1
|
Ogawa H, Aoki M, Ono S, Watanabe Y, Yamamoto S, Tanaka K, Takenaka M. Spatial Distribution of the Network Structure in Epoxy Resin via the MAXS-CT Method. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2022; 38:11432-11439. [PMID: 36082480 DOI: 10.1021/acs.langmuir.2c01741] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
We have succeeded in visualizing the spatial heterogeneity of the reaction ratio in epoxy resins by combining medium-angle X-ray scattering (MAXS) and computed tomography (CT). The reaction ratio is proportional to the degree of cross-linking between epoxy and amine in epoxy resins. The reaction ratio and its spatial inhomogeneity affect the toughness of epoxy resins. However, there has been no non-destructive method to measure the spatial inhomogeneity of the reaction ratio, although we can measure only the spatially averaged reaction ratio by Fourier-transform infrared spectroscopy (FT-IR). We found that the scattering peak reflected the cross-linking structures in the q region of MAXS and that the peak intensity is proportional to the reaction ratio. By reconstructing CT images from this peak intensity, we visualized the spatial heterogeneity of the reaction ratio. The application of this method may not be limited to epoxy resins but may extend to studying the heterogeneity of cross-linked structures in other materials.
Collapse
Affiliation(s)
- Hiroki Ogawa
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
- Riken SPring-8 Center, Sayo-cho, Hyogo 679-5148, Japan
| | - Mika Aoki
- Center for Polymer Interface and Molecular Adhesion Science, Kyushu University, Fukuoka 819-0395, Japan
| | - Shunsuke Ono
- School of Computing, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan
| | - Yuki Watanabe
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
- Riken SPring-8 Center, Sayo-cho, Hyogo 679-5148, Japan
| | - Satoru Yamamoto
- Center for Polymer Interface and Molecular Adhesion Science, Kyushu University, Fukuoka 819-0395, Japan
| | - Keiji Tanaka
- Riken SPring-8 Center, Sayo-cho, Hyogo 679-5148, Japan
- Center for Polymer Interface and Molecular Adhesion Science, Kyushu University, Fukuoka 819-0395, Japan
- Department of Applied Chemistry, Kyushu University, Fukuoka 819-0395, Japan
| | - Mikihito Takenaka
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
- Riken SPring-8 Center, Sayo-cho, Hyogo 679-5148, Japan
| |
Collapse
|
2
|
Smilgies D. GISAXS
: A versatile tool to assess structure and self‐assembly kinetics in block copolymer thin films. JOURNAL OF POLYMER SCIENCE 2022. [DOI: 10.1002/pol.20210244] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
Affiliation(s)
- Detlef‐M. Smilgies
- Center for Advanced Microelectronics Manufacturing (CAMM) Binghamton University Binghamton New York USA
- School of Pharmacy and Pharmaceutical Sciences Binghamton University Binghamton New York USA
- Materials Science and Engineering Program Binghamton University Binghamton New York USA
- R.F. Smith School of Chemical and Biomolecular Engineering Cornell University Ithaca New York USA
| |
Collapse
|
3
|
Xu S, Snyder CR, Rowlette J, Lee YJ. Three-Dimensional Molecular Orientation Imaging of a Semicrystalline Polymer Film under Shear Deformation. Macromolecules 2022. [DOI: 10.1021/acs.macromol.1c02036] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/27/2023]
Affiliation(s)
- Shuyu Xu
- Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Chad R. Snyder
- Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| | - Jeremy Rowlette
- DRS Daylight Solutions, San Diego, California 92127, United States
| | - Young Jong Lee
- Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
| |
Collapse
|
4
|
Mahale P, Lee B, Cheng HY, Segad M, Mallouk TE. Small-Angle X-ray Scattering Analysis of Colloidal Crystals and Replica Materials Made from l-Arginine-Stabilized Silica Nanoparticles. ACS APPLIED MATERIALS & INTERFACES 2022; 14:9398-9407. [PMID: 35134294 DOI: 10.1021/acsami.1c19193] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Colloidal crystals made from sub-100 nm silica nanoparticles have provided a versatile platform for the template-assisted synthesis of three-dimensionally interconnected semiconducting, metallic, and magnetic replicas. However, the detailed structure of these materials has not yet been characterized. In this study, we investigated the structures of colloidal crystalline films and germanium replicas by scanning electron microscopy and small angle X-ray scattering. The structures of colloidal crystals made by evaporative assembly depends on the size of l-arginine-capped silica nanoparticles. Particles smaller than ∼31 nm diameter assemble into non-close-packed arrangements (bcc) whereas particles larger than 31 nm assemble into random close-packed structures with disordered hexagonal phase. Polycrystalline films of these materials retain their structures and long-range order upon infiltration at high temperature and pressure, and the structure is preserved in Ge replicas. The shear force during deposition and dispersity of silica nanoparticles contributes to the size-based variation in the structure and to the size of crystal domains in the colloidal crystal films.
