Direct Compositional Characterization of (U,Th)O 2 Powders, Microspheres, and Pellets Using TXRF

Total Reflection X-ray Fluorescence Spectrometry: A Comprehensive Review of Critical Components, Analytical Benefits and Practical Applications

Total reflection X-ray fluorescence spectrometry (TXRF) is a pivotal technique in modern atomic spectroscopy, distinguished by its capability for multi-element simultaneous determination, a wide dynamic concentration range, samples do not require acid digestion. Additionally, TXRF exhibits negligible matrix effects when samples are prepared as thin films. Based on these unique features, recent research efforts have increasingly employed laboratory-built TXRF systems for the determination of major and trace elements in various samples. Given the diverse and intricate nature of TXRF systems components, this paper provides an overview of critical components that constitute these systems, compares the influence of various parameters on analytical performance, and offers recommendations for component selection. Additionally, recent applications of laboratory-built TXRF in fields such as environmental monitoring, nuclear energy, and food safety are discussed, with a focus on sample preparation, analyzed elements, and quantitative analysis are presented together with analytical parameters such as detection limits and recoveries. By introducing the instrument components and their practical applications, this paper aims to guide researchers in the construction and optimization of TXRF systems, thereby promoting the advancement of TXRF in future research and practical applications.

Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials

The suitability and applications of Total reflection X-ray Fluorescence (TXRF) for characterization of nuclear materials are numerous. TXRF has been successfully applied for trace, minor and major determinations of constituents in nuclear materials such as fuel, clad, control rod, coolant, etc. The two major advantages of TXRF i.e. requirement of very small sample for analysis and non-requirement of matrix matched standards, make this technique further more attractive and suitable for nuclear industry. The applications of TXRF for trace analysis in nuclear materials such as fuel, clad, coolant and control rods are described in detail along with its applications for determination of major and speciation studies in TXRF mode.

Direct non-destructive total reflection X-ray fluorescence elemental determinations in zirconium alloy samples

The development of a direct non-destructive synchrotron-radiation-based total reflection X-ray fluorescence (TXRF) analytical methodology for elemental determinations in zirconium alloy samples is reported for the first time. Discs, of diameter 30 mm and about 1.6 mm thickness, of the zirconium alloys Zr-2.5%Nb and Zircalloy-4 were cut from plates of these alloys and mirror polished. These specimens were presented for TXRF measurements directly after polishing and cleaning. The TXRF measurements were made at the XRF beamline at Elettra synchrotron light source, Trieste, Italy, at two different excitation energies, 1.9 keV and 14 keV, for the determinations of low- and high-Z elements, respectively. The developed analytical methodology involves two complementary quantification schemes, i.e. using either the fundamental parameter method or relative sensitivity based method, allowing quantification of fifteen minor and trace elements with respect to Zr with very good precision and accuracy. In order to countercheck the TXRF analytical results, some samples were analyzed using the DC arc carrier distillation atomic emission spectrometry technique also, which shows an excellent agreement with the results of the TXRF-based methodology developed in this work. The present work resulted in a non-destructive TXRF elemental characterization methodology of metal and alloy samples avoiding the cumbersome dissolution and matrix separation which are normally required in other techniques and traditional methods of TXRF determination. In addition, the production of analytical waste could also be avoided to a large extent. Although the work was carried out for specific applications in the nuclear industry, it is equally suitable for other such samples in different industrial applications.

Direct Multielemental Trace Determinations in Plutonium Samples by Total Reflection X-ray Fluorescence Spectrometry Using a Very Small Sample Amount

A simple, safe, and sensitive method for direct multielemental trace determinations in plutonium samples using total reflection X-ray fluorescence (TXRF) spectrometry has been developed. A very small volume (2 μL) of the sample solutions was deposited on TXRF supports after separation of the plutonium matrix from these solutions. Since the amount of the plutonium deposited on the supports was in the ng level only fixed on the supports and the specimen spots were not disturbed during the sample preparation, the samples could be analyzed directly without putting the instrument in a glovebox. This approach avoided a cumbersome operation of the instrument in a glovebox, which is normally utilized for Pu-based samples using other techniques. Similarly, the requirement of small amounts of the samples minimized the radiation dose to the operator as well as a cumbersome problem of management of radioactive analytical waste of plutonium samples. The samples were analyzed using the TXRF spectra of the specimens, concentration of the internal standard Se or Ga and predetermined sensitivity values. The elemental detection limits for the elements K-Sr varied from 1.06 to 0.09 ng. The elements K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, Sr, Ba, Tl, and Pb were analyzed at μg/mL level. The analytical results of TXRF determinations showed average relative standard deviation (RSD) value of 4.5% (1σ, n = 3) and the TXRF determined results deviated from the expected values by 5.9% on average for samples prepared by adding multielements in plutonium solutions. Two real plutonium samples were also analyzed in similar manner. For the real plutonium sample solution the average RSD values of TXRF determinations were 10.6% (1σ, n = 3) for the elemental concentrations in the range of 0.2 to 61 μg/mL. These values are comparable with conventional trace element analytical techniques with added advantages mentioned above.

