Evaluation of the Electrowetting Effect on the Interfacial Mechanics between Human Corneocytes and Nanoasperities

Effects of Temperature and Humidity on Energy Dissipation between Human Corneocytes and Nanoasperity Sliding Contacts

Human haptic perception relies on the ability of sensory receptors underneath the skin corneocyte layer to sense external load, where adhesion and friction play an essential role in nanoscale solid-solid contact. Energy dissipation present at the surface interface due to the change of separation distance during sliding contact was uncovered, but the energy dissipation of human finger skin cell-nanoprobe contact under humidity and temperature conditions has not been investigated yet. In this paper, the energy dissipation of skin corneocyte-nanoprobe interface under variation of both humidity, 0.05-80%RH, and temperature ranging from 25 to 40 °C is directly measured by atomic force microscopy (AFM). Analytical models of dissipation energy for this nanomaterial interface mechanism are developed, and the results are compared to the measured values. AFM measurements of dissipation energy reveal that the amount of dissipated energy caused by water meniscus stretching monotonically increases with humidity and temperature, resulting in adhesion and friction decreases. The purposed analytical model represents that dissipation energy trend.

Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function

AFM sharp tips are used to characterize nanostructures and quantify the mechanical properties of the materials in several areas of research. The analytical results can show unpredicted errors if we do not know the exact values of the AFM tip radius. There are many techniques of in situ measurements for determining the actual AFM tip radius, but they are limited to uncoated tips. This paper presents an alternative and simple method to determine the radii of coated tips and an uncoated tip. Pt-coated, Cr/Au-coated, and uncoated Si tips were used to scan a calibration standard grating in AFM contact mode with sub-nanonewton load to obtain the curved scan profile of the edge corner of the grating structure. The data points of the curved profile of each tip were fitted with a nonlinear regression function to estimate the curvature radius of the tip. The results show that the estimated radius of the coated tips is in the range of nominal values provided by the tip manufacturer, while the estimated radius of the uncoated Si tip is bigger than the nominal radius because of tip blunting during the scan. However, this method yields an accurate estimate of the tip radius with a low root mean squared error of the curve fitting results.