Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

A simple equation to determine the shell thicknesses of core-shell nanoparticles based on XPS data of their elemental composition

A simple analytical expression is obtained relating the radius of the core, the thickness of the shell of nanoparticles, and the intensities of X-ray photoelectron lines from the core and shell, recorded during one experiment. The effective evaluation of the proposed equation was verified by comparison with the results of calculations of the parameters of core-shell nanoparticles (NPs) using known methods, as well as by comparing the results of ratios between the radius and thickness of the shell of specific NPs and their evaluations using the transmission electron microscopy method. The formula proposed in this work also allows using EDS data to estimate the core-shell parameters of nanoparticles. It is shown that the equation obtained in this work is not inferior to the solutions of the already existing approximate equations in terms of the accuracy of the determined parameters, but it is more convenient to use, since the data of one experiment are sufficient for its application. A simple approach to determine the thickness of a shell of NPs based on information about the elemental composition of the core-shell of NPs measured by X-ray photoelectron spectroscopy is developed.

A theoretical characterization method for non-spherical core-shell nanoparticles by XPS

Core-shell nanoparticles (NPs) are active research areas for their unique properties and wide applications. By changing the elemental composition in the core and shell, a series of core-shell NPs with specific functions can be obtained, where the sizes of the core and shell also influence the properties. X-ray photoelectron spectroscopy (XPS) is useful in this context as a means of quantitatively analyzing such NPs. The empirical formula proposed by Shard [J. Phys. Chem. C, 2012, 116(31), 16806-16813] for calculating the shell thickness of the spherical core-shell NPs has been verified by Powell et al. [J. Phys. Chem. C, 2016, 120(39), 22730-22738] through a simulation of XPS with Simulation of Electron Spectra for Surface Analysis (SESSA) software. However, real core-shell NPs are not necessarily ideal spheres; such NPs can have rich shapes and uneven thicknesses. This work aims to extend the Shard formula to non-ideal core-shell NPs. We have used a Monte Carlo simulation method to study the XPS signal variation with the shell thickness for several modeled non-spherical shapes of core-shell NPs including some complex geometric structures which are numerically constructed with finite-element triangular meshes. Five types of non-spherical shapes, i.e. egg, ellipsoid, rod, rough-surface, and star shapes, are considered, while the size parameters are varied over a wide range. The equivalent radius and equivalent thickness are defined to characterize the average size of the nanoparticles for the use of the Shard formula. We have thus derived an extended Shard formula for the specific core-shell NPs, with which the relative error between the predicted shell thickness and the real thickness can be reduced to less than 10%.

Composition, thickness, and homogeneity of the coating of core-shell nanoparticles-possibilities, limits, and challenges of X-ray photoelectron spectroscopy

Core–shell nanoparticles have attracted much attention in recent years due to their unique properties and their increasing importance in many technological and consumer products. However, the chemistry of nanoparticles is still rarely investigated in comparison to their size and morphology. In this review, the possibilities, limits, and challenges of X-ray photoelectron spectroscopy (XPS) for obtaining more insights into the composition, thickness, and homogeneity of nanoparticle coatings are discussed with four examples: CdSe/CdS quantum dots with a thick coating and a small core; NaYF₄-based upconverting nanoparticles with a large Yb-doped core and a thin Er-doped coating; and two types of polymer nanoparticles with a poly(tetrafluoroethylene) core with either a poly(methyl methacrylate) or polystyrene coating. Different approaches for calculating the thickness of the coating are presented, like a simple numerical modelling or a more complex simulation of the photoelectron peaks. Additionally, modelling of the XPS background for the investigation of coating is discussed. Furthermore, the new possibilities to measure with varying excitation energies or with hard-energy X-ray sources (hard-energy X-ray photoelectron spectroscopy) are described. A discussion about the sources of uncertainty for the determination of the thickness of the coating completes this review.

Improved Characteristics of CdSe/CdS/ZnS Core-Shell Quantum Dots Using an Oleylamine-Modified Process

CdSe/CdS with ZnS/ZnO shell quantum dots (QDs) are synthesized by a one-pot method with various oleylamine (OLA) contents. The crystal structures of the QDs were analyzed by X-ray diffractometry, which showed ZnS diffraction peaks. It was represented that the ZnS shell was formed on the surface of the CdSe/CdS core. Interestingly, QDs with a high OLA concentration exhibit diffraction peaks of ZnS/ZnO. As a result, the thermal stability of QDs with ZnS/ZnO shells exhibits better performance than those with ZnS shells. In addition, the photoluminescence intensity of QDs with ZnS/ZnO shells shows a relatively slow decay of 7.1% compared with ZnS shells at 85 °C/85% relative humidity aging test for 500 h. These indicate that QDs with different OLA modifications can form ZnS/ZnO shells and have good stability in a harsh environment. The emission wavelength of QDs can be tuned from 505 to 610 nm, suitable for micro-LED display applications.

Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES)

HAXPES enables the detection of buried interfaces with an increased photo electron sampling depth.

Analyzing the surface of functional nanomaterials-how to quantify the total and derivatizable number of functional groups and ligands

Functional nanomaterials (NM) of different size, shape, chemical composition, and surface chemistry are of increasing relevance for many key technologies of the twenty-first century. This includes polymer and silica or silica-coated nanoparticles (NP) with covalently bound surface groups, semiconductor quantum dots (QD), metal and metal oxide NP, and lanthanide-based NP with coordinatively or electrostatically bound ligands, as well as surface-coated nanostructures like micellar encapsulated NP. The surface chemistry can significantly affect the physicochemical properties of NM, their charge, their processability and performance, as well as their impact on human health and the environment. Thus, analytical methods for the characterization of NM surface chemistry regarding chemical identification, quantification, and accessibility of functional groups (FG) and surface ligands bearing such FG are of increasing importance for quality control of NM synthesis up to nanosafety. Here, we provide an overview of analytical methods for FG analysis and quantification with special emphasis on bioanalytically relevant FG broadly utilized for the covalent attachment of biomolecules like proteins, peptides, and oligonucleotides and address method- and material-related challenges and limitations. Analytical techniques reviewed include electrochemical titration methods, optical assays, nuclear magnetic resonance and vibrational spectroscopy, as well as X-ray based and thermal analysis methods, covering the last 5-10 years. Criteria for method classification and evaluation include the need for a signal-generating label, provision of either the total or derivatizable number of FG, need for expensive instrumentation, and suitability for process and production control during NM synthesis and functionalization.

Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements

The minimum information requirements needed to guarantee high-quality surface analysis data of nanomaterials are described with the aim to provide reliable and traceable information about size, shape, elemental composition and surface chemistry for risk assessment approaches. The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO₂ reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community.

Combining HR-TEM and XPS to elucidate the core-shell structure of ultrabright CdSe/CdS semiconductor quantum dots

Controlling thickness and tightness of surface passivation shells is crucial for many applications of core–shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the application-relevant functionality like a high photoluminescence (PL) quantum yield, calling for a whole nanoobject approach. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. In addition to demonstrating the potential of this novel whole nanoobject approach for determining architectures of small nanoparticles, the presented results also highlight challenges faced by different sizing and structural analysis methods and method-inherent uncertainties.

Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profiles

Scanning electron microscopy (SEM) is a practical tool to determine the dimensions of nanometer-scale features. Conventional width measurements use arbitrary criteria, e.g., a 50 % threshold crossing, to assign feature boundaries in the measured SEM intensity profile. To estimate the errors associated with such a procedure, we have simulated secondary electron signals from a suite of line shapes consisting of 30 nm tall silicon lines with varying width, sidewall angle, and corner rounding. Four different inelastic scattering models were employed in Monte Carlo simulations of electron transport to compute secondary electron image intensity profiles for each of the shapes. The 4 models were combinations of dielectric function theory with either the single-pole approximation (SPA) or the full Penn algorithm (FPA), and either with or without Auger electron emission. Feature widths were determined either by the conventional threshold method or by the model-based library (MBL) method, which is a fit of the simulated profiles to the reference model (FPA + Auger). On the basis of these comparisons we estimate the error in the measured width of such features by the conventional procedure to be as much as several nanometers. A 1 nm difference in the size of, e.g., a nominally 10 nm transistor gate would substantially alter its electronic properties. Thus, the conventional measurements do not meet the contemporary requirements of the semiconductor industry. In contrast, MBL measurements employing models with varying accuracy differed one from another by less than 1 nm. Thus, a MBL measurement is preferable in the nanoscale domain.

Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurements

Over the past three decades, the widespread utility and applicability of X-ray photoelectron spectroscopy (XPS) in research and applications has made it the most popular and widely used method of surface analysis. Associated with this increased use has been an increase in the number of new or inexperienced users which has led to erroneous uses and misapplications of the method. This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS. This first guide outlines steps appropriate for determining whether XPS is capable of obtaining the desired information, identifies issues relevant to planning, conducting and reporting an XPS measurement, and identifies sources of practical information for conducting XPS measurements. Many of the topics and questions addressed in this article also apply to other surface-analysis techniques.

The Chameleon Effect: Characterization Challenges Due to the Variability of Nanoparticles and Their Surfaces

Nanoparticles in a variety of forms are increasing important in fundamental research, technological and medical applications, and environmental or toxicology studies. Physical and chemical drivers that lead to multiple types of particle instabilities complicate both the ability to produce, appropriately characterize, and consistently deliver well-defined particles, frequently leading to inconsistencies, and conflicts in the published literature. This perspective suggests that provenance information, beyond that often recorded or reported, and application of a set of core characterization methods, including a surface sensitive technique, consistently applied at critical times can serve as tools in the effort minimize reproducibility issues.