Evanescent-Wave Cavity Ring-Down Ellipsometry

Precision Interferometric Measurements of Mirror Birefringence in High-Finesse Optical Resonators

High-finesse optical resonators found in ultrasensitive laser spectrometers utilize supermirrors ideally consisting of isotropic high-reflectivity coatings. Strictly speaking, however, the optical coatings are often non-uniformly stressed during the deposition process and therefore do possess some small amount of birefringence. When physically mounted the cavity mirrors can be additionally stressed in such a way that large optical birefringence is induced. Here we report a direct measurement of optical birefringence in a two-mirror Fabry-Pérot cavity with R = 99.99 % by observing TEM00 mode beating during cavity decays. Experiments were performed at a wavelength of 4.53 μm, with precision limited by both quantum and technical noise sources. We report a splitting of δν = 618(1) Hz, significantly less than the intrinsic cavity linewidth of δcav ≈ 3 kHz. With a cavity free spectral range of 96.9 MHz, the equivalent fractional change in mirror refractive index due to birefringence is therefore Δn/n = 6.38(1) × 10-6.

Microsecond-resolved SDR-based cavity ring down ellipsometry

We present an experimental apparatus that allows microsecond-resolved ellipsometric and absorption measurements. The apparatus is based on an optical cavity containing a Dove prism, in which light undergoes total internal reflection (TIR), while the data acquisition is based on software defined radio technology and custom-built drivers. We demonstrate the ability to sense rapid variations in the refractive index above the TIR interface for arbitrarily long times with a temporal resolution of at least 2 μs.

Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry

We demonstrate a method to increase the sensitivity of the s-p phase shift under total internal reflection (TIR) for optical sensing. This is achieved by the introduction of two simple dielectric layers to the TIR surface of a fused silica prism. The enhanced sensitivity is demonstrated using evanescent-wave cavity-ring-down-ellipsometry by measuring the refractive index of liquid mixtures and by studying the adsorption of polymers to the TIR surface of the fused silica prism.

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

We monitor the adsorption of Rhodamine 800, and the sedimentation of a polytetrafluoroethylene (PTFE) suspension at the surface of a fused-silica prism, by measuring both the absorption and s-p phase shift Δ of a 740 nm probe laser beam, using evanescent-wave cavity ringdown ellipsometry (EW-CRDE). The two systems demonstrate the complementary strengths of EW-CRDE, as the progress of adsorption of the Rhodamine 800 dye can only be observed sensitively via the measurement of absorption, whereas the progress of sedimentation of PTFE can only be observed sensitively via the measurement of Δ. We show that EW-CRDE provides a sensitive method for the measurement of Δ and demonstrates precision in Δ of about 10(-4) deg.