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Wang P, Jin C, Zheng D, Yang T, Wang Y, Zheng R, Bai H. Engineering Co Vacancies for Tuning Electrical Properties of p-Type Semiconducting Co 3O 4 Films. ACS APPLIED MATERIALS & INTERFACES 2021; 13:26621-26629. [PMID: 34038070 DOI: 10.1021/acsami.1c05748] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Spinel oxide Co3O4 has attracted more and more attention for energy- and environment-related applications. In order to tune the electrical properties of Co3O4, p-type semiconducting Co3O4 films were fabricated on the Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (PMN-PT), MgAl2O4 (MAO), and SrTiO3 substrates by reactive magnetron sputtering. The Co3O4 film on the MAO substrate exhibits perfect epitaxial growth. However, the Co3O4 film on the PMN-PT substrate presents dislocation defects between the [011] and [112] orientations. The special ferroelectric domain shape surface and phase transition of the PMN-PT substrate induce the higher concentration of Co vacancies in the Co3O4 film, which further reduce the resistivity by several orders of magnitude. The calculated results indicate that introducing Co vacancies can enhance the electrical properties of Co3O4 by building impurity levels near the Fermi level, which is beneficial to form free-moving holes in the valence band. The free-moving holes can also be accumulated/dissipated by the ferroelectric field effect of PMN-PT substrates, leading to upward/downward bending of conduction, valence bands, and low/high-resistance states. This work helps us to tune and improve the electrical properties of Co3O4.
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Affiliation(s)
- Ping Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Chao Jin
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Dongxing Zheng
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Tiebin Yang
- School of Physics, Australian Centre for Microscopy and Microanalysis, The University of Sydney, Camperdown, New South Wales 2006, Australia
| | - Yuchen Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Rongkun Zheng
- School of Physics, Australian Centre for Microscopy and Microanalysis, The University of Sydney, Camperdown, New South Wales 2006, Australia
| | - Haili Bai
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
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Wei M, Liu M, Yang L, Li X, Xie Y, Wang X, Li Z, Su Y, Hu Z, Liu JM. Electro-opto-mechano driven reversible multi-state memory devices based on photocurrent in Bi 0.9Eu 0.1FeO 3/La 0.67Sr 0.33MnO 3/PMN-PT heterostructures. RSC Adv 2020; 10:15784-15793. [PMID: 35493661 PMCID: PMC9052503 DOI: 10.1039/d0ra00725k] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/23/2020] [Accepted: 04/15/2020] [Indexed: 11/21/2022] Open
Abstract
A single device with extensive new functionality is highly attractive for the increasing demands for complex and multifunctional optoelectronics. Multi-field coupling has been drawing considerable attention because it leads to materials that can be simultaneously operated under several external stimuli (e.g. magnetic field, electric field, electric current, light, strain, etc.), which allows each unit to store multiple bits of information and thus enhance the memory density. In this work, we report an electro–opto–mechano-driven reversible multi-state memory device based on photocurrent in Bi0.9Eu0.1FeO3 (BEFO)/La0.67Sr0.33MnO3 (LSMO)/0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 (PMN-PT) heterostructures. It is found that the short-circuit current density (Jsc) can be switched by the variation of the potential barrier height and depletion region width at the Pt/BEFO interface modulated by light illumination, external strain, and ferroelectric polarization reversal. This work opens up pathways toward the emergence of novel device design features with dynamic control for developing high-performance electric–optical–mechanism integrated devices based on the BiFeO3-based heterostructures. The mutual interaction between polarization switching, light and piezoelectric strain.![]()
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Affiliation(s)
- Maocai Wei
- School of Physics and Electronic Engineering, Zhengzhou University of Light Industry Zhengzhou 450002 China.,Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Meifeng Liu
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Lun Yang
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Xiang Li
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Yunlong Xie
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Xiuzhang Wang
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China
| | - Zijiong Li
- School of Physics and Electronic Engineering, Zhengzhou University of Light Industry Zhengzhou 450002 China
| | - Yuling Su
