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Gao Y, Yang J, Ji X, He R, Yan J, Wang J, Wei T. Semipolar (112̅2) AlGaN-Based Solar-Blind Ultraviolet Photodetectors with Fast Response. ACS APPLIED MATERIALS & INTERFACES 2022; 14:21232-21241. [PMID: 35486957 DOI: 10.1021/acsami.2c03636] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
The high-quality semipolar (112̅2) AlGaN epitaxial films have been obtained on m-plane sapphire by metal-organic chemical vapor deposition. X-ray rocking curve measurements show the full-width at half-maximums of semipolar (112̅2)-oriented AlGaN films are 0.357° and 0.531° along [112̅3̅]AlGaN and [11̅00]AlGaN, respectively. The fabricated semipolar AlGaN metal-semiconductor-metal solar-blind ultraviolet (UV) photodetector (PD) exhibits a high responsivity of 1842 A/W. The fast response and reliability of the UV PD are ensured via fast switching with a rise and decay time of 90 ms and 53(720) ms, respectively. The UV PD exhibits a significant reduction in the dark current, that is, from 100 μA to 780 fA at 10 V, using a simple wet chemical etching to modify the surface properties of materials. The photo-to-dark-current ratio value of the etched UV PD reaches 4 orders of magnitude higher than the unetched UV PD under 270 nm illumination. These are attributed to the fact that KOH wet etching assists in eliminating the surface states and reconstructing the surface oxides. This work might provide a new potential for the development of solar-blind UV PDs with high performance.
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Affiliation(s)
- Yaqi Gao
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Jiankun Yang
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Xiaoli Ji
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Rui He
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Jianchang Yan
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Junxi Wang
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
| | - Tongbo Wei
- State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, University of Chinese Academy of Sciences, Beijing 100083, China
- Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
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Abstract
Ultraviolet photodetectors have been widely utilized in several applications, such as advanced communication, ozone sensing, air purification, flame detection, etc. Gallium nitride and its compound semiconductors have been promising candidates in photodetection applications. Unlike polar gallium nitride-based optoelectronics, non-polar gallium nitride-based optoelectronics have gained huge attention due to the piezoelectric and spontaneous polarization effect–induced quantum confined-stark effect being eliminated. In turn, non-polar gallium nitride-based photodetectors portray higher efficiency and faster response compared to the polar growth direction. To date, however, a systematic literature review of non-polar gallium nitride-based photodetectors has yet to be demonstrated. Hence, the objective of this systematic literature review is to critically analyze the data related to non-polar gallium nitride-based photodetectors. Based on the pool of literature, three categories are introduced, namely, growth and fabrication, electrical properties, and structural, morphological, and optical properties. In addition, bibliometric analysis, a precise open-source tool, was used to conduct a comprehensive science mapping analysis of non-polar gallium nitride-based photodetectors. Finally, challenges, motivations, and future opportunities of non-polar gallium nitride-based photodetectors are presented. The future opportunities of non-polar GaN-based photodetectors in terms of growth conditions, fabrication, and characterization are also presented. This systematic literature review can provide initial reading material for researchers and industries working on non-polar gallium nitride-based photodetectors.
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Han S, Choi I, Lee CR, Jeong KU, Lee SK, Kim JS. Fast Response Characteristics of Flexible Ultraviolet Photosensors with GaN Nanowires and Graphene. ACS APPLIED MATERIALS & INTERFACES 2020; 12:970-979. [PMID: 31840489 DOI: 10.1021/acsami.9b13109] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
We report the fast response characteristics of flexible ultraviolet photosensors with GaN nanowires (NWs) and a graphene channel. The GaN NWs used as light-absorbing media are horizontally and randomly embedded in a graphene sandwich structure in which the number of bottom graphene layers is varied from zero to three and the top is a fixed single layer of graphene. In the response curve of the photosensor with a double-layer bottom graphene, as obtained under pulsed illumination with a pulse width of 50 ms and a duty cycle of 50%, the rise and decay times were measured as 24.1 ± 0.1 and 28.2 ± 0.1 ms, respectively. The eye-crossing percentage was evaluated as 52.1%, indicating no substantial distortion of the duty cycle and no pulse symmetry problem. The rise and decay times estimated from an equivalent circuit analysis represented by resistances and capacitances agree well with the measured values. When the device was under the bending condition, the rise and decay times of the photosensor were comparable to those in the unbent state.
