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Citation(s) in RCA

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For: Risch L. The end of the CMOS roadmap—new landscape beyond. Materials Science and Engineering: C 2002. [DOI: 10.1016/s0928-4931(01)00419-2] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
Number Cited by Other Article(s)
1
Chang CC, Shu MC. The Chemical Origin of Defects on Silicon Dioxide Exposed to Ethanol. J Phys Chem B 2003. [DOI: 10.1021/jp027372+] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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