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Shin JC, Kwon SM, Kang J, Jeon SP, Heo JS, Kim YH, Cho SW, Park SK. Catalytic Metal-Accelerated Crystallization of High-Performance Solution-Processed Earth-Abundant Metal Oxide Semiconductors. ACS APPLIED MATERIALS & INTERFACES 2020; 12:25000-25010. [PMID: 32394695 DOI: 10.1021/acsami.0c04401] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
As an alternative strategy for conventional high-temperature crystallization of metal oxide (MO) channel layers, the catalytic metal-accelerated crystallization (CMAC) process using a metal seed layer is demonstrated for low-temperature crystallization of solution-processed MO semiconductors. In the CMAC process, the catalytic metal layer plays the role of seed sites for initiating and accelerating the crystallization of amorphous MO films. Generally, the solution-processed crystalline-TiO2 (c-TiO2) films required high-temperature crystallization conditions (≥500-600 °C), showing low electrical performance with a high defect density. In contrast, the suggested CMAC process could effectively lower crystallization temperature of the a-TiO2 films, enabling high-quality c-TiO2 films with well-aligned anatase grains and low-defect density. The various crystalline catalytic layers were deposited over the earth-abundant n-type amorphous titanium oxide (a-TiO2) films. Also, then, the CMAC process was performed for facile low-temperature translation of solution-processed a-TiO2 to a highly crystallized state. In particular, the Al-CMAC process using the crystalline thin-aluminum (Al) catalytic metal seed layer facilitates low-temperature (≥300 °C) crystallization of the solution-processed a-TiO2 films and the fabrication of high-performance solution-processed c-TiO2 thin-film transistors with superior field-effect mobility, good on/off switching behavior, and improved operational stability.
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Affiliation(s)
- Jae Cheol Shin
- School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea
| | - Sung Min Kwon
- School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea
| | - Jingu Kang
- School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea
| | - Seong Pil Jeon
- School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea
| | - Jae-Sang Heo
- Department of Medicine, University of Connecticut School of Medicine, Farmington, Connecticut 06030, United States
| | - Yong-Hoon Kim
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea
- SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 16419, Republic of Korea
| | - Sung Woon Cho
- Department of Printed Electronics Engineering, Sunchon National University, Sunchon, Jeonnam 57922, Republic of Korea
| | - Sung Kyu Park
- School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea
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Kang YH, Min BK, Kim SK, Bae G, Song W, Lee C, Cho SY, An KS. Proton Conducting Perhydropolysilazane-Derived Gate Dielectric for Solution-Processed Metal Oxide-Based Thin-Film Transistors. ACS APPLIED MATERIALS & INTERFACES 2020; 12:15396-15405. [PMID: 32148019 DOI: 10.1021/acsami.0c01274] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Perhydropolysilazane (PHPS), an inorganic polymer composed of Si-N and Si-H, has attracted much attention as a precursor for gate dielectrics of thin-film transistors (TFTs) due to its facile processing even at a relatively low temperature. However, an in-depth understanding of the tunable dielectric behavior of PHPS-derived dielectrics and their effects on TFT device performance is still lacking. In this study, the PHPS-derived dielectric films formed at different annealing temperatures have been used as the gate dielectric layer for solution-processed indium zinc oxide (IZO) TFTs. Notably, the IZO TFTs fabricated on PHPS annealed at 350 °C exhibit mobility as high as 118 cm2 V-1 s-1, which is about 50 times the IZO TFTs made on typical SiO2 dielectrics. The outstanding electrical performance is possible because of the exceptional capacitance of PHPS-derived dielectric caused by the limited hydrolysis reaction of PHPS at a low processing temperature (<400 °C). According to our analysis, the exceptional dielectric behavior is originated from the electric double layer formed by mobile of protons in the low temperature-annealed PHPS dielectrics. Furthermore, proton conduction through the PHPS dielectric occurs through a three-dimensional pathway by a hopping mechanism, which allows uniform polarization of the dielectric even at room temperature, leading to amplified performance of the IZO TFTs.
