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For: Rose H. The influence of plural scattering on the limit of resolution in electron microscopy. Ultramicroscopy 1975;1:167-9. [PMID: 1236031 DOI: 10.1016/s0304-3991(75)80022-2] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/26/2022]
Number Cited by Other Article(s)
1
Egerton R, Watanabe M. Spatial Resolution in Transmission Electron Microscopy. Micron 2022;160:103304. [DOI: 10.1016/j.micron.2022.103304] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/28/2022] [Revised: 05/05/2022] [Accepted: 05/19/2022] [Indexed: 10/18/2022]
2
Drees H, Müller E, Dries M, Gerthsen D. Electron-beam broadening in amorphous carbon films in low-energy scanning transmission electron microscopy. Ultramicroscopy 2018;185:65-71. [DOI: 10.1016/j.ultramic.2017.11.005] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/01/2017] [Revised: 10/30/2017] [Accepted: 11/13/2017] [Indexed: 11/24/2022]
3
Jones IP, Nicholls AW. Electron trajectory-linked phenomena in thin foil X-ray microanalysis. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1983.tb04214.x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
4
Electron Scattering and Diffusion. ACTA ACUST UNITED AC 1998. [DOI: 10.1007/978-3-540-38967-5_3] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/07/2023]
5
Fisk Johnson H, Isaacson M. An efficient analytical method for calculating the angular and energy distribution of electrons which have undergone plural scattering in amorphous materials. Ultramicroscopy 1988. [DOI: 10.1016/0304-3991(88)90227-6] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
6
High-Resolution Electron Microscopy of Surfaces. ACTA ACUST UNITED AC 1986. [DOI: 10.1007/978-3-642-46574-1_3] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
7
Rez P. A transport equation theory of beam spreading in the electron microscope. Ultramicroscopy 1983. [DOI: 10.1016/0304-3991(83)90302-9] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
8
Rose H, Fertig J. Influence of detector geometry on image properties of the STEM for thick objects. Ultramicroscopy 1976;2:77-87. [PMID: 1028211 DOI: 10.1016/s0304-3991(76)90518-0] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/25/2022]
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