Collapse
Affiliation(s)
- Pratibha Mahale
- Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Byeongdu Lee
- Advanced Photon Source, Argonne National Laboratory, Argonne, Lemont, Illinois 60439, United States
| | - Hiu Yan Cheng
- Department of Chemistry, Pennsylvania State University, University Park, State College, Pennsylvania 16801, United States
| | - Mo Segad
- Materials Research Institute, Pennsylvania State University, University Park, State College, Pennsylvania 16801, United States
| | - Thomas E Mallouk
- Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| |
Collapse
|
5
|
Tsai EHR, Xia Y, Fukuto M, Loo YL, Li R. Grazing-incidence X-ray diffraction tomography for characterizing organic thin films. J Appl Crystallogr 2021; 54:1327-1339. [PMID: 34667445 PMCID: PMC8493617 DOI: 10.1107/s1600576721007184] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/24/2021] [Accepted: 07/12/2021] [Indexed: 11/10/2022] Open
Abstract
Characterization of thin films is of paramount importance for evaluating material processing outcomes/efficiency as well as establishing structure-property/performance relationships. This article introduces grazing-incidence diffraction tomography (GID tomography), a technique that combines grazing-incidence X-ray scattering and computed tomography to quantitatively determine the dimension and orientation of crystalline domains in thin films without restrictions on the beam coherence, substrate type or film thickness. This computational method extends the capability of synchrotron beamlines by utilizing standard X-ray scattering experiment setups.
Collapse
Affiliation(s)
- Esther H. R. Tsai
- Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Yu Xia
- Department of Chemical and Biological Engineering, Princeton University, Princeton, NJ 08544, USA
| | - Masafumi Fukuto
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Yueh-Lin Loo
- Department of Chemical and Biological Engineering, Princeton University, Princeton, NJ 08544, USA
- Andlinger Center for Energy and the Environment, Princeton University, Princeton, NJ 08544, USA
| | - Ruipeng Li
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| |
Collapse
|
6
|
Aoki H, Ogawa H, Takenaka M. Neutron Reflectometry Tomography for Imaging and Depth Structure Analysis of Thin Films with In-Plane Inhomogeneity. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2021; 37:196-203. [PMID: 33346671 DOI: 10.1021/acs.langmuir.0c02744] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Neutron reflectometry (NR) has been used for the depth structure analysis of materials at the surface and interface with a sub-nanometric resolution. Conventional NR provides averaged information for an area larger than several square centimeters; therefore, it cannot be applied to an interface with an in-plane inhomogeneity. In this study, the NR imaging of the in-plane structure of polymer thin films was achieved. The tomographic reconstruction of the spatially resolved NR profiles obtained by a sheet-shaped neutron beam provided a two-dimensional image of the in-plane interface morphology. The depth distribution of the neutron scattering length density was obtained by analyzing the position-dependent NR profile at a local area less than 0.1 mm2. The current NR tomography method enables NR measurements for an interface with an inhomogeneous structure. It also provides information on the three-dimensional distribution of the atomic composition near the surface and interfaces for various materials.
Collapse
Affiliation(s)
- Hiroyuki Aoki
- Materials and Life Science Division, J-PARC Center, Japan Atomic Energy Agency, 2-4 Shirakata, Tokai, Ibaraki 319-1195, Japan
- Institute of Materials Structure Science, High Energy Accelerator Research Organization, 203-1 Shirakata, Tokai, Ibaraki 319-1106, Japan
| | - Hiroki Ogawa
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
| | - Mikihito Takenaka
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan
| |
Collapse
|
7
|
Ogawa H, Ono S, Nishikawa Y, Fujiwara A, Kabe T, Takenaka M. Improving grazing-incidence small-angle X-ray scattering-computed tomography images by total variation minimization. J Appl Crystallogr 2020; 53:140-147. [PMID: 32047408 PMCID: PMC6998772 DOI: 10.1107/s1600576719016558] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/31/2019] [Accepted: 12/09/2019] [Indexed: 05/30/2023] Open
Abstract
Grazing-incidence small-angle X-ray scattering coupled with computed tomography (CT) has enabled the visualization of the spatial distribution of nanostructures in thin films. In this study, to optimize the CT image quality, total variation regularization is introduced to minimize sinogram image noise and artifacts. Grazing-incidence small-angle X-ray scattering (GISAXS) coupled with computed tomography (CT) has enabled the visualization of the spatial distribution of nanostructures in thin films. 2D GISAXS images are obtained by scanning along the direction perpendicular to the X-ray beam at each rotation angle. Because the intensities at the q positions contain nanostructural information, the reconstructed CT images individually represent the spatial distributions of this information (e.g. size, shape, surface, characteristic length). These images are reconstructed from the intensities acquired at angular intervals over 180°, but the total measurement time is prolonged. This increase in the radiation dosage can cause damage to the sample. One way to reduce the overall measurement time is to perform a scanning GISAXS measurement along the direction perpendicular to the X-ray beam with a limited interval angle. Using filtered back-projection (FBP), CT images are reconstructed from sinograms with limited interval angles from 3 to 48° (FBP-CT images). However, these images are blurred and have a low image quality. In this study, to optimize the CT image quality, total variation (TV) regularization is introduced to minimize sinogram image noise and artifacts. It is proposed that the TV method can be applied to downsampling of sinograms in order to improve the CT images in comparison with the FBP-CT images.
Collapse
Affiliation(s)
- Hiroki Ogawa
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan.,JST, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama 332-001, Japan.,Riken SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan
| | - Shunsuke Ono
- JST, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama 332-001, Japan.,School of Computing, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan
| | - Yukihiro Nishikawa
- Department of Macromolecular Science and Engineering, Kyoto Institute of Technology, Kyoto 606-8585, Japan
| | - Akihiko Fujiwara
- Department of Nanotechnology for Sustainable Energy, Kwansei Gakuin University, Hyogo 669-1337, Japan
| | - Taizo Kabe
- Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
| | - Mikihito Takenaka
- Institute for Chemical Research, Kyoto University, Gokasho, Uji, Kyoto 611-0011, Japan.,Riken SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan
| |
Collapse
|
8
|
Yashiro W, Ikeda S, Wada Y, Totsu K, Suzuki Y, Takeuchi A. Probing Surface Morphology using X-ray Grating Interferometry. Sci Rep 2019; 9:14120. [PMID: 31575992 PMCID: PMC6773752 DOI: 10.1038/s41598-019-50486-5] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/12/2019] [Accepted: 09/13/2019] [Indexed: 11/26/2022] Open
Abstract
X-ray reflectometry (XRR), a surface-sensitive technique widely used for characterizing surfaces, buried interfaces, thin films, and multilayers, enables determination of the electron density distribution perpendicular to a well-defined surface specularly reflecting X-rays. However, the electron density distribution parallel to the surface cannot be determined from an X-ray reflectivity curve. The electron density correlation in the lateral direction is usually probed by measuring the grazing-incidence small-angle X-ray scattering (GISAXS). GISAXS measurement, however, typically requires using a collimated X-ray point beam to distinguish the GISAXS from the specularly reflected X-rays, and so the sample must be scanned in the lateral direction with the point beam to investigate variations in the surface and interface morphology for a region larger than the size of the beam. In this paper, we report a new approach based on X-ray grating interferometry: an X-ray sheet beam is used instead of an X-ray point beam. A method using this approach can simultaneously provide one-dimensional real-space images of X-ray reflectivity, surface curvature, and ‘dark-field’ contrast with a field-of-view of more than a few millimetres. As a demonstration, a sample having a 400 nm line and space SiO2 pattern with a depth of 10 nm on its surface was used, and the dark-field contrast due to the unresolved line and space structure, creating GISAXS in the lateral direction, was successfully observed. Quantitative analysis of these contrasts provided the real-space distribution of the structural parameters for a simple model of the grating structure. Our study paves the way to a new approach to structure analysis, providing a quantitative way to investigate real-space variations in surface and interface morphology through wavefront analysis.
Collapse
Affiliation(s)
- Wataru Yashiro
- Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi, 980-8577, Japan.
| | - Susumu Ikeda
- WPI-Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi, 980-8577, Japan
| | - Yasuo Wada
- Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa, 223-8522, Japan
| | - Kentaro Totsu
- Micro System Integration Center (μSIC), Tohoku University, 519-1176 Aramaki-Aza-Aoba, Aoba-ku, Sendai, Miyagi, 980-0845, Japan
| | - Yoshio Suzuki
- Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5198, Japan
| | - Akihisa Takeuchi
- Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5198, Japan
| |
Collapse
|
9
|
Sakurai K, Jiang J, Mizusawa M, Ito T, Akutsu K, Miyata N. Neutron visualization of inhomogeneous buried interfaces in thin films. Sci Rep 2019; 9:571. [PMID: 30679617 PMCID: PMC6345982 DOI: 10.1038/s41598-018-37094-5] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/27/2018] [Accepted: 12/03/2018] [Indexed: 11/19/2022] Open
Abstract
When designing some functions in thin film systems, one of the key concepts is the structure of the constituent layers and interfaces. In an actual system, the layers and interfaces are often inhomogeneous in different scales, from hundreds of microns to several nanometers, causing differences in properties, despite very similar average structures. In this case, the choice of the observation point is critical to clarify the problem. Another critical aspect is the identification of these points by surveying the entire inhomogeneous thin film system. This article presents a description of a novel promising solution that is suitable for nondestructive visualization of inhomogeneous buried layers and interfaces in thin films. Such observations have been impossible until now. In this investigation, a unique extension of neutron reflectometry is proposed. While conventional neutron reflectivity just gives average depth-profiling of the scattering length density of layered thin films, the present method provides full picture of the inhomogeneity. In general, achieving a high spatial-resolving power for neutron scattering is not straightforward because the neutron counts become fairly limited at the sample or the detector position when the beam size is reduced. As a result, XY scanning of a sample with a small neutron beam is fairly difficult because of the required long measurement time. To address these issues, new concepts have been introduced for neutron reflectivity. The proposed method uses a wide beam instead of reducing the beam size. In addition, it measures the projection reflection profile instead of the total integrated intensity. These profiles are collected at a set of different in-plane angles. Similar to computed tomography, it is possible to obtain the specimen's two-dimensional (2D) neutron reflectivity distribution as one image. Because the spatial resolution is limited by the detection method, a Hadamard coded mask is employed to measure the reflection projection with only 50% loss of the primary neutron intensity. When the time-of-flight (ToF) mode is used for the neutron experiment, one can obtain many images as a function of ToF, i.e., the wavevector transfer. Such series of images can be displayed as a video. This indicates that the neutron reflectivity profiles of local points can be retrieved from the above video images. This paper presents the first report on the development of neutron reflectivity with imaging capability, and the analysis of local points in inhomogeneous layered thin-films without utilizing a small neutron beam. In the present work, the feasibility of the proposed method with approximately 1 mm spatial resolution was examined. In addition, further improvements of the approach are discussed. It is anticipated that this technique will facilitate new opportunities in the study of buried function interfaces.
Collapse
Affiliation(s)
- Kenji Sakurai
- National Institute for Material Science, 1-2-1, Sengen, Tsukuba, Ibaraki, 305-0047, Japan.
- University of Tsukuba, 1-1-1, Tennodai, Tsukuba, Ibaraki, 305-0006, Japan.
| | - Jinxing Jiang
- National Institute for Material Science, 1-2-1, Sengen, Tsukuba, Ibaraki, 305-0047, Japan
- University of Tsukuba, 1-1-1, Tennodai, Tsukuba, Ibaraki, 305-0006, Japan
| | - Mari Mizusawa
- National Institute for Material Science, 1-2-1, Sengen, Tsukuba, Ibaraki, 305-0047, Japan
- Comprehensive Research Organization for Science and Society (CROSS), Tokai, Ibaraki, 319-1106, Japan
| | - Takayoshi Ito
- Comprehensive Research Organization for Science and Society (CROSS), Tokai, Ibaraki, 319-1106, Japan
| | - Kazuhiro Akutsu
- Comprehensive Research Organization for Science and Society (CROSS), Tokai, Ibaraki, 319-1106, Japan
| | - Noboru Miyata
- Comprehensive Research Organization for Science and Society (CROSS), Tokai, Ibaraki, 319-1106, Japan
| |
Collapse
|
10
|
Ogawa H, Nishikawa Y, Takenaka M, Fujiwara A, Nakanishi Y, Tsujii Y, Takata M, Kanaya T. Visualization of Individual Images in Patterned Organic-Inorganic Multilayers Using GISAXS-CT. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2017; 33:4675-4681. [PMID: 28437112 DOI: 10.1021/acs.langmuir.7b00691] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Using grazing-incidence small-angle scattering (GISAXS) with computed tomography (CT), we have individually reconstructed the spatial distribution of a thin gold (Au) layer buried under a thin poly(styrene-b-2-vinylpyridine) (PS-b-P2VP) layer. Owing to the difference between total reflection angles of Au and PS-b-P2VP, the scattering profiles for Au nanoparticles and self-assembled nanostructures of PS-b-P2VP could be independently obtained by changing the X-ray angle of incidence. Reconstruction of scattering profiles allows one to separately characterize spatial distributions in Au and PS-b-P2VP nanostructures.
Collapse
Affiliation(s)
- Hiroki Ogawa
- Institute for Chemical Research, Kyoto University , Gokasho, Uji, Kyoto 611-0011, Japan
- JST, PRESTO, 4-1-8 Honcho, Kawaguchi, Saitama, 332-001, Japan
- Japan Synchrotron Radiation Research Institute , 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
- Riken SPring-8 Center , Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
| | - Yukihiro Nishikawa
- Department of Macromolecular Science and Engineering, Kyoto Institute of Technology , Kyoto 606-8585, Japan
| | - Mikihito Takenaka
- Institute for Chemical Research, Kyoto University , Gokasho, Uji, Kyoto 611-0011, Japan
- Riken SPring-8 Center , Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
| | - Akihiko Fujiwara
- Department of Nanotechnology for Sustainable Energy, Kwansei Gakuin University , Sanda, Hyogo 669-1337, Japan
| | - Yohei Nakanishi
- Institute for Chemical Research, Kyoto University , Gokasho, Uji, Kyoto 611-0011, Japan
| | - Yoshinobu Tsujii
- Institute for Chemical Research, Kyoto University , Gokasho, Uji, Kyoto 611-0011, Japan
| | - Masaki Takata
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University , Sendai 980-8577, Japan
- Riken SPring-8 Center , Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
| | - Toshiji Kanaya
- Institute for Chemical Research, Kyoto University , Gokasho, Uji, Kyoto 611-0011, Japan
- High Energy Accelerator Research Organization , Tokai-mura, Ibaraki 319-1106, Japan
| |
Collapse
|
11
|
Bhattacharyya A, Sanyal MK, Mogera U, George SJ, Mukhopadhyay MK, Maiti S, Kulkarni GU. In-Situ GISAXS Study of Supramolecular Nanofibers having Ultrafast Humidity Sensitivity. Sci Rep 2017; 7:246. [PMID: 28325936 PMCID: PMC5428228 DOI: 10.1038/s41598-017-00309-2] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/04/2016] [Accepted: 02/20/2017] [Indexed: 11/09/2022] Open
Abstract
Self assembled nanofibers derived from donor-acceptor (D-A) pair of dodecyl methyl viologen (DMV) and potassium salt of coronene tetracarboxylate (CS) is an excellent material for the development of organic electronic devices particularly for ultrafast response to relative humidity (RH). Here we have presented the results of in-situ grazing incidence small angle x-ray scattering (GISAXS) measurements to understand aridity dependent self reorganization of the nanofibers. The instantaneous changes in the organization of the nanofibers was monitored with different equilibrium RH conditions. Additionally formation of nanofibers during drying was studied by GISAXS technique - the results show two distinct stages of structural arrangements, first the formation of a lamellar mesophase and then, the evolution of a distorted hexagonal lattice. The RH dependent GISAXS results revealed a high degree of swelling in the lattice of the micelles and reduction in the distortion of the hexagonal structure with increase in RH. In high RH condition, the nanofibers show elliptical distortion but could not break into lamellar phase as observed during formation through drying. This observed structural deformation gives insight into nanoscopic structural changes of the micelles with change in RH around it and in turn explains ultrafast sensitivity in its conductivity for RH variation.
