Grazing incidence small-angle X-ray scattering microtomography demonstrated on a self-ordered dried drop of nanoparticles

Spatial Distribution of the Network Structure in Epoxy Resin via the MAXS-CT Method

We have succeeded in visualizing the spatial heterogeneity of the reaction ratio in epoxy resins by combining medium-angle X-ray scattering (MAXS) and computed tomography (CT). The reaction ratio is proportional to the degree of cross-linking between epoxy and amine in epoxy resins. The reaction ratio and its spatial inhomogeneity affect the toughness of epoxy resins. However, there has been no non-destructive method to measure the spatial inhomogeneity of the reaction ratio, although we can measure only the spatially averaged reaction ratio by Fourier-transform infrared spectroscopy (FT-IR). We found that the scattering peak reflected the cross-linking structures in the q region of MAXS and that the peak intensity is proportional to the reaction ratio. By reconstructing CT images from this peak intensity, we visualized the spatial heterogeneity of the reaction ratio. The application of this method may not be limited to epoxy resins but may extend to studying the heterogeneity of cross-linked structures in other materials.

Small-Angle X-ray Scattering Analysis of Colloidal Crystals and Replica Materials Made from l-Arginine-Stabilized Silica Nanoparticles

Colloidal crystals made from sub-100 nm silica nanoparticles have provided a versatile platform for the template-assisted synthesis of three-dimensionally interconnected semiconducting, metallic, and magnetic replicas. However, the detailed structure of these materials has not yet been characterized. In this study, we investigated the structures of colloidal crystalline films and germanium replicas by scanning electron microscopy and small angle X-ray scattering. The structures of colloidal crystals made by evaporative assembly depends on the size of l-arginine-capped silica nanoparticles. Particles smaller than ∼31 nm diameter assemble into non-close-packed arrangements (bcc) whereas particles larger than 31 nm assemble into random close-packed structures with disordered hexagonal phase. Polycrystalline films of these materials retain their structures and long-range order upon infiltration at high temperature and pressure, and the structure is preserved in Ge replicas. The shear force during deposition and dispersity of silica nanoparticles contributes to the size-based variation in the structure and to the size of crystal domains in the colloidal crystal films.

Grazing-incidence X-ray diffraction tomography for characterizing organic thin films

Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure-property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups.

Neutron Reflectometry Tomography for Imaging and Depth Structure Analysis of Thin Films with In-Plane Inhomogeneity

Neutron reflectometry (NR) has been used for the depth structure analysis of materials at the surface and interface with a sub-nanometric resolution. Conventional NR provides averaged information for an area larger than several square centimeters; therefore, it cannot be applied to an interface with an in-plane inhomogeneity. In this study, the NR imaging of the in-plane structure of polymer thin films was achieved. The tomographic reconstruction of the spatially resolved NR profiles obtained by a sheet-shaped neutron beam provided a two-dimensional image of the in-plane interface morphology. The depth distribution of the neutron scattering length density was obtained by analyzing the position-dependent NR profile at a local area less than 0.1 mm². The current NR tomography method enables NR measurements for an interface with an inhomogeneous structure. It also provides information on the three-dimensional distribution of the atomic composition near the surface and interfaces for various materials.

Improving grazing-incidence small-angle X-ray scattering-computed tomography images by total variation minimization

Grazing-incidence small-angle X-ray scattering coupled with computed tomography (CT) has enabled the visualization of the spatial distribution of nanostructures in thin films. In this study, to optimize the CT image quality, total variation regularization is introduced to minimize sinogram image noise and artifacts.

Grazing-incidence small-angle X-ray scattering (GISAXS) coupled with computed tomography (CT) has enabled the visualization of the spatial distribution of nanostructures in thin films. 2D GISAXS images are obtained by scanning along the direction perpendicular to the X-ray beam at each rotation angle. Because the intensities at the q positions contain nanostructural information, the reconstructed CT images individually represent the spatial distributions of this information (e.g. size, shape, surface, characteristic length). These images are reconstructed from the intensities acquired at angular intervals over 180°, but the total measurement time is prolonged. This increase in the radiation dosage can cause damage to the sample. One way to reduce the overall measurement time is to perform a scanning GISAXS measurement along the direction perpendicular to the X-ray beam with a limited interval angle. Using filtered back-projection (FBP), CT images are reconstructed from sinograms with limited interval angles from 3 to 48° (FBP-CT images). However, these images are blurred and have a low image quality. In this study, to optimize the CT image quality, total variation (TV) regularization is introduced to minimize sinogram image noise and artifacts. It is proposed that the TV method can be applied to downsampling of sinograms in order to improve the CT images in comparison with the FBP-CT images.

Probing Surface Morphology using X-ray Grating Interferometry

X-ray reflectometry (XRR), a surface-sensitive technique widely used for characterizing surfaces, buried interfaces, thin films, and multilayers, enables determination of the electron density distribution perpendicular to a well-defined surface specularly reflecting X-rays. However, the electron density distribution parallel to the surface cannot be determined from an X-ray reflectivity curve. The electron density correlation in the lateral direction is usually probed by measuring the grazing-incidence small-angle X-ray scattering (GISAXS). GISAXS measurement, however, typically requires using a collimated X-ray point beam to distinguish the GISAXS from the specularly reflected X-rays, and so the sample must be scanned in the lateral direction with the point beam to investigate variations in the surface and interface morphology for a region larger than the size of the beam. In this paper, we report a new approach based on X-ray grating interferometry: an X-ray sheet beam is used instead of an X-ray point beam. A method using this approach can simultaneously provide one-dimensional real-space images of X-ray reflectivity, surface curvature, and ‘dark-field’ contrast with a field-of-view of more than a few millimetres. As a demonstration, a sample having a 400 nm line and space SiO₂ pattern with a depth of 10 nm on its surface was used, and the dark-field contrast due to the unresolved line and space structure, creating GISAXS in the lateral direction, was successfully observed. Quantitative analysis of these contrasts provided the real-space distribution of the structural parameters for a simple model of the grating structure. Our study paves the way to a new approach to structure analysis, providing a quantitative way to investigate real-space variations in surface and interface morphology through wavefront analysis.

Neutron visualization of inhomogeneous buried interfaces in thin films

When designing some functions in thin film systems, one of the key concepts is the structure of the constituent layers and interfaces. In an actual system, the layers and interfaces are often inhomogeneous in different scales, from hundreds of microns to several nanometers, causing differences in properties, despite very similar average structures. In this case, the choice of the observation point is critical to clarify the problem. Another critical aspect is the identification of these points by surveying the entire inhomogeneous thin film system. This article presents a description of a novel promising solution that is suitable for nondestructive visualization of inhomogeneous buried layers and interfaces in thin films. Such observations have been impossible until now. In this investigation, a unique extension of neutron reflectometry is proposed. While conventional neutron reflectivity just gives average depth-profiling of the scattering length density of layered thin films, the present method provides full picture of the inhomogeneity. In general, achieving a high spatial-resolving power for neutron scattering is not straightforward because the neutron counts become fairly limited at the sample or the detector position when the beam size is reduced. As a result, XY scanning of a sample with a small neutron beam is fairly difficult because of the required long measurement time. To address these issues, new concepts have been introduced for neutron reflectivity. The proposed method uses a wide beam instead of reducing the beam size. In addition, it measures the projection reflection profile instead of the total integrated intensity. These profiles are collected at a set of different in-plane angles. Similar to computed tomography, it is possible to obtain the specimen's two-dimensional (2D) neutron reflectivity distribution as one image. Because the spatial resolution is limited by the detection method, a Hadamard coded mask is employed to measure the reflection projection with only 50% loss of the primary neutron intensity. When the time-of-flight (ToF) mode is used for the neutron experiment, one can obtain many images as a function of ToF, i.e., the wavevector transfer. Such series of images can be displayed as a video. This indicates that the neutron reflectivity profiles of local points can be retrieved from the above video images. This paper presents the first report on the development of neutron reflectivity with imaging capability, and the analysis of local points in inhomogeneous layered thin-films without utilizing a small neutron beam. In the present work, the feasibility of the proposed method with approximately 1 mm spatial resolution was examined. In addition, further improvements of the approach are discussed. It is anticipated that this technique will facilitate new opportunities in the study of buried function interfaces.

Visualization of Individual Images in Patterned Organic-Inorganic Multilayers Using GISAXS-CT

Using grazing-incidence small-angle scattering (GISAXS) with computed tomography (CT), we have individually reconstructed the spatial distribution of a thin gold (Au) layer buried under a thin poly(styrene-b-2-vinylpyridine) (PS-b-P2VP) layer. Owing to the difference between total reflection angles of Au and PS-b-P2VP, the scattering profiles for Au nanoparticles and self-assembled nanostructures of PS-b-P2VP could be independently obtained by changing the X-ray angle of incidence. Reconstruction of scattering profiles allows one to separately characterize spatial distributions in Au and PS-b-P2VP nanostructures.

In-Situ GISAXS Study of Supramolecular Nanofibers having Ultrafast Humidity Sensitivity

Self assembled nanofibers derived from donor-acceptor (D-A) pair of dodecyl methyl viologen (DMV) and potassium salt of coronene tetracarboxylate (CS) is an excellent material for the development of organic electronic devices particularly for ultrafast response to relative humidity (RH). Here we have presented the results of in-situ grazing incidence small angle x-ray scattering (GISAXS) measurements to understand aridity dependent self reorganization of the nanofibers. The instantaneous changes in the organization of the nanofibers was monitored with different equilibrium RH conditions. Additionally formation of nanofibers during drying was studied by GISAXS technique - the results show two distinct stages of structural arrangements, first the formation of a lamellar mesophase and then, the evolution of a distorted hexagonal lattice. The RH dependent GISAXS results revealed a high degree of swelling in the lattice of the micelles and reduction in the distortion of the hexagonal structure with increase in RH. In high RH condition, the nanofibers show elliptical distortion but could not break into lamellar phase as observed during formation through drying. This observed structural deformation gives insight into nanoscopic structural changes of the micelles with change in RH around it and in turn explains ultrafast sensitivity in its conductivity for RH variation.

A deep look into the spray coating process in real-time-the crucial role of x-rays

Tailoring functional thin films and coating by rapid solvent-based processes is the basis for the fabrication of large scale high-end applications in nanotechnology. Due to solvent loss of the solution or dispersion inherent in the installation of functional thin films and multilayers the spraying and drying processes are strongly governed by non-equilibrium kinetics, often passing through transient states, until the final structure is installed. Therefore, the challenge is to observe the structural build-up during these coating processes in a spatially and time-resolved manner on multiple time and length scales, from the nanostructure to macroscopic length scales. During installation, the interaction of solid-fluid interfaces and between the different layers, the flow and evaporation themselves determine the structure of the coating. Advanced x-ray scattering methods open a powerful pathway for observing the involved processes in situ, from the spray to the coating, and allow for gaining deep insight in the nanostructuring processes. This review first provides an overview over these rapidly evolving methods, with main focus on functional coatings, organic photovoltaics and organic electronics. Secondly the role and decisive advantage of x-rays is outlined. Thirdly, focusing on spray deposition as a rapidly emerging method, recent advances in investigations of spray deposition of functional materials and devices via advanced x-ray scattering methods are presented.

Use of intermediate focus for grazing incidence small and wide angle x-ray scattering experiments at the beamline P03 of PETRA III, DESY

We describe the new experimental possibilities of the micro- and nanofocus X-ray scattering beamline P03 of the synchrotron source PETRA III at DESY, Hamburg (Germany), which arise from experiments with smaller beam sizes in the micrometer range. This beamline has been upgraded recently to perform new kinds of experiments. The use of an intermediate focus allows for reducing the beam size of microfocused hard X-rays while preserving a large working distance between the focusing elements and the focus position. For the first time, this well-known methodology has been employed to grazing incidence small- and wide-angle X-ray scattering (GISAXS/GIWAXS). As examples, we highlight the applications to in situ studies using microfluidic devices in GISAXS geometry as well as the investigation of the crystallinity of thin films in GIWAXS geometry.

Probing evaporation induced assembly across a drying colloidal droplet using in situ small-angle X-ray scattering at the synchrotron source

Colloidal particles in a tiny drying droplet are forced to assemble due to attractive capillary forces. Jamming of the particles throughout the droplet remains either isotropic or anisotropic depending upon the drying kinetics and the physicochemical environment. In this work, we explore the dynamical evolution of such an assembly process across a single evaporative droplet by in situ scanning small-angle scattering using a micro-focused X-ray beam at the synchrotron source. A methodology has been elucidated to differentiate quantitatively between the isotropic and the anisotropic jamming process. Switching of jamming behaviour depending on the initial particle volume fraction in the droplet has been demonstrated. Three distinct stages of assembly, associated with droplet shrinkage, have been revealed even during isotropic jamming. This is in contrast to the drying of a pure liquid droplet under diffusion limited evaporation. It has been established that such in situ scattering measurements can also be used to estimate the temporal evolutions of the viscosity of a drying suspension as well as the diffusivity of nanoparticles in a droplet.

In situ grazing incidence small-angle X-ray scattering investigation of polystyrene nanoparticle spray deposition onto silicon

We investigated the spray deposition and subsequent self-assembly during drying of a polystyrene nanoparticle dispersion with in situ grazing incidence small-angle X-ray scattering at high time resolution. During the fast deposition of the dispersion and the subsequent evaporation of the solvent, different transient stages of nanoparticle assembly can be identified. In the first stage, the solvent starts to evaporate without ordering of the nanoparticles. During the second stage, large-scale structures imposed by the breakup of the liquid film are observable. In this stage, the solvent evaporates further and nanoparticle ordering starts. In the late third drying stage, the nanoparticles self-assemble into the final layer structure.

In situ observation of cluster formation during nanoparticle solution casting on a colloidal film

We present a real-time study of the nanostructuring and cluster formation of gold nanoparticles deposited in aqueous solution on top of a pre-structured polystyrene colloidal thin film. Cluster formation takes place at different length scales, from the agglomerations of the gold nanoparticles to domains of polystyrene colloids. By combining in situ imaging ellipsometry and microbeam grazing incidence small-angle x-ray scattering, we are able to identify different stages of nanocomposite formation, namely diffusion, roughness increase, layer build-up and compaction. The findings can serve as a guideline for nanocomposite tailoring by solution casting.

Structure and flow of droplets on solid surfaces

The structure and flow of droplets on solid surfaces is investigated with imaging and scattering techniques and compared to simulations. To access nanostructures at the liquid-solid interface advanced scattering techniques such as grazing incidence small-angle x-ray scattering (GISAXS) with micro- and nanometer-sized beams, GISAXS and in situ imaging ellipsometry and GISAXS tomography are used. Using gold nanoparticle suspensions, structures observed in the wetting area due to deposition are probed in situ during the drying of the droplets. After drying, nanostructures in the wetting area and inside the dried droplets are monitored. In addition to drying, a macroscopic movement of droplets is caused by body forces acting on an inclined substrate. The complexity of the solid surfaces is increased from simple silicon substrates to binary polymer brushes, which undergo a switching due to the liquid in the droplet. Nanostructures introduced in the polymer brush due to the movement of droplets are observed.

Near-surface relaxation structure of annealed block copolymer film on Si substrates examined by grazing-incidence small-angle scattering utilizing soft X-rays

Two-dimensional grazing-incidence small-angle X-ray scattering (GISAXS) measurements of SEBS8 block copolymer films deposited on Si(001) substrates have been performed to demonstrate depth-sensitive GISAXS utilizing soft X-rays of 1.77 keV. Remarkable elongation of the Bragg spots in theqzdirection, corresponding to microphase separation, was observed for an angle of incidence close to the critical angle. The elongation was explained in terms of the penetration depth, which limits the effective size in the direction perpendicular to the sample surface. Lattice distortion near the surface was confirmed.

Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB

We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidence small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample information from subnanometer up to micrometer length scales.

Exploring soft matter with x-rays: from the discovery of the DNA structure to the challenges of free electron lasers

X-rays have long been a precious tool for the study of the structure of matter. While the short wavelength makes them ideal for investigating materials down to the atomic scale, their high penetration power allows for the exploration of opaque samples at a multitude of length scales. We give an overview of the x-ray techniques suited for the characterization of soft matter and of their application to systems of current interest. We describe the advantages and limitations of existing x-ray methods and outline the possible developments following the introduction of a new kind of coherent source: the x-ray free electron laser.

Spatially resolved investigation of solution cast nanoparticle films by X-ray scattering and multidimensional data set classification

A combinatorial high-throughput approach is used to investigate a solution cast gradient consisting of colloidal gold nanoparticles on top of a silicon substrate by means of a X-ray nanobeam. Classification algorithms are used to reveal and visualize structural transitions from a frozen colloidal solution to a well-defined nanostructure. Prominent length scales on the order of 100 nm are observed. A periodic change in the nanostructure along the gradient is explained by a simplified stick-slip model.