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Affiliation(s)
- Young Hun Kang
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
| | - Bok Ki Min
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
- Graphene Research Team, ICT Creative Research Laboratory, Electronics and Telecommunications Research Institute (ETRI), 218 Gajeong-ro, Yuseong-gu, Daejeon 34129, Republic of Korea
| | - Seong K Kim
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
- Department of Advanced Materials and Chemical Engineering, Hannam University, Daejeon 34430, Republic of Korea
| | - Garam Bae
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
| | - Wooseok Song
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
| | - Changjin Lee
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
| | - Song Yun Cho
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
| | - Ki-Seok An
- Division of Advanced Materials, Korea Research Institute of Chemical Technology, 141 Gajeong-ro, Yuseong-gu, Daejeon 34114, Republic of Korea
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de Urquijo-Ventura M, Rao MS, Meraz-Davila S, Ochoa JT, Quevedo-Lopez M, Ramirez-Bon R. PVP-SiO2 and PVP-TiO2 hybrid films for dielectric gate applications in CdS-based thin film transistors. POLYMER 2020. [DOI: 10.1016/j.polymer.2020.122261] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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Wu Y, Jiang G, Li Q, Zhang Z, Chen Z. Nitrogen-doped graphene-TiO x N y nanocomposite electrode for highly efficient capacitive deionization. RSC Adv 2019; 9:28186-28193. [PMID: 35530492 PMCID: PMC9071039 DOI: 10.1039/c9ra05380h] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/14/2019] [Accepted: 08/23/2019] [Indexed: 11/21/2022] Open
Abstract
In this work, the first-ever reported nanocomposite electrode of nitrogen-doped graphene-titanium oxynitride (NG-TiO x N y ) for capacitive deionization (CDI) was synthesized via hydrothermal reaction and a high-temperature nitridation process. The physiochemical characterizations revealed that the nitrogen was doped in the graphene structure mainly in the form of graphitic nitrogen and the TiO x N y was successfully formed via TiO2 nitridation process. The layered NG nanosheets facilitated the diffusion of ions in saline water and formed electrical double layer on the surface of the electrode material, while the presence of TiO x N y enhanced the electrochemical performance by increasing surface area and generating surface vacancies via nitridation. The CDI cell employed NG-TiO x N y electrode delivered a breakthrough salt adsorption capacity of 26.1 mg g-1 in 500 mg L-1 saline water, and retained over 90% of its initial salt removal efficacy after 12 regeneration cycles. Such high CDI performance exhibits the promising application of NG-TiO x N y as a novel CDI electrode candidate.
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Affiliation(s)
- Yuchen Wu
- Department of Chemical and Biological Engineering, University of Ottawa 161 Louis Pasteur Private Ottawa Ontario K1N 6N5 Canada
- Department of Chemical Engineering, University of Waterloo 200 University Ave W Waterloo Ontario N2L 3G1 Canada
| | - Gaopeng Jiang
- Department of Chemical Engineering, University of Waterloo 200 University Ave W Waterloo Ontario N2L 3G1 Canada
| | - Qian Li
- Department of Chemical Engineering, University of Waterloo 200 University Ave W Waterloo Ontario N2L 3G1 Canada
| | - Zisheng Zhang
- Department of Chemical and Biological Engineering, University of Ottawa 161 Louis Pasteur Private Ottawa Ontario K1N 6N5 Canada
| | - Zhongwei Chen
- Department of Chemical Engineering, University of Waterloo 200 University Ave W Waterloo Ontario N2L 3G1 Canada
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Kim JS, Cho SW, Deshpande NG, Kim YB, Yun YD, Jung SH, Kim DS, Cho HK. Toward Robust Photoelectrochemical Operation of Cuprous Oxide Nanowire Photocathodes Using a Strategically Designed Solution-Processed Titanium Oxide Passivation Coating. ACS APPLIED MATERIALS & INTERFACES 2019; 11:14840-14847. [PMID: 30938151 DOI: 10.1021/acsami.9b02727] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
To date, TiO2 films prepared by atomic layer deposition are widely used to prepare Cu2O nanowire (NW)-based photocathodes with photoelectrochemical (PEC) durability as this approach enables conformal coating and furnishes chemical robustness. However, this common approach requires complicated interlayers and makes the fabrication of photocathodes with reproducible performance and long-term stability difficult. Although sol-gel-based approaches have been well established for coating surfaces with oxide thin films, these techniques have rarely been studied for oxide passivation in PEC applications, because the sol-gel coating methods are strongly influenced by surface chemical bonding and have been mainly demonstrated on flat substrates. As a unique