest that H2O adds to the aluminosilicate oxyanions in a dissociative fashion, forming covalently bound product ions. In addition to these findings, it was noted that production of abundant oligomeric aluminosilicates could be significantly increased by substituting the countercation (NH4+) with the larger alkali ions Rb+ and Cs+. This constitutes a useful tactic for generating large aluminosilicate oligomers for surface characterization and ion-molecule reactivity studies.

Identification of the nitrogen-based blister agents bis(2-chloroethyl)methylamine (HN-2) and tris(2-chloroethyl)amine (HN-3) and their hydrolysis products on soil using ion trap secondary ion mass spectrometry

The nitrogen blister agents HN-2 (bis(2-chloroethyl)methylamine) and HN-3 (tris(2-chloroethyl)amine) were directly analyzed on the surface of soil samples using ion trap secondary ion mass spectrometry (SIMS). In the presence of water, HN-1 (bis(2-choroethyl)ethylamine), HN-2 and HN-3 undergo hydrolysis to form N-ethyldiethanolamine, N-methyldiethanolamine and triethanolamine (TEA), respectively; these compounds can be readily detected as adsorbed species on soil particles. When soil samples spiked with HN-3 in alcohol were analyzed, 2-alkoxyethylamine derivatives were observed on the sample surfaces. This result shows that nitrogen blister agents will undergo condensation reactions with nucleophilic compounds and emphasizes the need for an analytical methodology capable of detecting a range of degradation and condensation products on environmental surfaces. The ability of ion trap SIMS to isolate and accumulate ions, and then perform tandem mass spectrometric analysis improves the detection of low-abundance surface contaminants and the selectivity of the technique. Utilizing these techniques, the limits of detection for HN-3 were studied as a function of surface coverage. It was found that HN-3 could be detected at a surface coverage of 0.01 monolayer, which corresponds to 20 ppm (mass/mass) for a soil having a surface area of 2.2 m(2) g(-1). TEA, the exhaustive hydrolysis product of HN-3, was detected at a surface coverage of 0.001 monolayer, which corresponds to 0.86 ppm.

Speciation of sodium nitrate and sodium nitrite using kiloelectronvolt energy atomic and polyatomic and megaelectronvolt energy atomic projectiles with secondary ion mass spectrometry

The negative-ion mass spectra produced by kiloelectronvolt energy (CsI)nCs+ (n = 0-2) and megaelectronvolt energy 252Cf fission fragment projectile impacts on NaNO3 and NaNO2 were collected and compared. The mass spectra generated by impacts of the kiloelectronvolt polyatomic primary ions on NaNO3 were markedly different from those derived from the fission fragment impacts, featuring higher relative intensities of nitrate (NO3-) specific secondary ions (those that reflect the sample stoichiometry). The most prominent secondary ion (SI) peaks produced from NaNO3 by the kiloelectronvolt energy projectiles were NO3- and Na(NO3)2-, both of which relate directly back to the chemical composition of the staring material. Likewise, the most prominent peaks produced by the kiloelectronvolt energy polyatomic projectile impacts on NaNO2 were NO2- and Na(NO2)2-. The fission fragment projectiles produced SI spectra from NaNO3 that were dominated by signals characteristic more of NaNO2, indicating that the megaelectronvolt energy ions induce considerable degradation of the nitrate solid. In addition, the fission fragment projectile produced relative negative SI intensity distributions that are remarkably similar to those reported in earlier studies of the use of laser desorption to produce SI signals from NaNO3. Of the projectiles examined in this study, the 20 keV (CsI)Cs+ projectile generated negative-ion mass spectra that best differentiated NaNO3 and NaNO2, primarily by producing a base peak in the NaNO3 spectrum that was unambiguously representative of the original sample stoichiometry.

SIMS of organic anions adsorbed onto an aminoethanethiol self-assembled monolayer: an approach for enhanced secondary ion emission

Secondary ion mass spectrometry (SIMS) was used to monitor the uptake of organic anions from solution by aminoethanethiol (AET) monolayers on Au substrates, as a test of the applicability of this monolayer as a substrate for organic SIMS analysis. Event-by-event bombardment and detection mode coupled with coincidence counting allowed the atomic and polyatomic projectile impacts on a particular sample surface to be compared simultaneously and under the same experimental conditions. The mass spectra produced from the monolayer surface and those from Au and Si blanks demonstrate that the AET monolayer is important to the uptake of the organic anion. The exchanged monolayer surfaces were used to measure secondary ion yields, defined as the number of secondary ions detected per incident primary ion, produced from ultrathin films by (CsI)nCs+ (n = 0-2) projectiles at the limit of single-ion impacts. The yield of a tetradecyl sulfate (IDS) anion was improved by a factor of 200 using the AET substrate instead of the thick salt target. The intact ion and fragment ion yield trends produced from the AET surface were measured as a function of number of atoms in the primary projectile and energy. We observed a yield increase for both the intact ion and the fragment ion with the projectile complexity and energy. The increase in yield per projectile atom was linear for the emission of intact TDS and intact dodecyl sulfate from the AET surfaces. A supralinear yield enhancement, however, was observed for the fragment ion SO3- when the three-atom (CsI)Cs+ cluster was used. The experiments demonstrate that the various organosulfate and suffonates are weakly bound to the AET surface and their adsorption to the AET monolayer is reversible. The utility of the AET monolayer on Au was also tested as a general substrate for the characterization of derivatized organic molecules with biological and industrial importance by TOF-SIMS.

Characterization of VX on concrete using ion trap secondary ionization mass spectrometry

The nerve agent VX (O-ethyl S-2-diisopropylaminoethyl methyl phosphonothiolate) was analyzed on the surface of concrete samples using an ion trap secondary ion mass spectrometer (IT-SIMS). It was found that VX could be detected down to an absolute quantity of 5 ng on a concrete chip, or to a surface coverage of 0.0004 monolayers on crushed concrete. To achieve these levels of detection, the m/z 268-->128 ion fragmentation was measured using MS2, where m/z 268 corresponds to [VX + H]+, and 128 corresponds to a diisopropylvinylammonium isomer, that is formed by the elimination of the phosphonothiolate moiety. Detection at these levels was accomplished by analyzing samples that had been recently exposed to VX, i.e., within an hour. When the VX-exposed concrete samples were aged, the SIMS signature for intact VX had disappeared, which signaled the degradation of the compound on the concrete surface. The VX signature was replaced by ions which are interpreted in terms of VX degradation products, which appear to be somewhat long lived on the concrete surface. These compounds include ethylmethylphosphonic acid (EMPA), diisopropyl taurine (DIPT), diisopropylaminoethanethiol (DESH), bis(diisopropylaminoethane) disulfide [(DES)2], and a particularly tenacious compound that may correspond to diisopropylvinylamine (DIVA), or an isomer thereof. It was found that the thiolamine-derived degradation products DIPT, DESH, and (DES)2 were removed with isopropyl alcohol extraction. However, the DIVA-related degradation product was observed to strongly adhere to the concrete surface for longer than one week. Although quantitation was not possible in this set of experiments, the results clearly show the rapid degradation of VX on concrete, as well as the surface sensitivity of the IT-SIMS for intact VX and its adsorptive degradation products.

Speciation analysis of oxides with static secondary ion mass spectrometry

Speciation analysis of inorganic solids, without dissolution of the sample, aims at specific molecular information. Two potentially useful microanalytical techniques emerge, namely, laser microprobe mass spectrometry (LMMS) and static secondary ion mass spectrometry (S-SIMS). This paper focuses on the molecular characterisation of oxides by application of the S-SIMS method. For this purpose, mass spectra of pure oxides were acquired under static conditions. Analytical parameters such as repeatability, accuracy and resolution were assessed. Also, the peak patterns in the mass spectra are discussed in connection with the older Plog model, describing the relative ion yield as a function of the cluster size. Finally, a comparison is made with the mass spectra from a S-SIMS library and with those obtained by Fourier transform LMMS. Copyright 1999 John Wiley & Sons, Ltd.

Analysis of VX on soil particles using ion trap secondary ion mass spectrometry

The direct detection of the nerve agent VX (methylphosphonothioic acid, S-[2-[bis(1-methylethyl)amino]ethyl] O-ethyl ester) on milligram quantities of soil particles has been achieved using ion trap secondary ion mass spectrometry (IT-SIMS). VX is highly adsorptive toward a wide variety of surfaces; this attribute makes detection using gas-phase approaches difficult but renders the compound very amenable to surface detection. An ion trap mass spectrometer, modified to perform SIMS, was employed in the present study. A primary ion beam (ReO4-) was fired on axis through the ion trap, where it impacted the soil particle samples. [VX + H]+, [VX + H]+ fragment ions, and ions from the chemical background were sputtered into the gas-phase environment of the ion trap, where they were either scanned out or isolated and fragmented (MS2). At a surface concentration of 0.4 monolayer, intact [VX + H]+, and its fragment ions, were readily observable above background. However, at lower concentrations, the secondary ion signal from VX became obscured by ions derived from the chemical background on the surface of the soil particles. MS2 analysis using the ion trap was employed to improve detection of lower concentrations of VX: detection of the 34S isotopic ion of [VX + H]+, present at a surface concentration of approximately 0.002 monolayer, was accomplished. The study afforded the opportunity to investigate the fragmentation chemistry of VX. Semiempirical calculations suggest strongly that the molecule is protonated at the N atom. Deuterium labeling showed that formation of the base peak ion (C2H4)N(i-C3H7)2+ involves transfer of the amino proton to the phosphonothioate moiety prior to, or concurrent with, C-S bond cleavage. To manage the risk associated with working with the compound, the vacuum unit of the IT-SIMS was located in a hood, connected by cables to the externally located electronics and computer.