- School of Physics and Electronic Engineering, Zhengzhou University of Light Industry Zhengzhou 450002 China
| | - Zhongqiang Hu
- Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xian Jiaotong University Xian 710049 China
| | - Jun-Ming Liu
- Institute for Advanced Materials, Hubei Normal University Huangshi 435002 China.,Laboratory of Solid State Microstructures, Nanjing University Nanjing 210093 China
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Xu M, Yan JM, Guo L, Wang H, Xu ZX, Yan MY, Lu YL, Gao GY, Li XG, Luo HS, Chai Y, Zheng RK. Nonvolatile Control of the Electronic Properties of In 2-xCr xO 3 Semiconductor Films by Ferroelectric Polarization Charge. ACS APPLIED MATERIALS & INTERFACES 2019; 11:32449-32459. [PMID: 31405273 DOI: 10.1021/acsami.9b07967] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
A series of Cr-doped In2-xCrxO3 (ICO) semiconductor thin films were epitaxially grown on (111)-oriented 0.71Pb(Mg1/3Nb2/3)O3-0.29PbTiO3 (PMN-0.29PT) single-crystal substrates by the pulsed laser deposition. Upon the application of an electric field to the PMN-0.29PT substrate along the thickness direction, we realized in situ, reversible, and nonvolatile control of the electronic properties and Fermi level of the films, which are manifested by abundant physical phenomena such as the n-type to p-type transformation, metal-semiconductor transition, metal-insulator transition, crossover of the magnetoresistance (MR) from negative to positive, and a large nonvolatile on-and-off ratio of 5.5 × 104% at room temperature. We also strictly disclose that both the sign and the magnitude of MR are determined by the electron carrier density of ICO films, which could modify the s-d exchange interaction and weak localization effect. Our results demonstrate that the ferroelectric gating approach using PMN-PT can be utilized to gain deeper insight into the carrier-density-related electronic properties of In2O3-based semiconductors and provide a simple and energy efficient way to construct multifunctional devices which can utilize the unique properties of composite materials.
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Affiliation(s)
- Meng Xu
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
- Center of Materials Science and Optoelectronics Engineering , University of Chinese Academy of Sciences , Beijing 100049 , China
| | - Jian-Min Yan
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Lei Guo
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Hui Wang
- School of Materials Science and Engineering and Jiangxi Key Laboratory for Two-Dimensional Materials and Devices , Nanchang University , Nanchang 330031 , China
| | - Zhi-Xue Xu
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Ming-Yuan Yan
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Yun-Long Lu
- Faculty of Electrical Engineering and Computer Science , Ningbo University , Ningbo 315211 , China
| | - Guan-Yin Gao
- Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures , University of Science and Technology of China , Hefei 230026 , China
| | - Xiao-Guang Li
- Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures , University of Science and Technology of China , Hefei 230026 , China
| | - Hao-Su Luo
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Yang Chai
- Department of Applied Physics , The Hong Kong Polytechnic University , Kowloon , Hong Kong , China
| | - Ren-Kui Zheng
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
- School of Materials Science and Engineering and Jiangxi Key Laboratory for Two-Dimensional Materials and Devices , Nanchang University , Nanchang 330031 , China
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Liu S, Jin C, Zheng D, Pang X, Wang Y, Wang P, Zheng W, Bai H. Ferroelectric field manipulated nonvolatile resistance switching in Al:ZnO/Pb(Mg 1/3Nb 2/3) 0.7Ti 0.3O 3 heterostructures at room temperature. Phys Chem Chem Phys 2019; 21:10784-10790. [PMID: 31086927 DOI: 10.1039/c9cp01809c] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/04/2023]
Abstract
Resistance switching was obtained in Al:ZnO/Pb(Mg1/3Nb2/3)0.7Ti0.3O3 heterostructures at room temperature by applying an external electric field. The modulation of the resistance is more pronounced in the thinner samples, indicating that it is an interfacial effect. In addition, the resistance of Al:ZnO films is significantly reduced by the photoexcited carriers when illumination is applied. The results indicate that the carrier density in the Al:ZnO films is modulated under external electric fields, due to the accumulation and depletion of charge at the interface between Al:ZnO and Pb(Mg1/3Nb2/3)0.7Ti0.3O3. Hence, reversible and nonvolatile resistance states can be achieved by the ferroelectric field effect, and it is expected that multilevel storage will be realized.
