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For: Schattschneider P, Hébert C, Jouffrey B. Orientation dependence of ionization edges in EELS. Ultramicroscopy 2001;86:343-53. [PMID: 11281154 DOI: 10.1016/s0304-3991(00)00125-x] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
Number Cited by Other Article(s)
1
Hetaba W, Löffler S, Willinger MG, Schuster ME, Schlögl R, Schattschneider P. Site-specific ionisation edge fine-structure of Rutile in the electron microscope. Micron 2014;63:15-9. [PMID: 24629520 DOI: 10.1016/j.micron.2014.02.008] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2013] [Revised: 02/12/2014] [Accepted: 02/12/2014] [Indexed: 10/25/2022]
2
Tatsumi K, Muto S, Rusz J. Energy loss by channeled electrons: a quantitative study on transition metal oxides. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2013;19:1586-1594. [PMID: 23985156 DOI: 10.1017/s1431927613013214] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
3
Zhang HR, Egerton RF, Malac M. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy. Micron 2012;43:8-15. [DOI: 10.1016/j.micron.2011.07.003] [Citation(s) in RCA: 64] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/18/2011] [Revised: 06/13/2011] [Accepted: 07/07/2011] [Indexed: 11/26/2022]
4
Schattschneider P, Verbeeck J. Theory of free electron vortices. Ultramicroscopy 2011;111:1461-8. [PMID: 21930017 PMCID: PMC3279051 DOI: 10.1016/j.ultramic.2011.07.004] [Citation(s) in RCA: 49] [Impact Index Per Article: 3.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/16/2011] [Revised: 07/04/2011] [Accepted: 07/14/2011] [Indexed: 10/29/2022]
5
Pennycook SJ, Varela M, Lupini AR, Oxley MP, Chisholm MF. Atomic-resolution spectroscopic imaging: past, present and future. JOURNAL OF ELECTRON MICROSCOPY 2009;58:87-97. [PMID: 19158206 DOI: 10.1093/jmicro/dfn030] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
6
Electron energy loss near edge structure (ELNES) spectra of AlN and AlGaN: A theoretical study using the Wien2k and Telnes programs. Micron 2008;39:690-7. [DOI: 10.1016/j.micron.2007.10.013] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
7
Arenal R, de la Peña F, Stéphan O, Walls M, Tencé M, Loiseau A, Colliex C. Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures. Ultramicroscopy 2008;109:32-8. [PMID: 18789838 DOI: 10.1016/j.ultramic.2008.07.005] [Citation(s) in RCA: 50] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/16/2008] [Revised: 07/04/2008] [Accepted: 07/23/2008] [Indexed: 10/21/2022]
8
Le Bossé JC, Epicier T, Jouffrey B. Polarization dependence in ELNES: Influence of probe convergence, collector aperture and electron beam incidence angle. Ultramicroscopy 2006;106:449-60. [PMID: 16442734 DOI: 10.1016/j.ultramic.2005.12.003] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/31/2005] [Revised: 12/07/2005] [Accepted: 12/15/2005] [Indexed: 11/18/2022]
9
Kirkland EJ. Some effects of electron channeling on electron energy loss spectroscopy. Ultramicroscopy 2005;102:199-207. [PMID: 15639350 DOI: 10.1016/j.ultramic.2004.09.010] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/20/2004] [Revised: 09/13/2004] [Accepted: 09/27/2004] [Indexed: 10/26/2022]
10
Schattschneider P, Jouffrey B. Channeling, localization and the density matrix in inelastic electron scattering. Ultramicroscopy 2003;96:453-62. [PMID: 12871807 DOI: 10.1016/s0304-3991(03)00107-4] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
11
Hébert C, Schattschneider P. A proposal for dichroic experiments in the electron microscope. Ultramicroscopy 2003;96:463-8. [PMID: 12871808 DOI: 10.1016/s0304-3991(03)00108-6] [Citation(s) in RCA: 30] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
12
Moreau P, Cheynet MC. Improved comparison of low energy loss spectra with band structure calculations: the example of BN filaments. Ultramicroscopy 2003;94:293-303. [PMID: 12524199 DOI: 10.1016/s0304-3991(02)00339-x] [Citation(s) in RCA: 26] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
13
Jouffrey B, Schattschneider P, Hébert C. Ionization edges: Some underlying physics and their use in electron microscopy. ACTA ACUST UNITED AC 2002. [DOI: 10.1016/s1076-5670(02)80072-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 03/29/2023]
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