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For: Hofer F, Warbichler P, Kronberger H, Zweck J. Mapping the chemistry in nanostructured materials by energy-filtering transmission electron microscopy (EFTEM). Spectrochim Acta A Mol Biomol Spectrosc 2001;57:2061-2069. [PMID: 11666085 DOI: 10.1016/s1386-1425(01)00488-7] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Weiss AV, Koch M, Schneider M. Combining cryo-TEM and energy-filtered TEM for imaging organic core-shell nanoparticles and defining the polymer distribution. Int J Pharm 2019;570:118650. [DOI: 10.1016/j.ijpharm.2019.118650] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/02/2019] [Revised: 08/21/2019] [Accepted: 08/26/2019] [Indexed: 12/17/2022]
2
Parish CM, Miller MK. Aberration-corrected X-ray spectrum imaging and Fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014;20:613-626. [PMID: 24598435 DOI: 10.1017/s1431927614000312] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
3
Complementary microscopy techniques applied for optimizing the structure and performance of graphene-based hybrids. Ultramicroscopy 2012;119:97-101. [DOI: 10.1016/j.ultramic.2011.11.010] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/25/2011] [Revised: 10/06/2011] [Accepted: 11/14/2011] [Indexed: 11/17/2022]
4
MONTOYA E, BALS S, VAN TENDELOO G. Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAlO3/SrTiO3multilayers prepared by focused ion beam. J Microsc 2008;231:359-63. [DOI: 10.1111/j.1365-2818.2008.02055.x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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