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Ribet SM, Zeltmann SE, Bustillo KC, Dhall R, Denes P, Minor AM, Dos Reis R, Dravid VP, Ophus C. Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:1950-1960. [PMID: 37851063 DOI: 10.1093/micmic/ozad111] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/16/2023] [Revised: 08/29/2023] [Accepted: 09/24/2023] [Indexed: 10/19/2023]
Abstract
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably imperfect, introducing aberrations that limit resolution. Modern STEMs overcome this by using hardware aberration correctors comprised of many multipole elements, but these devices are complex, expensive, and can be difficult to tune. We demonstrate a design for an electrostatic phase plate that can act as an aberration corrector. The corrector is comprised of annular segments, each of which is an independent two-terminal device that can apply a constant or ramped phase shift to a portion of the electron beam. We show the improvement in image resolution using an electrostatic corrector. Engineering criteria impose that much of the beam within the probe-forming aperture be blocked by support bars, leading to large probe tails for the corrected probe that sample the specimen beyond the central lobe. We also show how this device can be used to create other STEM beam profiles such as vortex beams and probes with a high degree of phase diversity, which improve information transfer in ptychographic reconstructions.
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Affiliation(s)
- Stephanie M Ribet
- Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
- International Institute of Nanotechnology, Northwestern University, Evanston, IL 60208, USA
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Steven E Zeltmann
- Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, NY 14853, USA
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA
| | - Karen C Bustillo
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Rohan Dhall
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Peter Denes
- Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Andrew M Minor
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA 94720, USA
| | - Roberto Dos Reis
- Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
- International Institute of Nanotechnology, Northwestern University, Evanston, IL 60208, USA
- The NUANCE Center, Northwestern University, Evanston, IL 60208, USA
| | - Vinayak P Dravid
- Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA
- International Institute of Nanotechnology, Northwestern University, Evanston, IL 60208, USA
- The NUANCE Center, Northwestern University, Evanston, IL 60208, USA
| | - Colin Ophus
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
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2
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Dearg M, Roncaglia C, Nelli D, El Koraychy EY, Ferrando R, Slater TJA, Palmer RE. Frame-by-frame observations of structure fluctuations in single mass-selected Au clusters using aberration-corrected electron microscopy. NANOSCALE HORIZONS 2023; 9:143-147. [PMID: 37877366 DOI: 10.1039/d3nh00291h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/26/2023]
Abstract
The multi-dimensional potential energy surface (PES) of a nanoparticle, such as a bare cluster of metal atoms, controls both the structure and dynamic behaviour of the particle. These properties are the subject of numerous theoretical simulations. However, quantitative experimental measurements of critical PES parameters are needed to regulate the models employed in the theoretical work. Experimental measurements of parameters are currently few in number, while model parameters taken from bulk systems may not be suitable for nanosystems. Here we describe a new measurement methodology, in which the isomer structures of a single deposited nanocluster are obtained frame-by-frame in an aberration-corrected scanning transmission electron microscope (ac-STEM) in high angle annular dark field (HAADF) mode. Several gold clusters containing 309 ± 15 atoms were analysed individually after deposition from a mass-selected cluster source onto an amorphous carbon film. The main isomers identified are icosahedral (Ih), decahedral (Dh) and face-centred-cubic (fcc) (the bulk structure), alongside many amorphous (glassy) structures. The results, which are broadly consistent with static ac-STEM measurements of an ensemble of such clusters, open the way to dynamic measurements of many different nanoparticles of diverse sizes, shapes and compositions.
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Affiliation(s)
- Malcolm Dearg
- Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Cardiff CF24 4HF, UK.
- School of Physics, Engineering and Technology, University of York, York YO10 5DD, UK
| | - Cesare Roncaglia
- Dipartimento di Fisica, Universita di Genova, Via Dodecaneso 33, 16146 Genova, Italy
| | - Diana Nelli
- Dipartimento di Fisica, Universita di Genova, Via Dodecaneso 33, 16146 Genova, Italy
| | - El Yakout El Koraychy
- Dipartimento di Fisica, Universita di Genova, Via Dodecaneso 33, 16146 Genova, Italy
| | - Riccardo Ferrando
- Dipartimento di Fisica, Universita di Genova, Via Dodecaneso 33, 16146 Genova, Italy
| | - Thomas J A Slater
- Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Cardiff CF24 4HF, UK.
| | - Richard E Palmer
- Nanomaterials Lab, Swansea University, Bay Campus, Fabian Way, Swansea SA1 8EN, UK.
