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Ghosh G, Minnis M, Ghogare AA, Abramova I, Cengel KA, Busch TM, Greer A. Photoactive fluoropolymer surfaces that release sensitizer drug molecules. J Phys Chem B 2015; 119:4155-64. [PMID: 25686407 DOI: 10.1021/acs.jpcb.5b00808] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/07/2023]
Abstract
We describe a physical-organic study of two fluoropolymers bearing a photoreleasable PEGylated photosensitizer that generates (1)O2((1)Δg) [chlorin e6 methoxy tri(ethylene glycol) triester]. The surfaces are Teflon/poly(vinyl alcohol) (PVA) nanocomposite and fluorinated silica. The relative efficiency of these surfaces to photorelease the PEGylated sensitizer [shown previously to be phototoxic to ovarian cancer cells (Kimani, S. et al. J. Org. Chem 2012, 77, 10638)] was slightly higher for the nanocomposite. In the presence of red light and O2, (1)O2 is formed, which cleaves an ethene linkage to liberate the sensitizer in 68-92% yield. The fluoropolymers were designed to deal with multiple problems. Namely, their success relied not only on high O2 solubility and drug repellency but also on the C-F bonds, which physically quench little (1)O2, for singlet oxygen's productive use away from the surface. The results obtained here indicate that Teflon-like surfaces have potential uses in delivering sensitizer and singlet oxygen for applications in tissue repair and photodynamic therapy (PDT).
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Affiliation(s)
- Goutam Ghosh
- Department of Chemistry and Graduate Center, Brooklyn College, City University of New York , Brooklyn, New York 11210, United States
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Baer DR, Engelhard MH, Johnson GE, Laskin J, Lai J, Mueller K, Munusamy P, Thevuthasan S, Wang H, Washton N, Elder A, Baisch BL, Karakoti A, Kuchibhatla SVNT, Moon D. Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS : AN OFFICIAL JOURNAL OF THE AMERICAN VACUUM SOCIETY 2013; 31:50820. [PMID: 24482557 PMCID: PMC3869349 DOI: 10.1116/1.4818423] [Citation(s) in RCA: 106] [Impact Index Per Article: 9.6] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/20/2013] [Accepted: 07/25/2013] [Indexed: 05/17/2023]
Abstract
This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published reports on the properties and behaviors of nanomaterials often have reported inadequate or incomplete characterization. As a consequence, the true value of the data in these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and technological applications, it is desirable that researchers from the wide variety of disciplines involved recognize the nature of these often unexpected challenges associated with reproducible synthesis and characterization of nanomaterials, including the difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for researchers to understand how characterization approaches (surface and otherwise) can help to minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide information that helps address several of the analysis needs. In many circumstances, extensions of traditional data analysis can provide considerably more information than normally obtained from the data collected. Less common or evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum frequency generation, and low and medium energy ion scattering) can provide information about surfaces or interfaces in working environments (operando or in situ) or information not provided by more traditional methods. Although these methods may require instrumentation or expertise not generally available, they can be particularly useful in addressing specific questions, and examples of their use in nanomaterial research are presented.
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Affiliation(s)
- Donald R Baer
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Mark H Engelhard
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Grant E Johnson
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Julia Laskin
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Jinfeng Lai
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Karl Mueller
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Prabhakaran Munusamy
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | | | - Hongfei Wang
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Nancy Washton
- Pacific Northwest National Laboratory, EMSL, P.O. Box 999, Richland, Washington 99352
| | - Alison Elder
- Department of Environmental Medicine, University of Rochester, Rochester, New York
| | - Brittany L Baisch
- Department of Environmental Medicine, University of Rochester, Rochester, New York
| | - Ajay Karakoti
- Battelle Science and Technology India, Pune, Maharashtra, India
| | | | - Daewon Moon
- Daegu Gyeongbuk Institute of Science and Technology, Daeju, Korea
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Gorham J, Torres J, Wolfe G, d'Agostino A, Fairbrother DH. Surface Reactions of Molecular and Atomic Oxygen with Carbon Phosphide Films. J Phys Chem B 2005; 109:20379-86. [PMID: 16853637 DOI: 10.1021/jp0521196] [Citation(s) in RCA: 34] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Abstract
The surface reactions of atomic and molecular oxygen with carbon phosphide films have been studied using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Carbon phosphide films were produced by ion implantation of trimethylphosphine into polyethylene. Atmospheric oxidation of carbon phosphide films was dominated by phosphorus oxidation and generated a carbon-containing phosphate surface film. This oxidized surface layer acted as an effective diffusion barrier, limiting the depth of phosphorus oxidation within the carbon phosphide film to < 3 nm. The effect of atomic oxygen (AO) exposure on this oxidized carbon phosphide layer was subsequently probed in situ using XPS. Initially AO exposure resulted in a loss of carbon atoms from the surface, but increased the surface concentration of phosphorus atoms as well as the degree of phosphorus oxidation. For more prolonged AO exposures, a highly oxidized phosphate surface layer formed that appeared to be inert toward further AO-mediated erosion. By utilizing phosphorus-containing hydrocarbon thin films, the phosphorus oxides produced during exposure to AO were found to desorb at temperatures >500 K under vacuum conditions. Results from this study suggest that carbon phosphide films can be used as AO-resistant surface coatings on polymers.
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Affiliation(s)
- Justin Gorham
- Department of Chemistry, Johns Hopkins University, 3400 North Charles Street, Baltimore, MA 21218, USA
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Everett ML, Hoflund GB. Chemical Alteration of Poly(tetrafluoroethylene) TFE Teflon Induced by Exposure to Electrons and Inert-Gas Ions. J Phys Chem B 2005; 109:16676-83. [PMID: 16853122 DOI: 10.1021/jp051430k] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Abstract
In this study the chemical alterations of poly(tetrafluoroethylene) (TFE Teflon) by approximately 1.0-keV electrons and 1.0-keV He and Ar ions have been examined using X-ray photoelectron spectroscopy (XPS). The initial F/C atom ratio of 1.99 decreases to a steady-state value of 1.48 after 48 h of electron exposure. Exposure to either He+ or Ar+ decreases the initial F/C atom ratio from approximately 2 to a steady-state value of 1.12. The high-resolution XPS C 1s data indicate that new chemical states of carbon form as the F is removed and that the relative amounts of these states depend on the F content of the near-surface region. These states are most likely due to C bonded only to one F atom, C bonded only to other C atoms and C that have lost a pair of electrons through emission of F-. Exposures of the electron-damaged and He+- or Ar+-damaged surfaces to research-grade O2 result in chemisorption of very small amounts of O indicating that large quantities of reactive sites are not formed during the chemical erosion. Further exposure to the electron or ion fluxes quickly removes this chemisorbed oxygen. Exposure of the He+-damaged surface to air at room temperature results in the chemisorption of a larger amount of O than the O2 exposure but no N is adsorbed. The chemical alterations due to electrons and ions are compared with those caused by hyperthermal (approximately 5 eV) atomic oxygen (AO) and vacuum ultraviolet (VUV) radiation. The largest amount of damage is caused by AO followed by VUV, inert-gas ions, and then electrons.
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Affiliation(s)
- Michael L Everett
- Department of Chemical Engineering, University of Florida, Gainesville, Florida 32611, USA
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