Poly(3,4-ethylenedioxythiophene)-Poly(styrenesulfonate)-Coated Glassy-Carbon Electrode for Simultaneous Voltammetric Determination of Uranium and Plutonium in Fast-Breeder-Test-Reactor Fuel

Uranium (U) and plutonium (Pu) contents in nuclear materials must be maintained to a definite level in order to get the desired performance of the fuel inside the reactor. Therefore, high accuracy and precision is an essential criterion for the determination of U and Pu. We already reported the voltammetric determination of Pu in the presence of U in fast-breeder-test-reactor (FBTR) fuel samples, but interfacial, coupled chemical reactions between U(IV) and Pu(IV) enhance the peak-current density of U(VI) reduction and thus make voltammetry unsuitable for the quantitative determination of U in the presence of Pu. Thus, developing a voltammetric method for the simultaneous determination of U and Pu is highly challenging. Herein, we report the simultaneous voltammetric determination of U and Pu in 1 M sulfuric acid (H₂SO₄) on a poly(3,4-ethylenedioxythiophene) (PEDOT)-poly(styrenesulfonate) (PSS)-modified glassy-carbon (GC) electrode (PEDOT-PSS/GC). The modified electrode shows enhanced performance compared with bare GC electrodes. The peak-current density for U(VI) reduction is enhanced in the presence of Pu(IV), but it attains saturation when [Pu]/[U] in solution is maintained ≥2. Hence, under these circumstances, the variation of Pu concentration no longer influences the U(VI)-reduction peak, and thus the quantitative determination of U in the presence of Pu is possible. No interference is observed from commonly encountered impurities present in FBTR fuel samples. This method shows accuracy and precision comparable to those of the biamperometry method. High robustness, fast analysis, simultaneous determination, reduced radiation exposure to the analyst, and ease of recovery of U and Pu from analytical waste makes it a suitable candidate to substitute the presently applied biamperometry method.

Selective Micellar Extraction of Ultratrace Levels of Uranium in Aqueous Samples by Task Specific Ionic Liquid Followed by Its Detection Employing Total Reflection X-ray Fluorescence Spectrometry

A task specific ionic liquid (TSIL) bearing phosphoramidate group, viz., N-propyl(diphenylphosphoramidate)trimethylammonium bis(trifluoromethanesulfonyl)imide, was synthesized and characterized by ¹H NMR, ¹³C NMR, ³¹P NMR, and IR spectroscopies, elemental (C H N S) analysis, and electrospray ionization mass spectrometry (ESI-MS). Using this TSIL a cloud point extraction (CPE) or micelle mediated extraction procedure was developed for preconcentration of uranium (U) in environmental aqueous samples. Total reflection X-ray fluorescence spectrometry was utilized to determine the concentration of U in the preconcentrated samples. In order to understand the mechanism of the CPE procedure, complexation study of the TSIL with U was carried out by isothermal calorimetric titration, liquid-liquid extraction, ³¹P NMR and IR spectroscopies, and ESI-MS. The developed analytical technique resulted in quantitative extraction efficiency of 99.0 ± 0.5% and a preconcentration factor of 99 for U. The linear dynamic range and method detection limit of the procedure were found to be 0.1-1000 ng mL^-1 and 0.02 ng mL^-1, respectively. The CPE procedure was found to tolerate a higher concentration of commonly available interfering cations and anions, especially the lanthanides. The developed analytical method was validated by determining the concentration of U in a certified reference material, viz., NIST SRM 1640a natural water, which was found to be in good agreement at a 95% confidence limit with the certified value. The method was successfully applied to the U determination in three natural water samples with ≤4% relative standard deviation (1σ).

Direct Determination of Oxidation States of Uranium in Mixed-Valent Uranium Oxides Using Total Reflection X-ray Fluorescence X-ray Absorption Near-Edge Spectroscopy

Total reflection X-ray fluorescence (TXRF)-based X-ray absorption near-edge spectroscopy has been used to determine the oxidation state of uranium in mixed-valent U₃O₈ and U₃O₇ uranium oxides. The TXRF spectra of the compounds were measured using variable X-ray energies in the vicinity of the U L₃ edge in the TXRF excitation mode at the microfocus beamline of the Indus-2 synchrotron facility. The TXRF-based X-ray absorption near-edge spectroscopy (TXRF-XANES) spectra were deduced from the emission spectra measured using the energies below and above the U L₃ edge in the XANES region. The data processing using TXRF-XANES spectra of U(IV), U(V), and U(VI) standard compounds revealed that U present in U₃O₈ is a mixture of U(V) and U(VI), whereas U in U₃O₇ is mixture of U(IV) and U(VI). The results obtained in this study are similar to that reported in literature using the U M edge. The present study has demonstrated the possibility of application of TXRF for the oxidation state determination and elemental speciation of radioactive substances in a nondestructive manner with very small amount of sample requirement.