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Podshivaylov EA, Frantsuzov PA. The model of sub-bandgap light induced all-optical luminescence switching of lead-halide perovskite microcrystals. J Chem Phys 2025; 162:194105. [PMID: 40377199 DOI: 10.1063/5.0245952] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/30/2024] [Accepted: 03/30/2025] [Indexed: 05/18/2025] Open
Abstract
The phenomenon of sub-bandgap light induced luminescence switching for lead tribromide perovskite microcrystals with excess lead was recently discovered by Wan et al., Adv. Mater. 35, 2209851 (2023). It was found that the photoluminescence caused by the high energy excitation light is suppressed by the control light, the photon energy of which is less than the bandgap of the crystal, and is restored after switching off the control light. We propose an original model of this phenomenon, taking into account the spatially distributed kinetics of charge carrier recombination and the creation/annihilation of trap states induced by both light sources. The model successfully reproduces the main features of light induced luminescence switching.
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Affiliation(s)
- Eduard A Podshivaylov
- Voevodsky Institute of Chemical Kinetics and Combustion SB RAS, 630090 Novosibirsk, Russia
| | - Pavel A Frantsuzov
- Voevodsky Institute of Chemical Kinetics and Combustion SB RAS, 630090 Novosibirsk, Russia
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2
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Youn SSO, Kim GY, Jo W. Structural Modifications due to Bi-Doping in MAPbBr 3 Single Crystals and Their Impact on Electronic Transport and Stability. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2407141. [PMID: 39380422 DOI: 10.1002/smll.202407141] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2024] [Revised: 09/17/2024] [Indexed: 10/10/2024]
Abstract
Doping strategy in lead halide perovskites is essential to enhance its optoelectrical properties and expand the potential applications. In this work, the mechanisms, for how dopants affect the overall structural, optical, electrical, and chemical properties and stability of lead halide perovskite materials, are investigated. This is done by specifically considering various bismuth (Bi) doping concentrations in MAPbBr3 single crystals grown using the inverse temperature crystallization method. The resultant doped single crystals exhibit a saturation point when Bi concentration exceeds 0.063% which is considered an optimum doping point. The highest thermal stability is also achieved at this doping concentration among the doped single crystals. This study clearly identifies how Bi doping affects the properties of MAPbBr3 and extends to consider stability, which has not been fully considered for MA-based perovskites previously. This will provide a clear understanding of evaluating doped perovskite materials for enhanced material properties, device performance, and stability.
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Affiliation(s)
- Sarah Su-O Youn
- Department of Physics, Ewha Womans University, Seoul, 03760, Republic of Korea
| | - Gee Yeong Kim
- Advanced Photovoltaic Research Center, Korea Institute of Science and Technology, Seoul, 02456, Republic of Korea
| | - William Jo
- Department of Physics, Ewha Womans University, Seoul, 03760, Republic of Korea
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3
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Chen Y, Luo Y, Duan Y, Xu X, Zhang Y, Liu Q, Gao Y, Xiao L, Yang H, Wang S. Photophysical Properties of Submicrometer Ultrathin Perovskite Single-Crystal Films. J Phys Chem Lett 2024:7931-7938. [PMID: 39073987 DOI: 10.1021/acs.jpclett.4c01473] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 07/31/2024]
Abstract
Organic-inorganic hybrid perovskite (OIHP) has attracted a great deal of interest with respect to diverse optoelectronic devices. However, the photophysical properties of the OIHP require further understanding because most of the investigations have been conducted with polycrystalline perovskites, which contain high-density structural defects. Here, diverse photophysical properties, including structural characterization, spectroscopic features, and photoexcited products, are studied in submicrometer CH3NH3PbBr3 ultrathin single-crystal (UTSC) films. Unlike polycrystalline films and large single crystals, the UTSC film provides a unique platform for studying spectroscopic characteristics of single-crystal perovskites. Compared with the polycrystalline film, the UTSC film presents an atomically flat morphology and near-perfect lattice with a lower defect density, leading to an isotropic system that can be applied in the construction of high-performance optoelectronic devices. Furthermore, a long lifetime emissive channel assigned to the trion is indicated, which is scarcely found in perovskite polycrystalline films. Our results profoundly improve our understanding of their photophysical properties and expand the horizons for perovskite materials in photonic applications.
