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For: Bai H, Su X, Zhang Q, Uher C, Tang X, Wu J. Electrically Tunable Antiferroelectric to Paraelectric Switching in a Semiconductor. Nano Lett 2022;22:4083-4089. [PMID: 35549361 DOI: 10.1021/acs.nanolett.2c00787] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Number Cited by Other Article(s)
1
Xiao C, Zhai P, Fang K, Xia Z, Duan B, Feng X, Li G, Zhou L, Huang B, Guo Z, Zhang Q. Strain-Induced Defect Evolution for the Construction of Porous Cu2-xSe with Enhanced Thermoelectric Performance. ACS APPLIED MATERIALS & INTERFACES 2023;15:58529-58538. [PMID: 38053306 DOI: 10.1021/acsami.3c14996] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/07/2023]
2
Xu T, Zhang J, Shimada T, Wang J, Yang H. Intrinsic Atomic-Scale Antiferroelectric VOF3 Nanowire with Ultrahigh-Energy Storage Properties. NANO LETTERS 2023;23:9080-9086. [PMID: 37722001 DOI: 10.1021/acs.nanolett.3c02929] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 09/20/2023]
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