strategy based on solution processing, herein, we suggest a creative solution for two problems encountered in the conformal coating of surfaces with oxide layers: (i) how to effectively prevent corrosion of materials with hydrophilic surfaces by simply using a single TiO2 surface protection layer instead of a complex multilayer structure and (ii) guaranteeing perfect chemical durability. A Cu(OH)2 NW can be easily prepared as an intermediate phase by anodization of a Cu metal, where the former inherently possesses a hydrophilic hydroxylated surface and thus, enables thorough coating with TiO2 precursor solutions. Chemically robust nanowires are then generated as the final product via the phase transformation of Cu(OH)2 to Cu2O via sintering at 600 °C. The coated NWs exhibit excellent PEC properties and a stable performance. Consequently, the perfect chemical isolation of the Cu2O NWs from the electrolyte allows a remarkable PEC operation with the maintenance of the initial photocurrent for more than one day.
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Affiliation(s)
- Joo Sung Kim
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Sung Woon Cho
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Nishad G Deshpande
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Young Been Kim
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Young Dae Yun
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Sung Hyeon Jung
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Dong Su Kim
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
| | - Hyung Koun Cho
- School of Advanced Materials Science and Engineering , Sungkyunkwan University , 2066 Seobu-ro , Jangan-gu, Suwon-si , Gyeonggi-do 16419 , Republic of Korea
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Abstract
Flexible sensors have the potential to be seamlessly applied to soft and irregularly shaped surfaces such as the human skin or textile fabrics. This benefits conformability dependant applications including smart tattoos, artificial skins and soft robotics. Consequently, materials and structures for innovative flexible sensors, as well as their integration into systems, continue to be in the spotlight of research. This review outlines the current state of flexible sensor technologies and the impact of material developments on this field. Special attention is given to strain, temperature, chemical, light and electropotential sensors, as well as their respective applications.
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Affiliation(s)
- Ankit Malik
- Nano Surface Texturing Lab, Department of Materials Engineering, DIAT(DU), Ministry of Defence, Girinagar, Pune, India
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Wang B, Huang W, Chi L, Al-Hashimi M, Marks TJ, Facchetti A. High- k Gate Dielectrics for Emerging Flexible and Stretchable Electronics. Chem Rev 2018; 118:5690-5754. [PMID: 29785854 DOI: 10.1021/acs.chemrev.8b00045] [Citation(s) in RCA: 178] [Impact Index Per Article: 29.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/04/2023]
Abstract
Recent advances in flexible and stretchable electronics (FSE), a technology diverging from the conventional rigid silicon technology, have stimulated fundamental scientific and technological research efforts. FSE aims at enabling disruptive applications such as flexible displays, wearable sensors, printed RFID tags on packaging, electronics on skin/organs, and Internet-of-things as well as possibly reducing the cost of electronic device fabrication. Thus, the key materials components of electronics, the semiconductor, the dielectric, and the conductor as well as the passive (substrate, planarization, passivation, and encapsulation layers) must exhibit electrical performance and mechanical properties compatible with FSE components and products. In this review, we summarize and analyze recent advances in materials concepts as well as in thin-film fabrication techniques for high- k (or high-capacitance) gate dielectrics when integrated with FSE-compatible semiconductors such as organics, metal oxides, quantum dot arrays, carbon nanotubes, graphene, and other 2D semiconductors. Since thin-film transistors (TFTs) are the key enablers of FSE devices, we discuss TFT structures and operation mechanisms after a discussion on the needs and general requirements of gate dielectrics. Also, the advantages of high- k dielectrics over low- k ones in TFT applications were elaborated. Next, after presenting the design and properties of high- k polymers and inorganic, electrolyte, and hybrid dielectric families, we focus on the most important fabrication methodologies for their deposition as TFT gate dielectric thin films. Furthermore, we provide a detailed summary of recent progress in performance of FSE TFTs based on these high- k dielectrics, focusing primarily on emerging semiconductor types. Finally, we conclude with an outlook and challenges section.
