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Chen L, Guo C, Tao X, Ding X, Zhang K, Zhang C, Chen Q, Zheng Y, Li M, Zhang H, Xiong Y, Guan Y, Wu Z, Tian Y, Liu G. Structures of Liquid-Liquid Interfaces in Partially Miscible Systems Revealed by Soft X-ray Imaging. J Phys Chem Lett 2024; 15:8265-8271. [PMID: 39106046 DOI: 10.1021/acs.jpclett.4c01807] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 08/07/2024]
Abstract
The properties of liquid-liquid interfaces are intricately linked to its structure, with a particular focus on the concentration distribution within the interface. To obtain precise information regarding the concentration distribution, we have developed a high-resolution soft X-ray imaging method for liquid-liquid interfaces. This work focused on representative partially miscible systems, analyzing the interfacial concentration distribution profiles of water-alkanols under both steady-state and dynamic processes, and obtaining the diffusion coefficients of different water concentrations in alkanols. Significant disparities in concentration distributions and the concentration-related diffusion coefficients were observed despite comparable diffusion distances within the same system across different states. Meanwhile, it was found that alkanols exhibit adsorption phenomena at the interface. This newfound knowledge serves as a crucial stepping stone toward a deeper understanding of partially miscible systems. Our study opens a way to explore liquid-liquid interface information with high-resolution.
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Affiliation(s)
- Lijuan Chen
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Chenfei Guo
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Xiayu Tao
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Xu Ding
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Kuanqiang Zhang
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Chao Zhang
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Qiang Chen
- Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, China
| | - Yutong Zheng
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Meng Li
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Haonan Zhang
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Ying Xiong
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Yong Guan
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Zhao Wu
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Yangchao Tian
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
| | - Gang Liu
- University of Science and Technology of China, National Synchrotron Radiation Laboratory, Hefei, Anhui 230026, China
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