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3
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OUP accepted manuscript. Microscopy (Oxf) 2022; 71:i174-i199. [DOI: 10.1093/jmicro/dfab050] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2021] [Revised: 11/20/2021] [Accepted: 01/28/2022] [Indexed: 11/14/2022] Open
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4
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Liu C, Ma C, Xu J, Qiao R, Sun H, Li X, Xu Z, Gao P, Wang E, Liu K, Bai X. Development of in situ optical spectroscopy with high temporal resolution in an aberration-corrected transmission electron microscope. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2021; 92:013704. [PMID: 33514196 DOI: 10.1063/5.0031115] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/29/2020] [Accepted: 01/01/2021] [Indexed: 06/12/2023]
Abstract
Exploring the corresponding relation between structural and physical properties of materials at the atomic scale remains the fundamental problem in science. With the development of the aberration-corrected transmission electron microscopy (AC-TEM) and the ultrafast optical spectroscopy technique, sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution can be achieved, respectively. However, the attempt to combine both their advantages is still a great challenge. Here, we develop in situ optical spectroscopy with high temporal resolution in AC-TEM by utilizing a self-designed and manufactured TEM specimen holder, which has the capacity of sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution. The key and unique design of our apparatus is the use of the fiber bundle, which enables the delivery of focused pulse beams into TEM and collection of optical response simultaneously. The generated focused spot has a size less than 2 µm and can be scanned in plane with an area larger than 75 × 75 µm2. Most importantly, the positive group-velocity dispersion caused by glass fiber is compensated by a pair of diffraction gratings, thus resulting in the generation of pulse beams with a pulse width of about 300 fs (@ 3 mW) in TEM. The in situ experiment, observing the atomic structure of CdSe/ZnS quantum dots in AC-TEM and obtaining the photoluminescence lifetime (∼4.3 ns) in the meantime, has been realized. Further ultrafast optical spectroscopy with femtosecond-scale temporal resolution could be performed in TEM by utilizing this apparatus.
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Affiliation(s)
- Chang Liu
- School of Physics, Peking University, Beijing 100871, China
| | - Chaojie Ma
- School of Physics, Peking University, Beijing 100871, China
| | - Jinjing Xu
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
| | - Ruixi Qiao
- School of Physics, Peking University, Beijing 100871, China
| | - Huacong Sun
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
| | - Xiaomin Li
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
| | - Zhi Xu
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
| | - Peng Gao
- School of Physics, Peking University, Beijing 100871, China
| | - Enge Wang
- School of Physics, Peking University, Beijing 100871, China
| | - Kaihui Liu
- School of Physics, Peking University, Beijing 100871, China
| | - Xuedong Bai
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
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5
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Hungría AB, Calvino JJ, Hernández-Garrido JC. HAADF-STEM Electron Tomography in Catalysis Research. Top Catal 2019. [DOI: 10.1007/s11244-019-01200-2] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/07/2023]
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6
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Zaluzec NJ. Improving the sensitivity of X-ray microanalysis in the analytical electron microscope. Ultramicroscopy 2018; 203:163-169. [PMID: 30522788 DOI: 10.1016/j.ultramic.2018.11.008] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/04/2018] [Revised: 11/04/2018] [Accepted: 11/13/2018] [Indexed: 10/27/2022]
Abstract
A study of the influence of experimental parameters on the sensitivity of x-ray energy dispersive spectroscopy in the analytical electron microscope from 20-200 kV is conducted. Optimization of conditions in the next generation of aberration corrected AEM instrument coupled with an array configuration of SDD detectors can potentially yield a 10-20 fold improvement over older Si(Li) systems still in use today.
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Affiliation(s)
- Nestor J Zaluzec
- Photon Science Division, Argonne National Laboratory, Argonne, IL 60439, United States.
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7
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Oxley MP, Lupini AR, Pennycook SJ. Ultra-high resolution electron microscopy. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2017; 80:026101. [PMID: 28008874 DOI: 10.1088/1361-6633/80/2/026101] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The last two decades have seen dramatic advances in the resolution of the electron microscope brought about by the successful correction of lens aberrations that previously limited resolution for most of its history. We briefly review these advances, the achievement of sub-Ångstrom resolution and the ability to identify individual atoms, their bonding configurations and even their dynamics and diffusion pathways. We then present a review of the basic physics of electron scattering, lens aberrations and their correction, and an approximate imaging theory for thin crystals which provides physical insight into the various different imaging modes. Then we proceed to describe a more exact imaging theory starting from Yoshioka's formulation and covering full image simulation methods using Bloch waves, the multislice formulation and the frozen phonon/quantum excitation of phonons models. Delocalization of inelastic scattering has become an important limiting factor at atomic resolution. We therefore discuss this issue extensively, showing how the full-width-half-maximum is the appropriate measure for predicting image contrast, but the diameter containing 50% of the excitation is an important measure of the range of the interaction. These two measures can differ by a factor of 5, are not a simple function of binding energy, and full image simulations are required to match to experiment. The Z-dependence of annular dark field images is also discussed extensively, both for single atoms and for crystals, and we show that temporal incoherence must be included accurately if atomic species are to be identified through matching experimental intensities to simulations. Finally we mention a few promising directions for future investigation.
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Affiliation(s)
- Mark P Oxley
- Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
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8
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Ophus C, Rasool HI, Linck M, Zettl A, Ciston J. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples. ACTA ACUST UNITED AC 2016; 2:15. [PMID: 28003952 PMCID: PMC5127900 DOI: 10.1186/s40679-016-0030-1] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/18/2016] [Accepted: 11/24/2016] [Indexed: 11/29/2022]
Abstract
We develop an automatic and objective method to measure and correct residual aberrations in atomic-resolution HRTEM complex exit waves for crystalline samples aligned along a low-index zone axis. Our method uses the approximate rotational point symmetry of a column of atoms or single atom to iteratively calculate a best-fit numerical phase plate for this symmetry condition, and does not require information about the sample thickness or precise structure. We apply our method to two experimental focal series reconstructions, imaging a β-Si3N4 wedge with O and N doping, and a single-layer graphene grain boundary. We use peak and lattice fitting to evaluate the precision of the corrected exit waves. We also apply our method to the exit wave of a Si wedge retrieved by off-axis electron holography. In all cases, the software correction of the residual aberration function improves the accuracy of the measured exit waves.
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Affiliation(s)
- Colin Ophus
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, USA
| | - Haider I Rasool
- Department of Physics, University of California Berkeley, 366 LeConte Hall, Berkeley, MC 7300 USA ; Materials Science Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, USA
| | - Martin Linck
- Corrected Electron Optical Systems GmbH, Englerstrasse 28, 69126 Heidelberg, Germany
| | - Alex Zettl
- Department of Physics, University of California Berkeley, 366 LeConte Hall, Berkeley, MC 7300 USA ; Materials Science Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, USA
| | - Jim Ciston
- National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, USA
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9
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Miao J, Ercius P, Billinge SJL. Atomic electron tomography: 3D structures without crystals. Science 2016; 353:353/6306/aaf2157. [DOI: 10.1126/science.aaf2157] [Citation(s) in RCA: 130] [Impact Index Per Article: 16.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/01/2023]
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10
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Wen C, Smith DJ. Impact of dynamical scattering on quantitative contrast for aberration-corrected transmission electron microscope images. Micron 2016; 89:77-86. [PMID: 27522350 DOI: 10.1016/j.micron.2016.07.008] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/15/2016] [Revised: 07/22/2016] [Accepted: 07/23/2016] [Indexed: 10/21/2022]
Abstract
Aberration-corrected transmission electron microscope images taken under optimum-defocus conditions or processed offline can correctly reflect the projected crystal structure with atomic resolution. However, dynamical scattering, which will seriously influence image contrast, is still unavoidable. Here, the multislice image simulation approach was used to quantify the impact of dynamical scattering on the contrast of aberration-corrected images for a 3C-SiC specimen with changes in atomic occupancy and thickness. Optimum-defocus images with different spherical aberration (CS) coefficients, and structure images restored by deconvolution processing, were studied. The results show that atomic-column positions and the atomic occupancy for SiC 'dumbbells' can be determined by analysis of image contrast profiles only below a certain thickness limit. This limit is larger for optimum-defocus and restored structure images with negative CS coefficient than those with positive CS coefficient. The image contrast of C (or Si) atomic columns with specific atomic occupancy changes differently with increasing crystal thickness. Furthermore, contrast peaks for C atomic columns overlapping with neighboring peaks of Si atomic columns with varied Si atomic occupancy, which is enhanced with increasing crystal thickness, can be neglected in restored structure images, but the effect is substantial in optimum-defocus images.
