Noncontact Imaging of Ion Dynamics in Polymer Electrolytes with Time-Resolved Electrostatic Force Microscopy

Voltage fluctuations and probe frequency jitter in electric force microscopy of a conductor

Electric force microscopy probes the statistics of electric field fluctuations from a sample surface, both through measurement of the noncontact friction exerted on the oscillating charged probe and by determination of the power spectrum of stochastic probe frequency fluctuations, referred to as "jitter." Here we calculate the frequency jitter power spectrum determined over a conducting sample of finite thickness, whose response is characterized by a dielectric function that is wavevector-dependent. These calculations complement previous predictions of the coefficient of noncontact friction in an electric force microscopy measurement for the same model, and also previous predictions of the jitter power spectrum for a dielectric continuum. The inclusion both of a finite sample thickness and a wavevector-dependent dielectric response can significantly enhance the magnitude of the predicted jitter spectrum for a conductor, relative to a simpler model of an infinitely thick dielectric continuum. These calculations provide a baseline prediction of the jitter power spectrum generated by the dynamics of conduction electrons in a metal sample.

Understanding the evolution of lithium dendrites at Li6.25Al0.25La3Zr2O12 grain boundaries via operando microscopy techniques

The growth of lithium dendrites in inorganic solid electrolytes is an essential drawback that hinders the development of reliable all-solid-state lithium metal batteries. Generally, ex situ post mortem measurements of battery components show the presence of lithium dendrites at the grain boundaries of the solid electrolyte. However, the role of grain boundaries in the nucleation and dendritic growth of metallic lithium is not yet fully understood. Here, to shed light on these crucial aspects, we report the use of operando Kelvin probe force microscopy measurements to map locally time-dependent electric potential changes in the Li_6.25Al_0.25La₃Zr₂O₁₂ garnet-type solid electrolyte. We find that the Galvani potential drops at grain boundaries near the lithium metal electrode during plating as a response to the preferential accumulation of electrons. Time-resolved electrostatic force microscopy measurements and quantitative analyses of lithium metal formed at the grain boundaries under electron beam irradiation support this finding. Based on these results, we propose a mechanistic model to explain the preferential growth of lithium dendrites at grain boundaries and their penetration in inorganic solid electrolytes.

A Robust Neural Network for Extracting Dynamics from Electrostatic Force Microscopy Data

Advances in scanning probe microscopy (SPM) methods such as time-resolved electrostatic force microscopy (trEFM) now permit the mapping of fast local dynamic processes with high resolution in both space and time, but such methods can be time-consuming to analyze and calibrate. Here, we design and train a regression neural network (NN) that accelerates and simplifies the extraction of local dynamics from SPM data directly in a cantilever-independent manner, allowing the network to process data taken with different cantilevers. We validate the NN's ability to recover local dynamics with a fidelity equal to or surpassing conventional, more time-consuming, calibrations using both simulated and real microscopy data. We apply this method to extract accurate photoinduced carrier dynamics on n = 1 butylammonium lead iodide, a halide perovskite semiconductor film that is of interest for applications in both solar photovoltaics and quantum light sources. Finally, we use SHapley Additive exPlanations to evaluate the robustness of the trained model, confirm its cantilever-independence, and explore which parts of the trEFM signal are important to the network.

Operando Characterization of Organic Mixed Ionic/Electronic Conducting Materials

Operando characterization plays an important role in revealing the structure-property relationships of organic mixed ionic/electronic conductors (OMIECs), enabling the direct observation of dynamic changes during device operation and thus guiding the development of new materials. This review focuses on the application of different operando characterization techniques in the study of OMIECs, highlighting the time-dependent and bias-dependent structure, composition, and morphology information extracted from these techniques. We first illustrate the needs, requirements, and challenges of operando characterization then provide an overview of relevant experimental techniques, including spectroscopy, scattering, microbalance, microprobe, and electron microscopy. We also compare different in silico methods and discuss the interplay of these computational methods with experimental techniques. Finally, we provide an outlook on the future development of operando for OMIEC-based devices and look toward multimodal operando techniques for more comprehensive and accurate description of OMIECs.

Signal Origin of Electrochemical Strain Microscopy and Link to Local Chemical Distribution in Solid State Electrolytes

Electrochemical strain microscopy (ESM) is a distinguished method to characterize Li-ion mobility in energy materials with extremely high spatial resolution. The exact origin of the cantilever deflection when the technique is applied on solid state electrolytes (SSEs) is currently discussed in the literature. Understanding local properties and influences on ion mobility in SSEs is of utmost importance to improve such materials for next generation batteries. Here, the exact signal formation process of ESM when applied on sodium super ionic conductor (NASICON)-type SSE containing Na- and Li-ions is investigated. Changes in the dielectric properties, which are linked to the local chemical composition, are found to be responsible for the observed contrast in the deflection of the cantilever instead of a physical volume change as a result of Vegard´s Law. The cantilever response is strongly reduced in areas of high sodium content which is attributed to a reduction of the tip-sample capacitance in comparison to areas with high lithium content. This is the first time a direct link between electrostatic forces in contact mode and local chemical information is demonstrated on SSEs. The results open up new possibilities in information gain since dielectric properties are sensitive to subtle changes in local chemical composition.

Time-Resolved Electrical Scanning Probe Microscopy of Layered Perovskites Reveals Spatial Variations in Photoinduced Ionic and Electronic Carrier Motion

We study light-induced dynamics in thin films comprising Ruddlesden-Popper phases of the layered 2D perovskite (C₄H₉NH₃)₂PbI₄. We probe ionic and electronic carrier dynamics using two complementary scanning probe methods, time-resolved G-mode Kelvin probe force microscopy and fast free time-resolved electrostatic force microscopy, as a function of position, time, and illumination. We show that the average surface photovoltage sign is dominated by the band bending at the buried perovskite-substrate interface. However, the film exhibits substantial variations in the spatial and temporal response of the photovoltage. Under illumination, the photovoltage equilibrates over hundreds of microseconds, a time scale associated with ionic motion and trapped electronic carriers. Surprisingly, we observe that the surface photovoltage of the 2D grain centers evolves more rapidly in time than at the grain boundaries. We propose that the slower evolution at grain boundaries is due to a combination of ion migration occurring between PbI₄ planes, as well as electronic carriers traversing grain boundary traps, thereby changing the time-dependent band unbending at grain boundaries. These results provide a model for the photoinduced dynamics in 2D perovskites and are a useful basis for interpreting photovoltage dynamics on hybrid 2D/3D structures.