Opposite Surface and Bulk Solvatochromic Effects in a Molecular Spin-Crossover Compound Revealed by Ambient Pressure X-ray Absorption Spectroscopy

A newly designed compact CEY-XAFS cell in the soft X-ray region and its application to surface XAFS measurements under ambient-pressure conditions without photoinduced side effects

We report a newly designed compact cell to measure XAFS spectra with the conversion electron yield (CEY) method in the soft X-ray region under ambient-pressure gas conditions. Secondary electrons generated from the gas and sample by collision of X-ray-absorption-induced Auger electrons are collected by a positively biased collector electrode to obtain XAFS spectra. It was confirmed that this cell is applicable to soft X-ray surface XAFS measurements for different types of materials such as insulating organic materials and metal oxides under 1 bar gas conditions. During the measurements, photoinduced side effects were observed; i.e. photoinduced degradation of organic materials and photoinduced reduction/oxidation of metal oxides. We found that these photoinduced side effects can be sufficiently suppressed by controlling the measuring conditions. The presented measuring approach will enable surface XAFS spectra to be obtained in the soft X-ray region for various types of functional materials under ambient-pressure working conditions.

A complementary characterisation technique for spin crossover materials; the application of X-ray photoelectron spectroscopy for future device applications

Spin crossover (SCO) materials have long been studied for their inherent electronic switchability, which has been well investigated for potential application in electronic and switching devices. As the technologies for the fabrication of thin films and monolayers continue to develop at an exceedingly rapid pace, an emerging challenge for the SCO community has become the characterisation of spin transitions in the surface layers of a material, as well as understanding the origins of discrepancies observed between SCO in thin films and that of the bulk material. For the manufacture of such devices to become a reality, it is crucial to understand how spin crossover is affected by interactions with the substrate material and within thin films. As such, detailed analysis of the surface layers without interference from the substrate material emerged as a critical area of characterisation for future developments in SCO devices. In this regard, X-ray Photoelectron Spectroscopy (XPS) has emerged as a complementary technique for the analysis of SCO in the surface layers of a material, becoming an essential part of a multi-technique protocol that is driving advances in the field. Here we describe the complementary application of XPS to a variety of SCO materials, review major developments and provide illustrative examples of innovations made through surface analysis with XPS.

A mixed-spin spin-crossover thiozolylimine [Fe4L6]8+ cage

A mixed-spin spin-crossover thiozolylimine [Fe₄L₆]⁸⁺ tetrahedral cage is reported.