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Hu X, Zhang Z, Lu Y, Liu R, Sun L, Parkin IP, Zhang X. One-step synthesis of Ag@PS nanospheres via flash nanoprecipitation. Appl Organomet Chem 2019. [DOI: 10.1002/aoc.4713] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/01/2023]
Affiliation(s)
- Xianxiang Hu
- National and Local Joint Engineering Research Center for Applied Technology of Hybrid Nanomaterials; Henan University; Kaifeng 475004 China
- Ministry of Education Key Laboratory of Advanced Civil Engineering Materials, School of Materials Science and Engineering, and Institute for Advanced Study; Tongji University; Shanghai 201804 China
| | - Zhijie Zhang
- National and Local Joint Engineering Research Center for Applied Technology of Hybrid Nanomaterials; Henan University; Kaifeng 475004 China
- Ministry of Education Key Laboratory of Advanced Civil Engineering Materials, School of Materials Science and Engineering, and Institute for Advanced Study; Tongji University; Shanghai 201804 China
| | - Yao Lu
- Nanoengineered Systems Laboratory, UCL Mechanical Engineering; University College London; London WC1E 7JE UK
| | - Rui Liu
- Ministry of Education Key Laboratory of Advanced Civil Engineering Materials, School of Materials Science and Engineering, and Institute for Advanced Study; Tongji University; Shanghai 201804 China
| | - Lei Sun
- National and Local Joint Engineering Research Center for Applied Technology of Hybrid Nanomaterials; Henan University; Kaifeng 475004 China
| | - Ivan P. Parkin
- Nanoengineered Systems Laboratory, UCL Mechanical Engineering; University College London; London WC1E 7JE UK
| | - Xia Zhang
- National and Local Joint Engineering Research Center for Applied Technology of Hybrid Nanomaterials; Henan University; Kaifeng 475004 China
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Philipp P, Rzeznik L, Wirtz T. Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2016; 7:1749-1760. [PMID: 28144525 PMCID: PMC5238654 DOI: 10.3762/bjnano.7.168] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/03/2016] [Accepted: 11/02/2016] [Indexed: 06/02/2023]
Abstract
The analysis of polymers by secondary ion mass spectrometry (SIMS) has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM), which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation) code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.
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Affiliation(s)
- Patrick Philipp
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Lukasz Rzeznik
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
| | - Tom Wirtz
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
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Turgut C, Sinha G, Lahtinen J, Nordlund K, Belmahi M, Philipp P. Optimizing the sputter deposition process of polymers for the Storing Matter technique using PMMA. JOURNAL OF MASS SPECTROMETRY : JMS 2016; 51:889-899. [PMID: 27747991 DOI: 10.1002/jms.3797] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/14/2016] [Revised: 06/01/2016] [Accepted: 06/03/2016] [Indexed: 06/06/2023]
Abstract
Quantitative analyses in secondary ion mass spectrometry (SIMS) become possible only if ionization processes are controlled. The Storing Matter technique has been developed to circumvent this so-called matrix effect, primarily for inorganic samples, but has also been extended to organic samples. For the latter, it has been applied to polystyrene in order to investigate the extent of damage in the polymer, its fragmentation during the sputter deposition process and the effect of the deposition process on the spectra taken by Time-of-Flight SIMS (ToF-SIMS). In this work, a multi-technique approach, which employs the Storing Matter technique for deposition and ToF-SIMS and X-ray photoelectron spectroscopy for characterization, is used to enhance the control of the deposition process, including the thickness of the deposit, the alteration of the source film and the influence of polymer composition on the Storing Matter process. Poly (methyl methacrylate) (PMMA) is used for this work. More detailed information about the sticking of polymer fragments on the metal collector is obtained by density functional theory calculations. This work allows for the conclusion that a part of the fragments deposited on the collector surface diffuses on the latter, reacts and recombines to form larger fragments. The behaviour observed for PMMA is similar to polystyrene, showing that oxygen has no major influence on the processes occurring during the sputter deposition process. Additionally, we have developed a new methodology using 2D ToF-SIMS images of the deposit to monitor the deposit thickness and to identify surface contaminations. The latter are not only located at the position of the deposit but all over the collector surface. Copyright © 2016 John Wiley & Sons, Ltd.
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Affiliation(s)
- Canan Turgut
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, L-4422, Luxembourg
- Institut Jean Lamour (IJL) CNRS UMR 7198, Université de Lorraine, Faculté des Sciences et Technologies, BP 70239, Vandoeuvre -les-Nancy Cedex, F-54506, France
| | - Godhuli Sinha
- Department of Applied Physics, Aalto University School of Science, Aalto, FI-00076, Finland
| | - Jouko Lahtinen
- Department of Applied Physics, Aalto University School of Science, Aalto, FI-00076, Finland
| | - Kai Nordlund
- Department of Physics, University of Helsinki, PO Box 43, Helsinki, FI-00014, Finland
| | - Mohammed Belmahi
- Institut Jean Lamour (IJL) CNRS UMR 7198, Université de Lorraine, Faculté des Sciences et Technologies, BP 70239, Vandoeuvre -les-Nancy Cedex, F-54506, France
| | - Patrick Philipp
- Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, Belvaux, L-4422, Luxembourg.
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