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Huang T, Hou Y, Zheng H, Zhao L, Wang J, Jiang R, Hu S, Chu S, Zhang Y, Jia S, Wang J. Size-Dependent Electrochemical Performance Mediated by Stress-Induced Cracking in Zn 2SnO 4 Electrodes. ACS NANO 2024. [PMID: 38315444 DOI: 10.1021/acsnano.3c10144] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2024]
Abstract
Correlating the microscopic structural characteristics with the macroscopic electrochemical performance in electrode materials is critical for developing excellent-performance lithium-ion batteries, which however remains largely unexplored. Here, we show that the Zn2SnO4 (ZTO) nanowires (NWs) with smaller diameters (d < 5 nm) exhibit slower capacity fade rate and better cycling stability, as compared with the NWs with larger diameters ranging from tens to hundreds of nanometers. By applying in situ transmission electron microscopy (TEM), we discover a strong correlation of cracking behavior with the NW diameter. Upon the first lithiation, there exists a critical diameter of ∼80 nm, below which the NWs neither crack nor fracture, and above which the cracks could easily nucleate and propagate along the specific planes, resulting in the deteriorated cycling stability in larger sized electrodes. Further theoretical calculations based on the finite element model and the climbing image nudged elastic band method faithfully predict the size-dependent cracking behaviors, which may result from the synergistic effect of axial stress evolution as well as preferential Li-ion migration directions during the first lithiation. This work provides a real-time tracking of the tempo-spatial structural evolution of a single ZTO NW, which facilitates a fundamental understanding of how the sample size affects the electrochemical behavior and thus offers a reference for future battery design and application strategy.
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Affiliation(s)
- Tianlong Huang
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Yuxuan Hou
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - He Zheng
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Ligong Zhao
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Jiaheng Wang
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Renhui Jiang
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Shuaishuai Hu
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Shile Chu
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Ying Zhang
- Core Facility of Wuhan University, Wuhan 430072, China
| | - Shuangfeng Jia
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
| | - Jianbo Wang
- School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China
- Core Facility of Wuhan University, Wuhan 430072, China
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Wan H, Li S, Zhang XL, Wu L, Liu Z, Liu G, Gao C, Huang WQ, Deng H, Hu W, Gao F. Magnesium Mitigation Behavior in P2-Layered Sodium-Ion Battery Cathode. J Phys Chem Lett 2023; 14:10537-10544. [PMID: 37972416 DOI: 10.1021/acs.jpclett.3c02437] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2023]
Abstract
Heteroatom incorporation can effectively suppress the phase transition of layered sodium-ion battery cathode, but heteroatom behaviors during operating conditions are not completely understood at the atomic scale. Here, density functional theory calculations are combined with experiments to explore the mitigation behavior of Mg dopant and its mechanisms under operating conditions in P2-Na0.67Ni0.33Mn0.67O2. The void formed by Na extraction will pump some Mg dopants into Na layers from TM layers, and the collective diffusion of more than one Mg ion most likely occurs when the Mg content is relatively high in the TM layer, finally aggregating to form Mg-enrich regions (i.e., Mg segregation) apart from Ni vacancies. The void-pump-effect-induced Mg segregation effectively suppresses the P2-O2 phase transition owing to the stronger Mg-O electrostatic attraction that enhances the integrate of two adjacent oxygen layers and prevents the crack growth by mitigating the lattice volume variation under high-voltage cycling. Our work provides a fundamental understanding of heteroatom mitigation behavior in layered cathodes at the atomic level for next-generation energy storage technologies.
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Affiliation(s)
- Hui Wan
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
- School of Materials and Environmental Engineering, Changsha University, Changsha 410082, China
| | - Shu Li
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Xiang-Long Zhang
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Lichen Wu
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Zhixiao Liu
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Guangdong Liu
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Caitian Gao
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Wei-Qing Huang
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Huiqiu Deng
- Department of Applied Physics, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Wangyu Hu
- College of Materials Science and Engineering, Hunan University, Changsha 410082, China
| | - Fei Gao
- Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109, United States
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