Pulsed Force Kelvin Probe Force Microscopy

Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions

Kelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges. This featured review outlines the operation principles and applications of KPFM, including several typical commercially available variants. We highlight the significance of surface potential measurements, present the details of the method operation, and discuss the causes of the limitation on spatial resolution. Then, we present the pulsed force Kelvin probe force microscopy (PF-KPFM) as an innovative improvement to KPFM, which provides an enhanced spatial resolution of <10 nm under ambient conditions. PF-KPFM is promising for the characterization of heterogeneous materials with spatial variations of electrical properties. It will be especially instrumental for investigating emerging perovskite photovoltaics, heterogeneous catalysts, 2D materials, and ferroelectric materials, among others.

Remote-Controllable Interfacial Electron Tunneling at Heterogeneous Molecular Junctions via Tip-Induced Optoelectrical Engineering

Molecular electronics enables functional electronic behavior via single molecules or molecular self-assembled monolayers, providing versatile opportunities for hybrid molecular-scale electronic devices. Although various molecular junction structures are constructed to investigate charge transfer dynamics, significant challenges remain in terms of interfacial charging effects and far-field background signals, which dominantly block the optoelectrical observation of interfacial charge transfer dynamics. Here, tip-induced optoelectrical engineering is presented that synergistically correlates photo-induced force microscopy and Kelvin probe force microscopy to remotely control and probe the interfacial charge transfer dynamics with sub-10 nm spatial resolution. Based on this approach, the optoelectrical origin of metal-molecule interfaces is clearly revealed by the nanoscale heterogeneity of the tip-sample interaction and optoelectrical reactivity, which theoretically aligned with density functional theory calculations. For a practical device-scale demonstration of tip-induced optoelectrical engineering, interfacial tunneling is remotely controlled at a 4-inch wafer-scale metal-insulator-metal capacitor, facilitating a 5.211-fold current amplification with the tip-induced electrical field. In conclusion, tip-induced optoelectrical engineering provides a novel strategy to comprehensively understand interfacial charge transfer dynamics and a non-destructive tunneling control platform that enables real-time and real-space investigation of ultrathin hybrid molecular systems.

Advances in Polymer Dielectrics with High Energy Storage Performance by Designing Electric Charge Trap Structures

Dielectric capacitors have been developed for nearly a century, and all-polymer film capacitors are currently the most popular. Much effort has been devoted to studying polymer dielectric capacitors and improving their capacitive performance, but their high conductivity and capacitance losses under high electric fields or elevated temperatures are still significant challenges. Although many review articles have reported various strategies to address these problems, to the best of current knowledge, no review article has summarized the recent progress in the high-energy storage performance of polymer-based dielectric films with electric charge trap structures. Therefore, this paper first reviews the charge trap characterization methods for polymeric dielectrics and discusses their strengths and weaknesses. The research progress on the design of charge trap structures in polymer dielectric films, including molecular chain optimization, organic doping, blending modification, inorganic doping, multilayered structures, and the mechanisms of the charge trap-induced enhancement of the capacitive performance of polymers are systematically reviewed. Finally, a summary and outlook on the fundamental theory of charge trap regulation, performance characterization, numerical calculations, and engineering applications are presented. This review provides a valuable reference for improving the insulation and energy storage performance of dielectric capacitive films.

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination. Time-dependent KPFM enables simultaneous quantification of the surface photovoltage generated by the photodiode as well as the resulting mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to spatially map voltage-induced oscillation of various sizes of piezoelectric membranes without the photodiode to investigate their position- and size-dependent displacement.

Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection

Kelvin probe force microscopy measures surface potential and delivers insights into nanoscale electronic properties, including work function, doping levels, and localized charges. Recently developed pulsed force Kelvin probe force microscopy (PF-KPFM) provides sub-10 nm spatial resolution under ambient conditions, but its original implementation is hampered by instrument complexity and limited operational speed. Here, we introduce a solution for overcoming these two limitations: a lock-in amplifier-based PF-KPFM. Our method involves phase-synchronized switching of a field effect transistor to mediate the Coulombic force between the probe and the sample. We validate its efficacy on two-dimensional material MXene and aged perovskite photovoltaic films. Lock-in-based PF-KPFM successfully identifies the contact potential difference (CPD) of stacked flakes and finds that the CPDs of monoflake MXene are different from those of their multiflake counterparts, which are otherwise similar in value. In perovskite films, we uncover electrical degradation that remains elusive with surface topography.

Understanding the unique S-scheme charge migration in triazine/heptazine crystalline carbon nitride homojunction

Understanding charge transfer dynamics and carrier separation pathway is challenging due to the lack of appropriate characterization strategies. In this work, a crystalline triazine/heptazine carbon nitride homojunction is selected as a model system to demonstrate the interfacial electron-transfer mechanism. Surface bimetallic cocatalysts are used as sensitive probes during in situ photoemission for tracing the S-scheme transfer of interfacial photogenerated electrons from triazine phase to the heptazine phase. Variation of the sample surface potential under light on/off confirms dynamic S-scheme charge transfer. Further theoretical calculations demonstrate an interesting reversal of interfacial electron-transfer path under light/dark conditions, which also supports the experimental evidence of S-scheme transport. Benefiting from the unique merit of S-scheme electron transfer, homojunction shows significantly enhanced activity for CO₂ photoreduction. Our work thus provides a strategy to probe dynamic electron transfer mechanisms and to design delicate material structures towards efficient CO₂ photoreduction.

Interfacial Insight of Charge Transport in BaTiO3/Epoxy Composites

Space charge accumulation greatly influences the dielectric performance of epoxy composites under high voltage. It has been reported that nano-fillers can suppress the charge accumulation in the bulk of insulation materials. However, it is still unclear how the nano-fillers influence the charge distribution at the interface between the filler and polymeric matrix. In this work, the dielectric properties and the local dynamic charge mobility behavior at the interface of barium titanate/epoxy resin (BTO/EP) composites were investigated from both bulk and local perspectives based on the macroscopic test techniques and in-situ Kelvin probe force microscopy (KPFM) methods. Charge injection and dissipation behavior exhibited significant discrepancies at different interfaces. The interface between BTO and epoxy is easy to accumulates a negative charge, and nanoscale BTO (n-BTO) particles introduces deeper traps than microscale BTO (m-BTO) to inhibit charge migration. Under the same bias condition, the carriers are more likely to accumulate near the n-BTO than the m-BTO particles. The charge dissipation rate at the interface region in m-BTO/EP is about one order of magnitude higher than that of n-BTO/EP. This work offers experimental support for understanding the mechanism of charge transport in dielectric composites.

Achieving Ultrasensitivity and Long-Term Durability Simultaneously for Microcantilevers Inspired by a Scorpion's Circular Tip Slits

Microcantilevers are one of the most essential sensitive elements for various mechanical sensors. Their sensing performance determines the index level of a series of sensors. To date, the long-standing trade-off between ultrasensitivity and long-term durability of microcantilevers still remains a challenge. In nature, scorpions can sense vibrations as low as 10 nm amplitude through their circular tip slits sensilla. Such slit sensilla embedded in the exoskeleton of walking legs endure the compressing and stretching of every movement without spontaneous fracture failures. Here, we focused on the structural design of the circular tip slits which concentrate stress effectively and disperse energy smoothly, with the result that the microcantilevers are ultrasensitive and durable simultaneously in a single element. We devised a reproducible circular tip slits cantilever with enhanced sensitivity and ultralow detection limits to monitor 7 nm amplitude vibrations. The sensor possessed excellent durability and remained highly consistent with the correlation coefficient of nearly 0.999 over 100 000 cycles. Furthermore, the circular tip slits cantilever could precisely sense diverse subtle mechanical signals and exhibited potential applications in monitoring respiratory patterns. The simple geometric design can be easily manufactured on various sensory materials for applications requiring ultrahigh sensitivity and long-time durability.

Adhesion force microscopy is sensitive to the charge distribution at the surface of single collagen fibrils

Collagen fibrils are a key component of the extracellular matrix of mammalian tissues where they serve as structural elements and as a ligand for receptor-mediated signaling. As collagen molecules assemble into fibrils, in vitro or in vivo, they acquire a modulation of their molecular and electron densities called the D-band, with a 67 nm spacing, that can be visualized by cryo-electron microscopy. The D-band is composed of a gap region missing one-fifth of the molecules in the cross-section compared to the overlap region. This leads to the gap region having a positive potential and the overlap region a negative potential with respect to an n-doped silicon probe as observed by Kelvin Probe Force Microscopy. In this study, we use the adhesion force between an n-doped silicon probe and a collagen substrate to demonstrate the sensitivity of adhesion force towards charge distribution on the surface of collagen fibrils. We also map the charge distribution at the surface of single in vivo and in vitro assembled collagen fibrils and characterize the three-dimensional location and strength of three sub D-band regions that have been observed previously by cryo-electron microscopy. Our approach provides an adhesion fingerprint unique to each fibril type we analyzed and points to local charge variations at the sub D-band level even along a single fibril. It opens the road for a detailed analysis of collagen fibrils surface modifications due to ligand binding or the accumulation of advanced glycation end products at sub D-band resolution on a fibril by fibril basis.

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

In this paper, we derive and present quantitative expressions governing the performance of single and multifrequency Kelvin probe force microscopy (KPFM) techniques in both air and water. Metrics such as minimum detectable contact potential difference, minimum required AC bias, and signal-to-noise ratio are compared and contrasted both off resonance and utilizing the first two eigenmodes of the cantilever. These comparisons allow the reader to quickly and quantitatively identify the parameters for the best performance for a given KPFM-based experiment in a given environment. Furthermore, we apply these performance metrics in the identification of KPFM-based modes that are most suitable for operation in liquid environments where bias application can lead to unwanted electrochemical reactions. We conclude that open-loop multifrequency KPFM modes operated with the first harmonic of the electrostatic response on the first eigenmode offer the best performance in liquid environments whilst needing the smallest AC bias for operation.

Accurate determination of MFM tip's magnetic parameters on nanoparticles by decoupling the influence of electrostatic force

Magnetic force microscopy (MFM) has become one of the most important instruments for characterizing magnetic materials with nanoscale spatial resolution. When analyzing magnetic particles by MFM, calibration of the magnetic tips using reference magnetic nanoparticles is a prerequisite due to similar orientation and dimension of the yielded magnetic fields. However, in such a calibration process, errors caused by extra electrostatic interactions will significantly affect the output results. In this work, we evaluate the magnetic moment and dipole radius of the MFM tip on Fe₃O₄nanoparticles by considering the associated electrostatic force. The coupling of electrostatic contribution on the measured MFM phase is eliminated by combining MFM and Kelvin probe force microscopy together with theoretical modeling. Numerical simulations and experiments on nickel nanoparticles demonstrate the effectiveness of decoupling. Results show that the calibrated MFM tip can enable a more accurate analysis of micro-and-nano magnetism. In addition, a fast and easy calibration method by using bimodal MFM is discussed, in which the acquisition of multiple phase shifts at different lift heights is not required.