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Affiliation(s)
- Yan Chen
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Yijie Luo
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Yiqun Duan
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Xiayuan Xu
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Yuxin Zhang
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Qinyun Liu
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Yunan Gao
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Lixin Xiao
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
| | - Hong Yang
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
- Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 030006, China
- Frontiers Science Center for Nano-optoelectronics, Peking University, Beijing 100871, China
- Peking University Yangtze Delta Institute of Optoelectronics, Nantong 226010, Jiangsu, China
| | - Shufeng Wang
- State Key Laboratory for Artificial Microstructure and Mesoscopic Physics, Department of Physics, Peking University, Beijing 100871, China
- Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 030006, China
- Frontiers Science Center for Nano-optoelectronics, Peking University, Beijing 100871, China
- Peking University Yangtze Delta Institute of Optoelectronics, Nantong 226010, Jiangsu, China
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4
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García-Fernández A, Kammlander B, Riva S, Rensmo H, Cappel UB. Composition dependence of X-ray stability and degradation mechanisms at lead halide perovskite single crystal surfaces. Phys Chem Chem Phys 2024; 26:1000-1010. [PMID: 38090991 DOI: 10.1039/d3cp05061k] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/04/2024]
Abstract
The multiple applications of lead halide perovskite materials and the extensive use of X-ray based techniques to characterize them highlight a need to understand their stability under X-ray irradiation. Here, we present a study where the X-ray stability of five different lead halide perovskite compositions (MAPbI3, MAPbCl3, MAPbBr3, FAPbBr3, CsPbBr3) was investigated using photoelectron spectroscopy. To exclude effects of thin film formation on the observed degradation behaviors, we studied clean surfaces of single crystals. Different X-ray resistance and degradation mechanisms were observed depending on the crystal composition. Overall, perovskites based on the MA+ cation were found to be less stable than those based on FA+ or Cs+. Metallic lead formed most easily in the chloride perovskite, followed by bromide, and only very little metallic lead formation was observed for MAPbI3. MAPbI3 showed one main degradation process, which was the radiolysis of MAI. Multiple simultaneous degradation processes were identified for the bromide compositions. These processes include ion migration towards the perovskite surface and the formation of volatile and solid products in addition to metallic lead. Lastly, CsBr formed as a solid degradation product on the surface of CsPbBr3.
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Affiliation(s)
- Alberto García-Fernández
- Division of Applied Physical Chemistry, Department of Chemistry, KTH - Royal Institute of Technology, 100 44 Stockholm, Sweden.
| | - Birgit Kammlander
- Division of Applied Physical Chemistry, Department of Chemistry, KTH - Royal Institute of Technology, 100 44 Stockholm, Sweden.
- Division of X-ray Photon Science, Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
| | - Stefania Riva
- Division of X-ray Photon Science, Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
| | - Håkan Rensmo
- Division of X-ray Photon Science, Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
| | - Ute B Cappel
- Division of Applied Physical Chemistry, Department of Chemistry, KTH - Royal Institute of Technology, 100 44 Stockholm, Sweden.
- Division of X-ray Photon Science, Department of Physics and Astronomy, Uppsala University, Box 516, 751 20 Uppsala, Sweden
- Wallenberg Initiative Materials Science for Sustainability, Department of Physics and Astronomy, Uppsala University, 751 20 Uppsala, Sweden
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5
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Alvarez A, Lédée F, García-Batlle M, López-Varo P, Gros-Daillon E, Guillén JM, Verilhac JM, Lemercier T, Zaccaro J, Marsal LF, Garcia-Belmonte G, Almora O. Ionic Field Screening in MAPbBr 3 Crystals Revealed from Remnant Sensitivity in X-ray Detection. ACS PHYSICAL CHEMISTRY AU 2023; 3:386-393. [PMID: 37520316 PMCID: PMC10375880 DOI: 10.1021/acsphyschemau.3c00002] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/17/2023] [Revised: 04/17/2023] [Accepted: 04/18/2023] [Indexed: 08/01/2023]
Abstract
Research on metal halide perovskites as absorbers for X-ray detection is an attractive subject due to the optimal optoelectronic properties of these materials for high-sensitivity applications. However, the contact degradation and the long-term instability of the current limit the performance of the devices, in close causality with the dual electronic-ionic conductivity of these perovskites. Herein, millimeter-thick methylammonium-lead bromide (MAPbBr3) single and polycrystalline samples are approached by characterizing their long-term dark current and photocurrent under X-ray incidence. It is shown how both the dark current and the sensitivity of the detectors follow similar trends at short-circuit (V = 0 V) after biasing. By performing drift-diffusion numerical simulations, it is revealed how large ionic-related built-in fields not only produce relaxations to equilibrium lasting up to tens of hours but also continue to affect the charge kinetics under homogeneous low photogeneration rates. Furthermore, a method is suggested for estimating the ionic mobility and concentration by analyzing the initial current at short-circuit and the characteristic diffusion times.
