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Wang B, Li Y, Zhang J, Wang X, Liu K. Fabrication of amorphous hollow mesoporous Si@SiO x nanoboxes as an anode material for enhanced lithium storage performance. NEW J CHEM 2022. [DOI: 10.1039/d2nj02395d] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Hollow mesoporous Si@SiOx nanoboxes are synthesized successfully by a simple sol–gel reaction of triethoxysilane using Fe2O3 nanocubes as the template, followed by a thermal reduction process and subsequent acid treatment process.
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Affiliation(s)
- Bo Wang
- School of New Materials and Chemical Engineering, Tangshan University, Tangshan 063000, P. R. China
- State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao 066004, P. R. China
| | - Yue Li
- School of New Materials and Chemical Engineering, Tangshan University, Tangshan 063000, P. R. China
- State Key Laboratory of Metastable Materials Science and Technology, Yanshan University, Qinhuangdao 066004, P. R. China
| | - Jinhui Zhang
- School of New Materials and Chemical Engineering, Tangshan University, Tangshan 063000, P. R. China
| | - Xiaoliu Wang
- School of New Materials and Chemical Engineering, Tangshan University, Tangshan 063000, P. R. China
| | - Kun Liu
- School of New Materials and Chemical Engineering, Tangshan University, Tangshan 063000, P. R. China
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Böttcher A, Schwaiger R, Pazdera TM, Exner D, Hauns J, Strelnikov D, Lebedkin S, Gröger R, Esch F, Lechner BAJ, Kappes MM. Nanoscale patterning at the Si/SiO 2/graphene interface by focused He + beam. NANOTECHNOLOGY 2020; 31:505302. [PMID: 33021238 DOI: 10.1088/1361-6528/abb5cf] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
We have studied the capability of He+ focused ion beam (He+-FIB) patterning to fabricate defect arrays on the Si/SiO2/Graphene interface using a combination of atomic force microscopy (AFM) and Raman imaging to probe damage zones. In general, an amorphized 'blister' region of cylindrical symmetry results upon exposing the surface to the stationary focused He+ beam. The topography of the amorphized region depends strongly on the ion dose, DS , (ranging from 103 to 107ions/spot) with craters and holes observed at higher doses. Furthermore, the surface morphology depends on the distance between adjacent irradiated spots, LS . Increasing the dose leads to (enhanced) subsurface amorphization and a local height increase relative to the unexposed regions. At the highest areal ion dose, the average height of a patterned area also increases as ∼1/LS . Correspondingly, in optical micrographs, the µm2-sized patterned surface regions change appearance. These phenomena can be explained by implantation of the He+ ions into the subsurface layers, formation of helium nanobubbles, expansion and modification of the dielectric constant of the patterned material. The corresponding modifications of the terminating graphene monolayer have been monitored by micro Raman imaging. At low ion doses, DS , the graphene becomes modified by carbon atom defects which perturb the 2D lattice (as indicated by increasing D/G Raman mode ratio). Additional x-ray photoionization spectroscopy (XPS) measurements allow us to infer that for moderate ion doses, scattering of He+ ions by the subsurface results in the oxidation of the graphene network. For largest doses and smallest LS values, the He+ beam activates extensive Si/SiO2/C bond rearrangement and a multicomponent material possibly comprising SiC and silicon oxycarbides, SiOC, is observed. We also infer parameter ranges for He+-FIB patterning defect arrays of potential use for pinning transition metal nanoparticles in model studies of heterogeneous catalysis.
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Affiliation(s)
- Artur Böttcher
- Institute of Physical Chemistry, Karlsruhe Institute of Technology (KIT), Fritz-Haber-Weg 2, D-76131, Karlsruhe, Germany
| | - Ruth Schwaiger
- Institute for Applied Materials - Materials and Biomechanics, KIT, Hermann-von-Helmholtz-Platz 1, D-76344, Eggenstein-Leopoldshafen, Germany
- Institute of Energy and Climate Research IEK-2: Microstructure and Properties of Materials, Forschungszentrum Juelich GmbH, D-52425, Juelich, Germany
| | - Tobias M Pazdera
- Institute of Physical Chemistry, Karlsruhe Institute of Technology (KIT), Fritz-Haber-Weg 2, D-76131, Karlsruhe, Germany
| | - Daniela Exner
- Institute for Applied Materials - Materials and Biomechanics, KIT, Hermann-von-Helmholtz-Platz 1, D-76344, Eggenstein-Leopoldshafen, Germany
| | - Jakob Hauns
- Institute of Physical Chemistry, Karlsruhe Institute of Technology (KIT), Fritz-Haber-Weg 2, D-76131, Karlsruhe, Germany
| | - Dmitry Strelnikov
- Institute of Physical Chemistry, Karlsruhe Institute of Technology (KIT), Fritz-Haber-Weg 2, D-76131, Karlsruhe, Germany
| | - Sergei Lebedkin
- Institute of Nanotechnology, KIT, Hermann-von-Helmholtz-Platz 1, D-76344, Eggenstein-Leopolds-hafen, Germany
| | - Roland Gröger
- Institute of Applied Physics, KIT, Wolfgang-Gaede-Straße 1, D-76131, Karlsruhe, Germany
| | - Friedrich Esch
- Chair of Physical Chemistry, Department of Chemistry & Catalysis Research Center, Technical University of Munich, Lichtenbergstr. 4, D-85748, Garching, Germany
| | - Barbara A J Lechner
- Chair of Physical Chemistry, Department of Chemistry & Catalysis Research Center, Technical University of Munich, Lichtenbergstr. 4, D-85748, Garching, Germany
| | - Manfred M Kappes
- Institute of Physical Chemistry, Karlsruhe Institute of Technology (KIT), Fritz-Haber-Weg 2, D-76131, Karlsruhe, Germany
- Institute of Nanotechnology, KIT, Hermann-von-Helmholtz-Platz 1, D-76344, Eggenstein-Leopolds-hafen, Germany
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