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Affiliation(s)
- C Wen
- School of Science, Southwest University of Science and Technology, Mianyang 621010, China; Department of Physics, Arizona State University, Tempe, AZ 85287, USA.
| | - David J Smith
- Department of Physics, Arizona State University, Tempe, AZ 85287, USA
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11
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Tao F(F, Crozier PA. Atomic-Scale Observations of Catalyst Structures under Reaction Conditions and during Catalysis. Chem Rev 2016; 116:3487-539. [DOI: 10.1021/cr5002657] [Citation(s) in RCA: 203] [Impact Index Per Article: 25.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/23/2023]
Affiliation(s)
- Franklin (Feng) Tao
- Department
of Chemical and Petroleum Engineering, University of Kansas, Lawrence, Kansas 66045, United States
- Department
of Chemistry, University of Kansas, Lawrence, Kansas 66045, United States
| | - Peter A. Crozier
- School
of Engineering of Matter, Transport and Energy, Arizona State University, Tempe, Arizona 85287, United States
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12
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Su DS, Zhang B, Schlögl R. Electron microscopy of solid catalysts--transforming from a challenge to a toolbox. Chem Rev 2015; 115:2818-82. [PMID: 25826447 DOI: 10.1021/cr500084c] [Citation(s) in RCA: 142] [Impact Index Per Article: 15.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/08/2023]
Affiliation(s)
- Dang Sheng Su
- †Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China.,‡Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin, Germany
| | - Bingsen Zhang
- †Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China
| | - Robert Schlögl
- ‡Department of Inorganic Chemistry, Fritz Haber Institute of the Max Planck Society, Faradayweg 4-6, 14195 Berlin, Germany
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13
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Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells. Ultramicroscopy 2013. [DOI: 10.1016/j.ultramic.2013.07.005] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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14
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Smith DJ, Aoki T, Mardinly J, Zhou L, McCartney MR. Exploring aberration-corrected electron microscopy for compound semiconductors. Microscopy (Oxf) 2013; 62 Suppl 1:S65-73. [DOI: 10.1093/jmicro/dft011] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
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15
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Thiel K, Borgardt N, Plikat B, Seibt M. Mesoscopic properties of interfacial ordering in amorphous germanium on Si(111) determined by quantitative digital image series matching. Ultramicroscopy 2013; 126:1-9. [DOI: 10.1016/j.ultramic.2012.11.002] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/24/2012] [Revised: 11/07/2012] [Accepted: 11/13/2012] [Indexed: 11/29/2022]
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16
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Batson PE. The first years of the aberration-corrected electron microscopy century. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2012; 18:652-655. [PMID: 22849796 DOI: 10.1017/s1431927612001250] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
Aberration correction, after a 50 year incubation period of developing ideas and techniques while awaiting enabling technology, has transformed electron microscopy during the first dozen years of the 21st century. Some of the conditions that accompanied this transformation, the required complexity and its effect on the way microscopy is pursued, recent results that promise to change the field, and directions for the future are briefly described.
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Affiliation(s)
- Philip E Batson
- Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, Piscataway, NJ 08854, USA.