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Affiliation(s)
- Agustin
O. Alvarez
- Institute
of Advanced Materials, Universitat Jaume
I, 12071 Castelló, Spain
| | - Ferdinand Lédée
- Grenoble
Alpes University, CEA, LETI, DOPT, F38000 Grenoble, France
| | | | - Pilar López-Varo
- Institut
Photovoltaïque d’Ile-de-France (IPVF), 91120 Palaiseau, France
| | | | | | | | - Thibault Lemercier
- Grenoble
Alpes University, CNRS, Grenoble INP, Institut Néel, F38042 Grenoble, France
| | - Julien Zaccaro
- Grenoble
Alpes University, CNRS, Grenoble INP, Institut Néel, F38042 Grenoble, France
| | - Lluis F. Marsal
- Department
of Electronic, Electric and Automatic Engineering, Universitat Rovira i Virgili, 43007 Tarragona, Spain
| | | | - Osbel Almora
- Department
of Electronic, Electric and Automatic Engineering, Universitat Rovira i Virgili, 43007 Tarragona, Spain
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6
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Donchev V, Regaldo D, Georgiev S, Bojar A, da Lisca M, Kirilov K, Alvarez J, Schulz P, Kleider JP. Surface Photovoltage Study of Metal Halide Perovskites Deposited Directly on Crystalline Silicon. ACS OMEGA 2023; 8:8125-8133. [PMID: 36910941 PMCID: PMC9996577 DOI: 10.1021/acsomega.2c07664] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/30/2022] [Accepted: 02/17/2023] [Indexed: 06/18/2023]
Abstract
Perovskite (PVK) films deposited directly on n-type crystalline Si substrates were investigated by two operating modes of the surface photovoltage (SPV) method: (i) the metal-insulator-semiconductor (MIS) mode and (ii) the Kelvin probe force microscopy (KPFM). By scanning from 900 to 600 nm in the MIS mode, we consecutively studied the relatively fast processes of carrier generation, transport, and recombination first in Si, then on both sides of the PVK/Si interface, and finally in the PVK layer and its surface. The PVK optical absorption edge was observed in the range of 1.61-1.65 eV in good agreement with the band gap of 1.63 eV found from photoluminescence spectra. Both SPV methods evidenced an upward energy band bending at the PVK/n-Si interface generating positive SPV. Drift-diffusion modeling allowed us to analyze the shape of the wavelength dependence of the SPV. It was also observed that the intense illumination in the KPFM measurements induces slow SPV transients which were explained by the creation and migration of negative ions and their trapping at the PVK surface. Finally, aging effects were studied by measuring again SPV spectra after one-year storage in air, and an increase in the concentration of shallow defect states at the PVK/n-Si interface was found.