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Affiliation(s)
- Binghao Wang
- Department of Chemistry and the Materials Research Center , Northwestern University , 2145 Sheridan Road , Evanston , Illinois 60208 , United States.,Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices , Soochow University , 199 Ren'ai Road , Suzhou 215123 , China
| | - Wei Huang
- Department of Chemistry and the Materials Research Center , Northwestern University , 2145 Sheridan Road , Evanston , Illinois 60208 , United States
| | - Lifeng Chi
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices , Soochow University , 199 Ren'ai Road , Suzhou 215123 , China
| | - Mohammed Al-Hashimi
- Department of Chemistry , Texas A&M University at Qatar , PO Box 23874, Doha , Qatar
| | - Tobin J Marks
- Department of Chemistry and the Materials Research Center , Northwestern University , 2145 Sheridan Road , Evanston , Illinois 60208 , United States
| | - Antonio Facchetti
- Department of Chemistry and the Materials Research Center , Northwestern University , 2145 Sheridan Road , Evanston , Illinois 60208 , United States.,Flexterra Corporation , 8025 Lamon Avenue , Skokie , Illinois 60077 , United States
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Oyarzún DP, Chardon-Noblat S, Linarez Pérez OE, López Teijelo M, Zúñiga C, Zarate X, Schott E, Carreño A, Arratia-Perez R. Comparative study of the anchorage and the catalytic properties of nanoporous TiO2 films modified with ruthenium (II) and rhenium (I) carbonyl complexes. Chem Phys Lett 2018. [DOI: 10.1016/j.cplett.2018.01.040] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
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10
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Novel 1,2,3-triazole-based compounds: Iodo effect on their gelation behavior and cation response. Front Chem Sci Eng 2017. [DOI: 10.1007/s11705-017-1683-6] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/20/2022]
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Raghuraman S, Elinski MB, Batteas JD, Felts JR. Driving Surface Chemistry at the Nanometer Scale Using Localized Heat and Stress. NANO LETTERS 2017; 17:2111-2117. [PMID: 28282496 DOI: 10.1021/acs.nanolett.6b03457] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Abstract
Driving and measuring chemical reactions at the nanoscale is crucial for developing safer, more efficient, and environment-friendly reactors and for surface engineering. Quantitative understanding of surface chemical reactions in real operating environments is challenging due to resolution and environmental limitations of existing techniques. Here we report an atomic force microscope technique that can measure reaction kinetics driven at the nanoscale by multiphysical stimuli in an ambient environment. We demonstrate the technique by measuring local reduction of graphene oxide as a function of both temperature and force at the sliding contact. Kinetic parameters measured with this technique reveal alternative reaction pathways of graphene oxide reduction previously unexplored with bulk processing techniques. This technique can be extended to understand and precisely tailor the nanoscale surface chemistry of any two-dimensional material in response to a wide range of external, multiphysical stimuli.
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Affiliation(s)
- Shivaranjan Raghuraman
- Advanced Nano Manufacturing Laboratory, Department of Mechanical Engineering, Texas A&M University , 3123 TAMU, College Station, Texas 77840, United States
| | - Meagan B Elinski
- Department of Chemistry, Texas A&M University , 3255 TAMU, 580 Ross St., College Station, Texas 77843, United States
| | - James D Batteas
- Department of Chemistry, Texas A&M University , 3255 TAMU, 580 Ross St., College Station, Texas 77843, United States
| | - Jonathan R Felts
- Advanced Nano Manufacturing Laboratory, Department of Mechanical Engineering, Texas A&M University , 3123 TAMU, College Station, Texas 77840, United States
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