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17
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18
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Liu JJ. Advanced Electron Microscopy of Metal-Support Interactions in Supported Metal Catalysts. ChemCatChem 2011. [DOI: 10.1002/cctc.201100090] [Citation(s) in RCA: 214] [Impact Index Per Article: 16.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
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19
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New and unconventional approaches for advancing resolution in biological transmission electron microscopy by improving macromolecular specimen preparation and preservation. Micron 2011; 42:141-51. [DOI: 10.1016/j.micron.2010.05.006] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/28/2010] [Revised: 05/16/2010] [Accepted: 05/17/2010] [Indexed: 11/21/2022]
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20
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Friedrich H, Frederik PM, de With G, Sommerdijk NAJM. Imaging of Self-Assembled Structures: Interpretation of TEM and Cryo-TEM Images. Angew Chem Int Ed Engl 2010; 49:7850-8. [DOI: 10.1002/anie.201001493] [Citation(s) in RCA: 171] [Impact Index Per Article: 12.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/17/2023]
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21
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Abbildung selbstorganisierter Strukturen: Interpretation von TEM- und Kryo-TEM-Aufnahmen. Angew Chem Int Ed Engl 2010. [DOI: 10.1002/ange.201001493] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/18/2022]
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22
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Yamazaki T, Kotaka Y, Tsukada M, Kataoka Y. Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS method. Ultramicroscopy 2010; 110:1161-5. [DOI: 10.1016/j.ultramic.2010.04.011] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/09/2009] [Revised: 04/15/2010] [Accepted: 04/20/2010] [Indexed: 10/19/2022]
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23
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24
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Massover WH. Electron beam-induced radiation damage: the bubbling response in amorphous dried sodium phosphate buffer. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2010; 16:346-357. [PMID: 20374678 DOI: 10.1017/s1431927610000140] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
Irradiation of an amorphous layer of dried sodium phosphate buffer (pH = 7.0) by transmission electron microscopy (100-120 kV) causes rapid formation of numerous small spherical bubbles [10-100 A (= 1-10 nm)] containing an unknown gas. Bubbling is detected even with the first low-dose exposure. In a thin layer (ca. 100-150 A), bubbling typically goes through nucleation, growth, possible fusion, and end-state, after which further changes are not apparent; co-irradiated adjacent areas having a slightly smaller thickness never develop bubbles. In moderately thicker regions (ca. over 200 A), there is no end-state. Instead, a complex sequence of microstructural changes is elicited during continued intermittent high-dose irradiation: nucleation, growth, early simple fusions, a second round of extensive multiple fusions, general reduction of matrix thickness (producing flattening and expansion of larger bubbles, occasional bubble fission, and formation of very large irregularly-shaped bubbles by a third round of compound fusion events), and slow shrinkage of all bubbles. The ongoing lighter appearance of bubble lumens, maintenance of their rounded shape, and extensive changes in size and form indicate that gas content continues throughout their surprisingly long lifetime; the thin dense boundary layer surrounding all bubbles is proposed to be the main mechanism for their long lifetime.
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Affiliation(s)
- William H Massover
- Department of Biological Sciences, Rutgers University-Newark, Newark, NJ 07102-1811, USA.
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25
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Kuramochi K, Kotaka Y, Yamazaki T, Ohtsuka M, Hashimoto I, Watanabe K. Effect of convergent beam semiangle on image intensity in HAADF STEM images. Acta Crystallogr A 2009; 66:10-6. [DOI: 10.1107/s0108767309039750] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/07/2009] [Accepted: 09/30/2009] [Indexed: 11/10/2022] Open
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26
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Kuramochi K, Yamazaki T, Kotaka Y, Ohtsuka M, Hashimoto I, Watanabe K. Effect of chromatic aberration on atomic-resolved spherical aberration corrected STEM images. Ultramicroscopy 2009; 110:36-42. [DOI: 10.1016/j.ultramic.2009.09.003] [Citation(s) in RCA: 24] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/31/2009] [Revised: 08/24/2009] [Accepted: 09/09/2009] [Indexed: 10/20/2022]
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27
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Buban JP, Ramasse Q, Gipson B, Browning ND, Stahlberg H. High-resolution low-dose scanning transmission electron microscopy. JOURNAL OF ELECTRON MICROSCOPY 2009; 59:103-12. [PMID: 19915208 PMCID: PMC2857930 DOI: 10.1093/jmicro/dfp052] [Citation(s) in RCA: 52] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/11/2009] [Accepted: 09/24/2009] [Indexed: 05/24/2023]
Abstract
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.
