Realizing Ultrafast Electron Pulse Self-Compression by Femtosecond Pulse Shaping Technique

Gigahertz streaking and compression of low-energy electron pulses

Although radio frequency (RF) technology is routinely employed for controlling high-energy pulses of electrons, corresponding technology has not been developed at beam energies below several kiloelectronvolts. In this work, we demonstrate transverse and longitudinal phase-space manipulation of low-energy electron pulses using RF fields. A millimeter-sized photoelectron gun is combined with synchronized streaking and compression cavities driven at frequencies of 0.5 and 2.5   GHz , respectively. The phase-controlled acceleration and deceleration of photoelectron pulses is characterized in the energy range of 50 -100   eV . Deflection from a transient space-charge cloud at a metal grid is used to measure a fourfold compression of 80 - eV electron pulses, from τ = 34 to τ = 8   ps pulse duration.

Ultrafast Imaging of Molecular Dynamics Using Ultrafast Low-Frequency Lasers, X-ray Free Electron Lasers, and Electron Pulses

The requirement of high space-time resolution and brightness is a great challenge for imaging atomic motion and making molecular movies. Important breakthroughs in ultrabright tabletop laser, X-ray, and electron sources have enabled the direct imaging of evolving molecular structures in chemical processes, and recent experimental advances in preparing ultrafast laser and electron pulses resulted in molecular imaging with femtosecond time resolution. This Perspective presents an overview of the versatile imaging methods of molecular dynamics. High-order harmonic generation imaging and photoelectron diffraction imaging are based on laser-induced ionization and rescattering processes. Coulomb explosion imaging retrieves molecular structural information by detecting the momentum vectors of fragmented ions. Diffraction imaging encodes molecular structural and electronic information in reciprocal space. We also present various applications of these ultrafast imaging methods in resolving laser-induced nuclear and electronic dynamics.

Control of the Longitudinal Compression and Transverse Focus of Ultrafast Electron Beam for Detecting the Transient Evolution of Materials

Ultrafast detection is an effective method to reveal the transient evolution mechanism of materials. Compared with ultra-fast X-ray diffraction (XRD), the ultra-fast electron beam is increasingly adopted because the larger scattering cross-section is less harmful to the sample. The keV single-shot ultra-fast electron imaging system has been widely used with its compact structure and easy integration. To achieve both the single pulse imaging and the ultra-high temporal resolution, magnetic lenses are typically used for transverse focus to increase signal strength, while radio frequency (RF) cavities are generally utilized for longitudinal compression to improve temporal resolution. However, the detection signal is relatively weak due to the Coulomb force between electrons. Moreover, the effect of RF compression on the transverse focus is usually ignored. We established a particle tracking model to simulate the electron pulse propagation based on the 1-D fluid equation and the 2-D mean-field equation. Under considering the relativity effect and Coulomb force, the impact of RF compression on the transverse focus was studied by solving the fifth-order Rung–Kutta equation. The results show that the RF cavity is not only a key component of longitudinal compression but also affects the transverse focusing. While the effect of transverse focus on longitudinal duration is negligible. By adjusting the position and compression strength of the RF cavity, the beam spot radius can be reduced from 100 μm to 30 μm under the simulation conditions in this paper. When the number of single pulse electrons remains constant, the electrons density incident on the sample could be increased from 3.18×1012 m−2 to 3.54×1013 m−2, which is 11 times the original. The larger the electron density incident on the sample, the greater the signal intensity, which is more conducive to detecting the transient evolution of the material.

Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers

A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the "medium" energy regime (1-10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples.