1
|
Lee C, Kim D, Lim H, Seong Y, Kim H, Park JH, Yang D, Shin HJ, Wuttig M, Choi BJ, Cho MH. Ultrahigh Stability and Operation Performance in Bi-doped GeTe/Sb 2Te 3 Superlattices Achieved by Tailoring Bonding and Structural Properties. ACS NANO 2024; 18:25625-25635. [PMID: 39223725 DOI: 10.1021/acsnano.4c06909] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 09/04/2024]
Abstract
Changes in bond types and the reversible switching process between metavalent and covalent bonds are related to the operating mechanism of the phase-change (PC) behavior. Thus, controlling the bonding characteristics is the key to improving the PC memory performance. In this study, we have controlled the bonding characteristics of GeTe/Sb2Te3 superlattices (SLs) via bismuth (Bi) doping. The incorporation of Bi into the GeTe sublayers tailors the metavalent bond. We observed significant improvement in device reliability, set speed, and power consumption induced upon increasing Bi incorporation. The introduction of Bi was found to suppress the change in density between the SET and RESET states, resulting in a significant increase in device reliability. The reduction in Peierls distortion, leading to a more octahedral-like atomic arrangement, intensifies electron-phonon coupling with increased bond polarizability, which are responsible for the fast set speed and low power consumption. This study demonstrates how the structural and thermodynamic changes in phase change materials alter phase change characteristics due to systematic changes of bonding and provides an important methodology for the development of PC devices.
Collapse
Affiliation(s)
- Changwoo Lee
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
| | - Dasol Kim
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
- Institute of Physics, Physics of Novel Materials, RWTH Aachen University, 52056 Aachen, Germany
| | - Hyeonwook Lim
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
| | - Yeonwoo Seong
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
| | - Hyunwook Kim
- Department of Materials Science and Engineering, Seoul National University of Science and Technology, Seoul 01811, Republic of Korea
| | - Ju Hwan Park
- Department of Materials Science and Engineering, Seoul National University of Science and Technology, Seoul 01811, Republic of Korea
| | - Dogeon Yang
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
| | - Hee Jun Shin
- POSTECH, Pohang Accelerator Laboratory, 80, Jigokro-127-beongil, Nam-gu, Pohang, Gyeongbuk 37673, Republic of Korea
| | - Matthias Wuttig
- Institute of Physics, Physics of Novel Materials, RWTH Aachen University, 52056 Aachen, Germany
| | - Byung Joon Choi
- Department of Materials Science and Engineering, Seoul National University of Science and Technology, Seoul 01811, Republic of Korea
| | - Mann-Ho Cho
- Department of Physics, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
- Department of System Semiconductor Engineering, Yonsei University, 50 Yonsei-ro, Seoul 03722, Republic of Korea
| |
Collapse
|
2
|
Oh JS, Jo KJ, Kang MC, An BS, Kwon Y, Lim HW, Cho MH, Baik H, Yang CW. Measurement of dielectric function and bandgap of germanium telluride using monochromated electron energy-loss spectroscopy. Micron 2023; 172:103487. [PMID: 37285687 DOI: 10.1016/j.micron.2023.103487] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/27/2023] [Revised: 05/16/2023] [Accepted: 05/30/2023] [Indexed: 06/09/2023]
Abstract
Using a monochromator in transmission electron microscopy, a low-energy-loss spectrum can provide inter- and intra-band transition information for nanoscale devices with high energy and spatial resolutions. However, some losses, such as Cherenkov radiation, phonon scattering, and surface plasmon resonance superimposed at zero-loss peak, make it asymmetric. These pose limitations to the direct interpretation of optical properties, such as complex dielectric function and bandgap onset in the raw electron energy-loss spectra. This study demonstrates measuring the dielectric function of germanium telluride using an off-axis electron energy-loss spectroscopy method. The interband transition from the measured complex dielectric function agrees with the calculated band structure of germanium telluride. In addition, we compare the zero-loss subtraction models and propose a reliable routine for bandgap measurement from raw valence electron energy-loss spectra. Using the proposed method, the direct bandgap of germanium telluride thin film was measured from the low-energy-loss spectrum in transmission electron microscopy. The result is in good agreement with the bandgap energy measured using an optical method.
Collapse
Affiliation(s)
- Jin-Su Oh
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea
| | - Kyu-Jin Jo
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea
| | - Min-Chul Kang
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea
| | - Byeong-Seon An
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea
| | - Yena Kwon
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea
| | - Hyeon-Wook Lim
- Department of Physics, Yonsei University, Seoul 03722, the Republic of Korea
| | - Mann-Ho Cho
- Department of Physics, Yonsei University, Seoul 03722, the Republic of Korea
| | - Hionsuck Baik
- Seoul Center, Korea Basic Science Institute (KBSI), Seoul 02841, the Republic of Korea
| | - Cheol-Woong Yang
- School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, the Republic of Korea.
| |
Collapse
|