Collapse
Affiliation(s)
- Arpan Bhattacharyya
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India
| | - Milan K Sanyal
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India. .,Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India.
| | - Umesha Mogera
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India
| | - Subi J George
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India
| | | | - Santanu Maiti
- Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata, 700 064, India
| | - Giridhar U Kulkarni
- Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore, 560064, India.,Centre for Nano and Soft Matter Sciences, Jalahalli P.O., Bangalore, 560013, India
| |
Collapse
|
12
|
Roth SV. A deep look into the spray coating process in real-time-the crucial role of x-rays. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2016; 28:403003. [PMID: 27537198 DOI: 10.1088/0953-8984/28/40/403003] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
Tailoring functional thin films and coating by rapid solvent-based processes is the basis for the fabrication of large scale high-end applications in nanotechnology. Due to solvent loss of the solution or dispersion inherent in the installation of functional thin films and multilayers the spraying and drying processes are strongly governed by non-equilibrium kinetics, often passing through transient states, until the final structure is installed. Therefore, the challenge is to observe the structural build-up during these coating processes in a spatially and time-resolved manner on multiple time and length scales, from the nanostructure to macroscopic length scales. During installation, the interaction of solid-fluid interfaces and between the different layers, the flow and evaporation themselves determine the structure of the coating. Advanced x-ray scattering methods open a powerful pathway for observing the involved processes in situ, from the spray to the coating, and allow for gaining deep insight in the nanostructuring processes. This review first provides an overview over these rapidly evolving methods, with main focus on functional coatings, organic photovoltaics and organic electronics. Secondly the role and decisive advantage of x-rays is outlined. Thirdly, focusing on spray deposition as a rapidly emerging method, recent advances in investigations of spray deposition of functional materials and devices via advanced x-ray scattering methods are presented.
Collapse
Affiliation(s)
- Stephan V Roth
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany. Department of Fibre and Polymer Technology, KTH Royal Institute of Technology, Teknikringen 56-58, SE-100 44 Stockholm, Sweden
| |
Collapse
|
13
|
Wernecke J, Okuda H, Ogawa H, Siewert F, Krumrey M. Depth-Dependent Structural Changes in PS-b-P2VP Thin Films Induced by Annealing. Macromolecules 2014. [DOI: 10.1021/ma500642d] [Citation(s) in RCA: 32] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/28/2023]
Affiliation(s)
- Jan Wernecke
- Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany
| | - Hiroshi Okuda
- Department
of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyoku, Kyoto, 606-8501, Japan
| | - Hiroki Ogawa
- SPring-8, Japan Synchrotron Radiation Research Institute , 1-1-1, Kouto,
Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
| | - Frank Siewert
- Institute
Nanometre Optics and Technology, Helmholtz Zentrum Berlin (HZB), Albert-Einstein-Strasse 15, 12489 Berlin, Germany
| | - Michael Krumrey
- Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany
| |
Collapse
|
14
|
Santoro G, Buffet A, Döhrmann R, Yu S, Körstgens V, Müller-Buschbaum P, Gedde U, Hedenqvist M, Roth SV. Use of intermediate focus for grazing incidence small and wide angle x-ray scattering experiments at the beamline P03 of PETRA III, DESY. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2014; 85:043901. [PMID: 24784620 DOI: 10.1063/1.4869784] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We describe the new experimental possibilities of the micro- and nanofocus X-ray scattering beamline P03 of the synchrotron source PETRA III at DESY, Hamburg (Germany), which arise from experiments with smaller beam sizes in the micrometer range. This beamline has been upgraded recently to perform new kinds of experiments. The use of an intermediate focus allows for reducing the beam size of microfocused hard X-rays while preserving a large working distance between the focusing elements and the focus position. For the first time, this well-known methodology has been employed to grazing incidence small- and wide-angle X-ray scattering (GISAXS/GIWAXS). As examples, we highlight the applications to in situ studies using microfluidic devices in GISAXS geometry as well as the investigation of the crystallinity of thin films in GIWAXS geometry.
