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Zhong T, Zeng L, Yang J, Shu Y, Sun L, Li Z, Chen H, Liu G, Qiao Z, Qu Y, Xu D, Li L, Li L. Fabrication and Characterization of Silicon-Based Antimonene Thin Film via Electron Beam Evaporation. MATERIALS (BASEL, SWITZERLAND) 2024; 17:1090. [PMID: 38473562 DOI: 10.3390/ma17051090] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/29/2024] [Revised: 02/14/2024] [Accepted: 02/25/2024] [Indexed: 03/14/2024]
Abstract
Antimonene has attracted much attention due to its excellent characteristics of high carrier mobility, thermoelectric properties and high stability. It has great application prospects in Q-switched lasers, laser protection and spintronics. At present, the epitaxy growth of antimonene mainly depends on molecular beam epitaxy. We have successfully prepared antimonene films on silicon, germanium/silicon substrates for the first time using electron beam evaporation coating and studied the effects of the deposition rate and substrate on the preparation of antimonene; film characterization was performed via confocal microprobe Raman spectroscopy, via X-ray diffraction and using a scanning electron microscope. Raman spectroscopy showed that different deposition rates can lead to the formation of different structures of antimonene, such as α phase and β phase. At the same time, it was found that the growth of antimonene is also affected by different substrates and ion beams.
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Affiliation(s)
- Tingting Zhong
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
| | - Lina Zeng
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Junfeng Yang
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
| | - Yichao Shu
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
| | - Li Sun
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Zaijin Li
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Hao Chen
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
| | - Guojun Liu
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Zhongliang Qiao
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Yi Qu
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Dongxin Xu
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
| | - Lianhe Li
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
| | - Lin Li
- College of Physics and Electronic Engineering, Hainan Normal University, Haikou 571158, China
- Key Laboratory of Laser Technology and Optoelectronic Functional Materials of Hainan Province, Hainan Normal University, Haikou 571158, China
- Hainan International Joint Research Center for Semiconductor Lasers, Hainan Normal University, Haikou 571158, China
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Lu H, Long R. Nonadiabatic Molecular Dynamics with Non-Condon Effect of Charge Carrier Dynamics. J Am Chem Soc 2024; 146:1167-1173. [PMID: 38127733 DOI: 10.1021/jacs.3c12687] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2023]
Abstract
Nonradiative multiphonon transitions play a crucial role in understanding charge carrier dynamics. To capture the non-Condon effect in nonadiabatic molecular dynamics (NA-MD), we develop a simple and accurate method to calculate noncrossing and crossing k-point NA coupling in momentum space on an equal footing and implement it with a trajectory surface hopping algorithm. Multiple k-point MD trajectories can provide sufficient nonzero momentum multiphonons coupled to electrons, and the momentum conservation is maintained during nonvertical electron transition. The simulations of indirect bandgap transition in silicon and intra- and intervalley transitions in graphene show that incorporation of the non-Condon effect is needed to correctly depict these types of charge dynamics. In particular, a hidden process is responsible for the delayed nonradiative electron-hole recombination in silicon: the thermal-assisted rapid trapping of an excited electron at the conduction band minimum by a long-lived higher energy state through a nonvertical transition extends charge carrier lifetime, approaching 1 ns, which is about 1.5 times slower than the direct bandgap recombination. For graphene, intervalley scattering takes place within about 225 fs, which can occur only when the intravalley relaxation proceeds to about 50 fs to gain enough phonon momentum. The intra- and intervalley scattering constitute energy relaxation, which completes within sub-500 fs. All the simulated time scales are in excellent agreement with experiments. The study establishes the underlying mechanisms for a long-lived charge carrier in silicon and valley scattering in graphene and underscores the robustness of the non-Condon approximation NA-MD method, which is suitable for rigid, soft, and large defective systems.
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Affiliation(s)
- Haoran Lu
- College of Chemistry and Key Laboratory of Theoretical & Computational Photochemistry of Ministry of Education, Beijing Normal University, Beijing 100875, People's Republic of China
| | - Run Long
- College of Chemistry and Key Laboratory of Theoretical & Computational Photochemistry of Ministry of Education, Beijing Normal University, Beijing 100875, People's Republic of China
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