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Affiliation(s)
- Shasha Liu
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Chao Jin
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Dongxing Zheng
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Xin Pang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Yuchen Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Ping Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Wanchao Zheng
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
| | - Haili Bai
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China.
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Yan JM, Xu ZX, Chen TW, Xu M, Zhang C, Zhao XW, Liu F, Guo L, Yan SY, Gao GY, Wang FF, Zhang JX, Dong SN, Li XG, Luo HS, Zhao W, Zheng RK. Nonvolatile and Reversible Ferroelectric Control of Electronic Properties of Bi 2Te 3 Topological Insulator Thin Films Grown on Pb(Mg 1/3Nb 2/3)O 3-PbTiO 3 Single Crystals. ACS APPLIED MATERIALS & INTERFACES 2019; 11:9548-9556. [PMID: 30724082 DOI: 10.1021/acsami.8b20406] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Single-phase (00 l)-oriented Bi2Te3 topological insulator thin films have been deposited on (111)-oriented ferroelectric 0.71Pb(Mg1/3Nb2/3)O3-0.29PbTiO3 (PMN-PT) single-crystal substrates. Taking advantage of the nonvolatile polarization charges induced by the polarization direction switching of PMN-PT substrates at room temperature, the carrier density, Fermi level, magnetoconductance, conductance channel, phase coherence length, and quantum corrections to the conductance can be in situ modulated in a reversible and nonvolatile manner. Specifically, upon the polarization switching from the positively poled Pr+ state (i.e., polarization direction points to the film) to the negatively poled Pr- (i.e., polarization direction points to the bottom electrode) state, both the electron carrier density and the Fermi wave vector decrease significantly, reflecting a shift of the Fermi level toward the Dirac point. The polarization switching from Pr+ to Pr- also results in significant increase of the conductance channel α from -0.15 to -0.3 and a decrease of the phase coherence length from 200 to 80 nm at T = 2 K as well as a reduction of the electron-electron interaction. All these results demonstrate that electric-voltage control of physical properties using PMN-PT as both substrates and gating materials provides a simple and a straightforward approach to realize reversible and nonvolatile tuning of electronic properties of topological thin films and may be further extended to study carrier density-related quantum transport properties of other quantum matter.
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Affiliation(s)
- Jian-Min Yan
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Zhi-Xue Xu
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Ting-Wei Chen
- School of Materials Science and Engineering , Nanchang University, and Jiangxi Engineering Laboratory for Advanced Functional Thin Films , Nanchang 330031 , China
| | - Meng Xu
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Chao Zhang
- Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures , University of Science and Technology of China , Hefei 230026 , China
| | - Xu-Wen Zhao
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Fei Liu
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Lei Guo
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Shu-Ying Yan
- Department of Physics , Beijing Normal University , Beijing 100875 , China
| | - Guan-Yin Gao
- Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures , University of Science and Technology of China , Hefei 230026 , China
| | - Fei-Fei Wang
- Key Laboratory of Optoelectronic Material and Device, Department of Physics , Shanghai Normal University , Shanghai 200234 , China
| | - Jin-Xing Zhang
- Department of Physics , Beijing Normal University , Beijing 100875 , China
| | - Si-Ning Dong
- Department of Physics , University of Notre Dame , Notre Dame , Indiana 46556 , United States
| | - Xiao-Guang Li
- Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures , University of Science and Technology of China , Hefei 230026 , China
| | - Hao-Su Luo
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
| | - Weiyao Zhao
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
- ISEM, Innovation Campus , University of Wollongong , Wollongong , New South Wales 2500 , Australia
| | - Ren-Kui Zheng
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics , Chinese Academy of Sciences , Shanghai 200050 , China
- School of Materials Science and Engineering , Nanchang University, and Jiangxi Engineering Laboratory for Advanced Functional Thin Films , Nanchang 330031 , China
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