Collapse
Affiliation(s)
- G Santoro
- Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg, Germany
| | - A Buffet
- Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg, Germany
| | - R Döhrmann
- Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg, Germany
| | - S Yu
- Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg, Germany
| | - V Körstgens
- Physik-Department, Technische Universität München, Lehrstuhl für Funktionelle Materialien, James-Franck-Str. 1, D-85748 Garching, Germany
| | - P Müller-Buschbaum
- Physik-Department, Technische Universität München, Lehrstuhl für Funktionelle Materialien, James-Franck-Str. 1, D-85748 Garching, Germany
| | - U Gedde
- KTH Royal Institute of Technology, School of Chemical Science and Engineering, Fibre and Polymer Technology, SE-10044 Stockholm, Sweden
| | - M Hedenqvist
- KTH Royal Institute of Technology, School of Chemical Science and Engineering, Fibre and Polymer Technology, SE-10044 Stockholm, Sweden
| | - S V Roth
- Photon Science, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg, Germany
| |
Collapse
|
15
|
Sen D, Bahadur J, Mazumder S, Santoro G, Yu S, Roth SV. Probing evaporation induced assembly across a drying colloidal droplet using in situ small-angle X-ray scattering at the synchrotron source. SOFT MATTER 2014; 10:1621-1627. [PMID: 24651879 DOI: 10.1039/c3sm52039k] [Citation(s) in RCA: 21] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Colloidal particles in a tiny drying droplet are forced to assemble due to attractive capillary forces. Jamming of the particles throughout the droplet remains either isotropic or anisotropic depending upon the drying kinetics and the physicochemical environment. In this work, we explore the dynamical evolution of such an assembly process across a single evaporative droplet by in situ scanning small-angle scattering using a micro-focused X-ray beam at the synchrotron source. A methodology has been elucidated to differentiate quantitatively between the isotropic and the anisotropic jamming process. Switching of jamming behaviour depending on the initial particle volume fraction in the droplet has been demonstrated. Three distinct stages of assembly, associated with droplet shrinkage, have been revealed even during isotropic jamming. This is in contrast to the drying of a pure liquid droplet under diffusion limited evaporation. It has been established that such in situ scattering measurements can also be used to estimate the temporal evolutions of the viscosity of a drying suspension as well as the diffusivity of nanoparticles in a droplet.
Collapse
Affiliation(s)
- D Sen
- Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai-400085, India.
| | | | | | | | | | | |
Collapse
|
16
|
Herzog G, Benecke G, Buffet A, Heidmann B, Perlich J, Risch JFH, Santoro G, Schwartzkopf M, Yu S, Wurth W, Roth SV. In situ grazing incidence small-angle X-ray scattering investigation of polystyrene nanoparticle spray deposition onto silicon. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2013; 29:11260-11266. [PMID: 23927828 DOI: 10.1021/la402254q] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We investigated the spray deposition and subsequent self-assembly during drying of a polystyrene nanoparticle dispersion with in situ grazing incidence small-angle X-ray scattering at high time resolution. During the fast deposition of the dispersion and the subsequent evaporation of the solvent, different transient stages of nanoparticle assembly can be identified. In the first stage, the solvent starts to evaporate without ordering of the nanoparticles. During the second stage, large-scale structures imposed by the breakup of the liquid film are observable. In this stage, the solvent evaporates further and nanoparticle ordering starts. In the late third drying stage, the nanoparticles self-assemble into the final layer structure.
Collapse
Affiliation(s)
- Gerd Herzog
- Deutsches Elektronen-Synchrotron (DESY) , Notkestrasse 85, D-22607 Hamburg, Germany
| | | | | | | | | | | | | | | | | | | | | |
Collapse
|
17
|
Roth SV, Herzog G, Körstgens V, Buffet A, Schwartzkopf M, Perlich J, Abul Kashem MM, Döhrmann R, Gehrke R, Rothkirch A, Stassig K, Wurth W, Benecke G, Li C, Fratzl P, Rawolle M, Müller-Buschbaum P. In situ observation of cluster formation during nanoparticle solution casting on a colloidal film. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2011; 23:254208. [PMID: 21654049 DOI: 10.1088/0953-8984/23/25/254208] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
We present a real-time study of the nanostructuring and cluster formation of gold nanoparticles deposited in aqueous solution on top of a pre-structured polystyrene colloidal thin film. Cluster formation takes place at different length scales, from the agglomerations of the gold nanoparticles to domains of polystyrene colloids. By combining in situ imaging ellipsometry and microbeam grazing incidence small-angle x-ray scattering, we are able to identify different stages of nanocomposite formation, namely diffusion, roughness increase, layer build-up and compaction. The findings can serve as a guideline for nanocomposite tailoring by solution casting.
