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For: Zhu Y, Wall J. Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory. Advances in Imaging and Electron Physics 2008. [DOI: 10.1016/s1076-5670(08)01012-4] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/03/2023]
Number Cited by Other Article(s)
1
Taurino A, Carlino E. The Relevance of Building an Appropriate Environment around an Atomic Resolution Transmission Electron Microscope as Prerequisite for Reliable Quantitative Experiments: It Should Be Obvious, but It Is a Subtle Never-Ending Story! MATERIALS (BASEL, SWITZERLAND) 2023;16:1123. [PMID: 36770131 PMCID: PMC9953716 DOI: 10.3390/ma16031123] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/25/2022] [Revised: 01/02/2023] [Accepted: 01/19/2023] [Indexed: 06/18/2023]
2
Zhu Y. Cryogenic Electron Microscopy on Strongly Correlated Quantum Materials. Acc Chem Res 2021;54:3518-3528. [PMID: 34473926 DOI: 10.1021/acs.accounts.1c00131] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
3
The correction of electron lens aberrations. Ultramicroscopy 2015;156:A1-64. [PMID: 26025209 DOI: 10.1016/j.ultramic.2015.03.007] [Citation(s) in RCA: 61] [Impact Index Per Article: 6.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/10/2014] [Revised: 03/07/2015] [Accepted: 03/12/2015] [Indexed: 11/23/2022]
4
Xin Y, Kynoch J, Han K, Liang Z, Lee PJ, Larbalestier DC, Su YF, Nagahata K, Aoki T, Longo P. Facility implementation and comparative performance evaluation of probe-corrected TEM/STEM with Schottky and cold field emission illumination. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2013;19:487-495. [PMID: 23458469 DOI: 10.1017/s1431927612014298] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
5
Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University. Micron 2012. [DOI: 10.1016/j.micron.2011.10.004] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
6
Zhu Y, Inada H, Nakamura K, Wall J. Imaging single atoms using secondary electrons with an aberration-corrected electron microscope. NATURE MATERIALS 2009;8:808-812. [PMID: 19767737 DOI: 10.1038/nmat2532] [Citation(s) in RCA: 64] [Impact Index Per Article: 4.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/18/2009] [Accepted: 08/19/2009] [Indexed: 05/28/2023]
7
Hitachi's Development of Cold-Field Emission Scanning Transmission Electron Microscopes. ACTA ACUST UNITED AC 2009. [DOI: 10.1016/s1076-5670(09)59004-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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