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Affiliation(s)
- Vesselin Donchev
- Faculty
of Physics, Sofia University, 5, blvd. J.Bourchier, BG-1164 Sofia, Bulgaria
| | - Davide Regaldo
- Laboratoire
de Génie Electrique et Electronique de Paris, Université Paris-Saclay, CentraleSupélec, CNRS, 91192 Gif-sur-Yvette, France
- Laboratoire
de Génie Electrique et Electronique de Paris, Sorbonne Université, CNRS, 75252 Paris, France
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
| | - Stefan Georgiev
- Faculty
of Physics, Sofia University, 5, blvd. J.Bourchier, BG-1164 Sofia, Bulgaria
| | - Aleksandra Bojar
- Laboratoire
de Génie Electrique et Electronique de Paris, Université Paris-Saclay, CentraleSupélec, CNRS, 91192 Gif-sur-Yvette, France
- Laboratoire
de Génie Electrique et Electronique de Paris, Sorbonne Université, CNRS, 75252 Paris, France
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
| | - Mattia da Lisca
- Laboratoire
de Génie Electrique et Electronique de Paris, Université Paris-Saclay, CentraleSupélec, CNRS, 91192 Gif-sur-Yvette, France
- Laboratoire
de Génie Electrique et Electronique de Paris, Sorbonne Université, CNRS, 75252 Paris, France
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
| | - Kiril Kirilov
- Faculty
of Physics, Sofia University, 5, blvd. J.Bourchier, BG-1164 Sofia, Bulgaria
| | - José Alvarez
- Laboratoire
de Génie Electrique et Electronique de Paris, Université Paris-Saclay, CentraleSupélec, CNRS, 91192 Gif-sur-Yvette, France
- Laboratoire
de Génie Electrique et Electronique de Paris, Sorbonne Université, CNRS, 75252 Paris, France
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
| | - Philip Schulz
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
| | - Jean-Paul Kleider
- Laboratoire
de Génie Electrique et Electronique de Paris, Université Paris-Saclay, CentraleSupélec, CNRS, 91192 Gif-sur-Yvette, France
- Laboratoire
de Génie Electrique et Electronique de Paris, Sorbonne Université, CNRS, 75252 Paris, France
- IPVF,
Institut Photovoltaïque d’Ile-de-France, 91120 Palaiseau France
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7
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He X, Deng Y, Ouyang D, Zhang N, Wang J, Murthy AA, Spanopoulos I, Islam SM, Tu Q, Xing G, Li Y, Dravid VP, Zhai T. Recent Development of Halide Perovskite Materials and Devices for Ionizing Radiation Detection. Chem Rev 2023; 123:1207-1261. [PMID: 36728153 DOI: 10.1021/acs.chemrev.2c00404] [Citation(s) in RCA: 41] [Impact Index Per Article: 20.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/03/2023]
Abstract
Ionizing radiation such as X-rays and γ-rays has been extensively studied and used in various fields such as medical imaging, radiographic nondestructive testing, nuclear defense, homeland security, and scientific research. Therefore, the detection of such high-energy radiation with high-sensitivity and low-cost-based materials and devices is highly important and desirable. Halide perovskites have emerged as promising candidates for radiation detection due to the large light absorption coefficient, large resistivity, low leakage current, high mobility, and simplicity in synthesis and processing as compared with commercial silicon (Si) and amorphous selenium (a-Se). In this review, we provide an extensive overview of current progress in terms of materials development and corresponding device architectures for radiation detection. We discuss the properties of a plethora of reported compounds involving organic-inorganic hybrid, all-inorganic, all-organic perovskite and antiperovskite structures, as well as the continuous breakthroughs in device architectures, performance, and environmental stability. We focus on the critical advancements of the field in the past few years and we provide valuable insight for the development of next-generation materials and devices for radiation detection and imaging applications.
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Affiliation(s)
- Xiaoyu He
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Yao Deng
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Decai Ouyang
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Na Zhang
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Jing Wang
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Akshay A Murthy
- Department of Materials Science and Engineering, Northwestern University Atomic and Nanoscale Characterization Experimental (NUANCE) Center, International Institute for Nanotechnology (IIN), and Department of Mechanical Engineering, Northwestern University, Evanston, Illinois60208, United States
| | - Ioannis Spanopoulos
- Department of Chemistry, University of South Florida, Tampa, Florida33620, United States
| | - Saiful M Islam
- Department of Chemistry, Physics, and Atmospheric Sciences, Jackson State University, Jackson, Mississippi39217, United States
| | - Qing Tu
- Department of Materials Science and Engineering, Texas A&M University, College Station, Texas77840, United States
| | - Guichuan Xing
- Institute of Applied Physics and Materials Engineering, University of Macau, Macao, SAR999078, People's Republic of China
| | - Yuan Li
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
| | - Vinayak P Dravid
- Department of Materials Science and Engineering, Northwestern University Atomic and Nanoscale Characterization Experimental (NUANCE) Center, International Institute for Nanotechnology (IIN), and Department of Mechanical Engineering, Northwestern University, Evanston, Illinois60208, United States
| | - Tianyou Zhai
- State Key Laboratory of Materials Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei430074, People's Republic of China
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