X-ray Photoelectron Spectroscopy with Electrical Modulation Can Be Used to Probe Electrical Properties of Liquids and Their Interfaces at Different Stages

AC-Modulated XPS Enables to Externally Control the Electrical Field Distributions on Metal Electrode/Ionic Liquid Devices

X-Ray Photoelectron Spectroscopy (XPS) has been utilized to extract local electrical potential profiles by recording core-level binding energy shifts upon application of the AC [square-wave (SQW)] bias with different frequencies. An electrochemical system consisting of a coplanar capacitor with a polyethylene membrane (PEM) coated with the Ionic Liquid (IL) N,N-diethyl-N-methyl-N-(2-methoxyethyl) ammonium bis(trifluoromethanesulfonyl)imide (DEME-TFSI) as the electrolyte is investigated. Analyses are carried out in operando, such that XPS measurements are recorded simultaneously with current measurements. ILs have complex charging/discharging processes, in addition to the formation of Electrical Double Layers (EDL) at the interfaces, and certain properties of these processes can be captured using AC modulation within appropriate time windows of observation. Herein, we select two frequencies, namely, 10 kHz and 0.1 Hz, to separate effects of the fast polarization and slow migratory motions, respectively. Moreover, the local potential developments after adding two equivalent series resistors at three different physical positions of the device have been carefully evaluated from the binding energy shifts in the F 1s peak representing the anion of the IL. This circuit modification allows us to quantify the AC currents passing through the device, as well as the system's impedance, in addition to revealing the potential variations due the IR drops. The complex AC-modulated local XPS data recorded can also be faithfully reproduced using the unmodulated F 1s spectrum and by convoluting it with electrical circuit output provided by the LT-Spice software. The outcome of these efforts is a more realistic equivalent circuit model, which can be related to chemical/physical makeup of the electrochemical system. An important finding of this methodology emerges as the possibility to induce additional local electrical field developments within the device, the directions of which can be reversed controllably.

Assessing Local Electrical Properties of Ionic Liquid/Metal Interfaces with Operando-XPS and by Incorporating Additional Circuit Elements

X-ray photoelectron spectroscopy (XPS) has been utilized to record binding energy changes upon applying direct current (DC) and/or alternating current (AC) (square-wave) bias with different frequencies on a coplanar capacitor, having an ionic liquid (IL) film as the electrolyte. Electrical potential developments in numerous locations on the device are extracted from the variations in binding energy positions of the atomic core levels, which together with electrochemical measurements are used to extract local information before and after insertion of additional resistors in series. The presence of the IL introduces complex charging/discharging processes with a direct influence on the electrical double layer (EDL) formation, some of which can be untangled from each other via AC modulation by choosing appropriate time windows of observation. Accordingly, under 10 kHz modulation, fast processes are sampled, which are associated with electronic currents, and effects of slow migratory currents can be measured using 0.1 Hz. The addition of serial resistors allows us to quantify AC currents passing through, which reveals the magnitude of the system's impedance under different conditions. This process surprisingly reverses differences(s) in the voltage developments between the low and high frequencies over the electrified electrodes compared to those over the porous membrane in between. Our approach turns XPS into a powerful electrical and surface-sensitive tool for extracting localized electrochemical properties in a noninvasive and direct way. We expect that a wider utilization of the technique will lead to better identification of the obstacles for developing the next-generation sensing, energy harvesting, and storage systems as well as devices for iontronic/neuromorphic applications.

Localized X-Ray Photoelectron Impedance Spectroscopy (LoXPIS) for Tapping into Charge-Dynamics of Ionic-Liquid Electrolytes within Energy Storage Devices

Many electrochemical devices are based on the fundamental process of ion migration and accumulation on surfaces. Complex interplay of molecular properties of ions and device dimensions control the entire process...

The Influence of Water Vapor on the Electrochemical Shift of an Ionic Liquid Measured by Ambient Pressure X-ray Photoelectron Spectroscopy

Ionic liquids (ILs) are considered to be one of the steppingstones to fabricate next generation electrochemical devices given their unique physical and chemical properties. The addition of water to ILs significantly impact electrochemical related properties including viscosity, density, conductivity, and electrochemical window. Herein we utilize ambient pressure X-ray photoelectron spectroscopy (APXPS) to examine the impact of water on values of the electrochemical shift (S), which is determined by measuring changes in binding energy shifts as a function of an external bias. APXPS spectra of C 1s, O 1s and N 1s regions are examined for the IL 1-butyl-3-methylimidazolium acetate, [C₄ mim][OAc], at the IL/gas interface as a function of both water vapor pressure and external bias. Results reveal that in the absence of water vapor there is an IL ohmic drop between the working electrode and quasi reference electrode, giving rise to chemical specific S values of less than one. Upon introducing water vapor, S values approach one as a function of increasing water vapor pressure, indicating a decrease in the IL ohmic drop as the IL/water mixture becomes more conductive and the potential drop is driven by the electric double layer at the electrode/IL interface.