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Affiliation(s)
| | | | | | | | - Seoung-Ki Lee
- Applied Quantum Composites Research Center , Korea Institute of Science and Technology , Wanju 55324 , South Korea
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Palade C, Slav A, Lepadatu AM, Stavarache I, Dascalescu I, Maraloiu AV, Negrila C, Logofatu C, Stoica T, Teodorescu VS, Ciurea ML, Lazanu S. Orthorhombic HfO 2 with embedded Ge nanoparticles in nonvolatile memories used for the detection of ionizing radiation. NANOTECHNOLOGY 2019; 30:445501. [PMID: 31342930 DOI: 10.1088/1361-6528/ab352b] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Trilayer memory capacitors of control HfO2/floating gate of Ge nanoparticles in HfO2/tunnel HfO2/Si substrate deposited by magnetron sputtering and subsequently annealed are investigated for the first time for applications in radiation dosimetry. In the floating gate (FG), amorphous Ge nanoparticles (NPs) are arranged in two rows inside the HfO2 matrix. The HfO2 matrix is formed of orthorhombic/tetragonal nanocrystals (NCs). The adjacent thin films to the FG are also formed of orthorhombic/tetragonal HfO2 NCs. This phase is formed during annealing, in samples with thick control HfO2, in the presence of Ge, being induced by the stress. In the rest of the control oxide, HfO2 NCs are monoclinic. Orthorhombic HfO2 has ferroelectric properties and therefore enhances the memory window produced by charge storage in Ge NPs to above 6 V. The high sensitivity of 0.8 mV Gy-1 to α particle irradiation from a 241Am source was measured by monitoring the flatband potential during radiation exposure after electrical writing of the memory.
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Affiliation(s)
- C Palade
- National Institute of Materials Physics, 405A Atomistilor Street, 77125 Magurele, Romania
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Talib M, Tabassum R, Abid, Islam SS, Mishra P. Improvements in the Performance of a Visible-NIR Photodetector Using Horizontally Aligned TiS 3 Nanoribbons. ACS OMEGA 2019; 4:6180-6191. [PMID: 31459763 PMCID: PMC6648021 DOI: 10.1021/acsomega.8b03067] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/03/2018] [Accepted: 01/17/2019] [Indexed: 05/26/2023]
Abstract
We report the fabrication and characterization of visible and near-infrared-resistive photodetector using horizontally aligned titanium tri sulfide (TiS3) nanoribbons. The fabrication process employed micro-electromechanical system, photolithography and dielectrophoretic (DEP) methods. The interdigitated electrodes (IDE) fingers were fabricated using photolithography and thin-film metallization techniques onto the Si/SiO2 substrate, and then TiS3 nanoribbons were horizontally aligned in between IDE using DEP. The fabricated device was first characterized in absence of light and then, the photodetector-based characteristics were obtained by illuminating it with fiber-coupled laser beam. These characteristics were optimized by varying wavelength and power density of the laser beam. The present photodetector shows a maximum responsivity of 5.22 × 102 A/W, quantum efficiency of 6.08 × 102, and detectivity of 1.69 × 109 Jones. The switching times, i.e., response and recovery times were found to be 1.53 and 0.74 s, respectively, with 1064 nm wavelength and 3.4 mW/mm2 power density of the laser beam. Also, the effect of O2 adsorption on nanoribbons has been studied and it is found that adsorbed O2 acts as electron acceptor and decreases the conductivity of the photodetector. Experimentally, it is found that the photoresponse of the horizontally aligned TiS3 nanoribbons is better than that of a randomly oriented TiS3 nanoribbon-based photodetector. Finally, the performance of the present photodetector was compared to that of the previous ones that were found to outperform the reported ones. The additional advantages of the photodetector include excellent stability and portability from which it may be concluded that TiS3 nanoribbons can be a promising candidate for application in nanoscale electronic and optoelectronic devices.
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Affiliation(s)
- Mohammad Talib
- Centre for Nanoscience and
Nanotechnology, Jamia Millia Islamia (A
Central University), New Delhi 110025, India
| | - Rana Tabassum
- Centre for Nanoscience and
Nanotechnology, Jamia Millia Islamia (A
Central University), New Delhi 110025, India
| | - Abid
- Centre for Nanoscience and
Nanotechnology, Jamia Millia Islamia (A
Central University), New Delhi 110025, India
| | - Saikh Safiul Islam
- Centre for Nanoscience and
Nanotechnology, Jamia Millia Islamia (A
Central University), New Delhi 110025, India
| | - Prabhash Mishra
- Centre for Nanoscience and
Nanotechnology, Jamia Millia Islamia (A
Central University), New Delhi 110025, India
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B. H, K. P. S, K. N. NU. Low temperature-processed ZnO thin films for p–n junction-based visible-blind ultraviolet photodetectors. RSC Adv 2018; 8:37365-37374. [PMID: 35557783 PMCID: PMC9089431 DOI: 10.1039/c8ra07312k] [Citation(s) in RCA: 32] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/02/2018] [Accepted: 10/24/2018] [Indexed: 11/21/2022] Open
Abstract
Visible-blind ultraviolet photodetectors have been fabricated with a p–n junction based on ZnO and an organic hole transport layer.
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Affiliation(s)
- Hanna B.
- Academy of Scientific and Innovative Research (AcSIR)
- CSIR-NIIST Campus
- Thiruvananthapuram 695019
- India
- Photosciences and Photonics Section
| | - Surendran K. P.
- Academy of Scientific and Innovative Research (AcSIR)
- CSIR-NIIST Campus
- Thiruvananthapuram 695019
- India
- Functional Materials Section
| | - Narayanan Unni K. N.
- Academy of Scientific and Innovative Research (AcSIR)
- CSIR-NIIST Campus
- Thiruvananthapuram 695019
- India
- Photosciences and Photonics Section
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