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MESH Headings
- Electrons
- Image Processing, Computer-Assisted
- Imaging, Three-Dimensional
- Microscopy, Electron, Scanning Transmission/instrumentation
- Microscopy, Electron, Scanning Transmission/methods
- Microscopy, Electron, Transmission/instrumentation
- Microscopy, Electron, Transmission/methods
- Oxides/chemistry
- Proteins/chemistry
- Strontium/chemistry
- Titanium/chemistry
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Affiliation(s)
- James P Buban
- Department of Molecular and Cellular Biology, College of Biological Sciences, University of California at Davis, 1 Shields Ave, Davis, CA, USA.
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Lupini AR, Borisevich AY, Idrobo JC, Christen HM, Biegalski M, Pennycook SJ. Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEM. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2009; 15:441-453. [PMID: 19754980 DOI: 10.1017/s1431927609990389] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
The successful development of third-order aberration correctors in transmission electron microscopy has seen aberration-corrected electron microscopes evolve from specialist projects, custom built at a small number of sites to common instruments in many modern laboratories. Here we describe some initial results illustrating the two- and three-dimensional (3D) performance of an aberration-corrected scanning transmission electron microscope with a prototype improved aberration corrector designed to also minimize fifth-order aberrations and a new, higher brightness gun. We show that atomic columns separated by 0.63 A can be resolved and demonstrate detection of single dopant atoms with 3D sensitivity.
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Affiliation(s)
- A R Lupini
- Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, TN 37831, USA.
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Friedrich H, de Jongh PE, Verkleij AJ, de Jong KP. Electron Tomography for Heterogeneous Catalysts and Related Nanostructured Materials. Chem Rev 2009; 109:1613-29. [DOI: 10.1021/cr800434t] [Citation(s) in RCA: 210] [Impact Index Per Article: 14.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/21/2023]
Affiliation(s)
- Heiner Friedrich
- Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA, Utrecht, The Netherlands, and Molecular Cell Biology, Utrecht University, Padualaan 8, 2584 CH, Utrecht, The Netherlands
| | - Petra E. de Jongh
- Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA, Utrecht, The Netherlands, and Molecular Cell Biology, Utrecht University, Padualaan 8, 2584 CH, Utrecht, The Netherlands
| | - Arie J. Verkleij
- Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA, Utrecht, The Netherlands, and Molecular Cell Biology, Utrecht University, Padualaan 8, 2584 CH, Utrecht, The Netherlands
| | - Krijn P. de Jong
- Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA, Utrecht, The Netherlands, and Molecular Cell Biology, Utrecht University, Padualaan 8, 2584 CH, Utrecht, The Netherlands
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30
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Kisielowski C, Freitag B, Bischoff M, van Lin H, Lazar S, Knippels G, Tiemeijer P, van der Stam M, von Harrach S, Stekelenburg M, Haider M, Uhlemann S, Müller H, Hartel P, Kabius B, Miller D, Petrov I, Olson EA, Donchev T, Kenik EA, Lupini AR, Bentley J, Pennycook SJ, Anderson IM, Minor AM, Schmid AK, Duden T, Radmilovic V, Ramasse QM, Watanabe M, Erni R, Stach EA, Denes P, Dahmen U. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2008; 14:469-477. [PMID: 18793491 DOI: 10.1017/s1431927608080902] [Citation(s) in RCA: 137] [Impact Index Per Article: 8.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
Abstract
The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Sigma3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution. These results mark an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.
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Affiliation(s)
- C Kisielowski
- National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley, CA 94720, USA
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31
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Urban KW. Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy. Science 2008; 321:506-10. [DOI: 10.1126/science.1152800] [Citation(s) in RCA: 269] [Impact Index Per Article: 16.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/02/2022]
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32
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Krivanek OL, Dellby N, Keyse RJ, Murfitt MF, Own CS, Szilagyi ZS. Chapter 3 Advances in Aberration-Corrected Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2008. [DOI: 10.1016/s1076-5670(08)01003-3] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/20/2023]
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