Principle and applications of peak force infrared microscopy

Peak force infrared (PFIR) microscopy is an emerging atomic force microscopy (AFM)-based infrared microscopy that bypasses Abbe's diffraction limit on spatial resolution. The PFIR microscopy utilizes a nanoscopically sharp AFM tip to mechanically detect the tip-enhanced infrared photothermal response of the sample in the time domain. The time-gated mechanical signals of cantilever deflections transduce the infrared absorption of the sample, delivering infrared imaging and spectroscopy capability at sub 10 nm spatial resolution. Both the infrared absorption response and mechanical properties of the sample are obtained in parallel while preserving the surface integrity of the sample. This review describes the constructions of the PFIR microscope and several variations, including multiple-pulse excitation, total internal reflection geometry, dual-color configuration, liquid-phase operations, and integrations with simultaneous surface potential measurement. Representative applications of PFIR microscopy are also included in this review. In the outlook section, we lay out several future directions of innovations in PFIR microscopy and applications in chemical and material research.

Operando Characterization of Organic Mixed Ionic/Electronic Conducting Materials

Operando characterization plays an important role in revealing the structure-property relationships of organic mixed ionic/electronic conductors (OMIECs), enabling the direct observation of dynamic changes during device operation and thus guiding the development of new materials. This review focuses on the application of different operando characterization techniques in the study of OMIECs, highlighting the time-dependent and bias-dependent structure, composition, and morphology information extracted from these techniques. We first illustrate the needs, requirements, and challenges of operando characterization then provide an overview of relevant experimental techniques, including spectroscopy, scattering, microbalance, microprobe, and electron microscopy. We also compare different in silico methods and discuss the interplay of these computational methods with experimental techniques. Finally, we provide an outlook on the future development of operando for OMIEC-based devices and look toward multimodal operando techniques for more comprehensive and accurate description of OMIECs.

Nano-Chemical and Mechanical Mapping of Fine and Ultrafine Indoor Aerosols with Peak Force Infrared Microscopy

Indoor aerosols can adversely affect human health as we increasingly spend more time indoors. One of the aerosol research challenges is measuring fine and ultrafine aerosol particles with nanoscale dimensions. Spectroscopic tools, often diffraction-limited, cannot access the intra-particle heterogeneity. In this work, we extend the non-invasive nanoscopy method of peak force infrared (PFIR) microscopy to study indoor aerosols. Laboratory-generated fine bioaerosols were collected after filtration with a surgical face mask to serve as a benchmark sample, followed by a variety of field-collected indoor aerosols with and without the filtration of a facemask. A general heterogeneity is observed in individual aerosol particles, despite their nanoscale dimension. The presence of protein, triglycerides, and salt is detected through chemical and mechanical mapping. The PFIR microscopy is suitable to identify the composition of fine and ultrafine aerosols. Its application is particularly meaningful for understanding the particle structure to reduce aerosol-related transmission of diseases.

Highly Durable and Fully Dispersed Cobalt Diatomic Site Catalysts for CO2 Photoreduction to CH4

Dual-atom-site catalysts (DACs) have emerged as a new frontier in heterogeneous catalysis because the synergistic effect between adjacent metal atoms can promote their catalytic activity while maintaining the advantages of single-atom-site catalysts, such as almost 100 % atomic efficiency and excellent hydrocarbon selectivity. In this study, cobalt-based atom site catalysts with a Co₂ -N coordination structure were synthesized and used for photodriven CO₂ reduction. The resulting CoDAC containing 3.5 % Co atoms demonstrated a superior atom ratio for CO₂ reduction catalytic performance, with 65.0 % CH₄ selectivity, which far exceeds that of cobalt-based single-atom-site catalysts (CoSACs). The intrinsic reason for the superior activity of CoDACs is the excellent adsorption strength of CO₂ and CO* intermediates at dimeric Co active sites.

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpreted to include various contributions from the probe geometry and imaged features of the sample. In contrast to this, the currently implemented closed-loop (CL) variants of KPFM, either amplitude-modulation (AM) or frequency-modulation (FM), solely report on their final product in terms of the tip-sample contact potential difference. In ambient atmosphere, both CL AM-KPFM and CL FM-KPFM work at their best during the lift part of a two-pass scanning mode to avoid the direct contact with the surface of the sample. In this work, a new OL AM-KPFM mode was implemented in the single-pass scan of the PeakForce Tapping (PFT) mode. The topographical and electrical components were combined in a single pass by applying the electrical modulation only in between the PFT tip-sample contacts, when the AFM probe separates from the sample. In this way, any contact and tunneling discharges are avoided and, yet, the location of the measured electrical tip-sample interaction is directly affixed to the topography rendered by the mechanical PFT modulation at each tap. Furthermore, because the detailed response of the cantilever to the bias stimulation was recorded, it was possible to analyze and separate an average contribution of the cantilever to the determined local contact potential difference between the AFM probe and the imaged sample. The removal of this unwanted contribution greatly improved the accuracy of the AM-KPFM measurements to the level of the FM-KPFM counterpart.

Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping

Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution of conventional KPFM variants is limited to between ≈35 and 100 nm in ambient conditions due to the long-range nature of the Coulombic force. In this article, a novel way of generating the Coulombic force in tapping mode KPFM without the need for an external AC driving voltage is presented. A field-effect transistor (FET) is used to directly switch the electrical connectivity of the tip and sample on and off periodically. The resulting Coulomb force induced by Fermi level alignment of the tip and sample results in a detectable change of the cantilever oscillation at the FET-switching frequency. The resulting FET-switched KPFM delivers a spatial resolution of ≈25 nm and inherits the high operational speed of the AFM tapping mode. Moreover, the FET-switched KPFM is integrated with photoinduced force microscopy (PiFM), enabling simultaneous acquisitions of high spatial resolution chemical distributions and surface potential maps. The integrated FET-switched KPFM with PiFM is expected to facilitate characterizations of nanoscale electrical properties of photoactive materials, semiconductors, and ferroelectric materials.

Local probe investigation of electrocatalytic activity

As the world energy crisis remains a long-term challenge, development and access to renewable energy sources are crucial for a sustainable modern society. Electrochemical energy conversion devices are a promising option for green energy supply, although the challenge associated with electrocatalysis have caused increasing complexity in the materials and systems, demanding further research and insights. In this field, scanning probe microscopy (SPM) represents a specific source of knowledge and understanding. Thus, our aim is to present recent findings on electrocatalysts for electrolysers and fuel cells, acquired mainly through scanning electrochemical microscopy (SECM) and other related scanning probe techniques. This review begins with an introduction to the principles of several SPM techniques and then proceeds to the research done on various energy-related reactions, by emphasizing the progress on non-noble electrocatalytic materials.

DNA-Based Fabrication for Nanoelectronics

The bottom-up DNA-templated nanoelectronics exploits the unparalleled self-assembly properties of DNA molecules and their amenability with various types of nanomaterials. In principle, nanoelectronic devices can be bottom-up assembled with near-atomic precision, which compares favorably with well-established top-down fabrication process with nanometer precision. Over the past decade, intensive effort has been made to develop DNA-based nanoassemblies including DNA-metal, DNA-polymer, and DNA-carbon nanotube complexes. This review introduces the history of DNA-based fabrication for nanoelectronics briefly and summarizes the state-of-art advances of DNA-based nanoelectronics. In particular, the most widely applied characterization techniques to explore their unique electronic properties at the nanoscale are described and discussed, including scanning tunneling microscopy, conductive atomic force microscopy, and Kelvin probe force microscopy. We also provide a perspective on potential applications of DNA-based nanoelectronics.

Peak Force Infrared-Kelvin Probe Force Microscopy

Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure-function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared-Kelvin probe force microscopy (PFIR-KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, and mechanical properties with approximately 10 nm spatial resolution in a single-pass scan. MAPbBr₃ perovskite crystals of different degradation pathways were studied in situ. Nanoscale charge accumulations were observed in MAPbBr₃ near the boundary to PbBr₂ . PFIR-KPFM also revealed correlations between residual charges and secondary conformation in amyloid fibrils. PFIR-KPFM is applicable to other heterogeneous materials at the nanoscale for correlative multimodal characterizations.