Collapse
Affiliation(s)
- S V Roth
- Deutsches Elektronen-Synchrotron (DESY), Notkestrabe, Hamburg, Germany.
| | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
Collapse
|
18
|
Müller-Buschbaum P, Magerl D, Hengstler R, Moulin JF, Körstgens V, Diethert A, Perlich J, Roth SV, Burghammer M, Riekel C, Gross M, Varnik F, Uhlmann P, Stamm M, Feldkamp JM, Schroer CG. Structure and flow of droplets on solid surfaces. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2011; 23:184111. [PMID: 21508480 DOI: 10.1088/0953-8984/23/18/184111] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
The structure and flow of droplets on solid surfaces is investigated with imaging and scattering techniques and compared to simulations. To access nanostructures at the liquid-solid interface advanced scattering techniques such as grazing incidence small-angle x-ray scattering (GISAXS) with micro- and nanometer-sized beams, GISAXS and in situ imaging ellipsometry and GISAXS tomography are used. Using gold nanoparticle suspensions, structures observed in the wetting area due to deposition are probed in situ during the drying of the droplets. After drying, nanostructures in the wetting area and inside the dried droplets are monitored. In addition to drying, a macroscopic movement of droplets is caused by body forces acting on an inclined substrate. The complexity of the solid surfaces is increased from simple silicon substrates to binary polymer brushes, which undergo a switching due to the liquid in the droplet. Nanostructures introduced in the polymer brush due to the movement of droplets are observed.
Collapse
Affiliation(s)
- P Müller-Buschbaum
- Physik-Department E13, Technische Universität München, Lehrstuhl für Funktionelle Materialien, Garching, Germany.
| | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
Collapse
|
19
|
Okuda H, Takeshita K, Ochiai S, Sakurai SI, Kitajima Y. Near-surface relaxation structure of annealed block copolymer film on Si substrates examined by grazing-incidence small-angle scattering utilizing soft X-rays. J Appl Crystallogr 2011. [DOI: 10.1107/s0021889811003578] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
Two-dimensional grazing-incidence small-angle X-ray scattering (GISAXS) measurements of SEBS8 block copolymer films deposited on Si(001) substrates have been performed to demonstrate depth-sensitive GISAXS utilizing soft X-rays of 1.77 keV. Remarkable elongation of the Bragg spots in theqzdirection, corresponding to microphase separation, was observed for an angle of incidence close to the critical angle. The elongation was explained in terms of the penetration depth, which limits the effective size in the direction perpendicular to the sample surface. Lattice distortion near the surface was confirmed.
Collapse
|
20
|
Perlich J, Rubeck J, Botta S, Gehrke R, Roth SV, Ruderer MA, Prams SM, Rawolle M, Zhong Q, Körstgens V, Müller-Buschbaum P. Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2010; 81:105105. [PMID: 21034117 DOI: 10.1063/1.3488459] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidence small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample information from subnanometer up to micrometer length scales.
Collapse
Affiliation(s)
- J Perlich
- HASYLAB, DESY, Notkestr. 85, 22607 Hamburg, Germany.
| | | | | | | | | | | | | | | | | | | | | |
Collapse
|
21
|
Zanchetta G, Cerbino R. Exploring soft matter with x-rays: from the discovery of the DNA structure to the challenges of free electron lasers. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2010; 22:323102. [PMID: 21386476 DOI: 10.1088/0953-8984/22/32/323102] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
X-rays have long been a precious tool for the study of the structure of matter. While the short wavelength makes them ideal for investigating materials down to the atomic scale, their high penetration power allows for the exploration of opaque samples at a multitude of length scales. We give an overview of the x-ray techniques suited for the characterization of soft matter and of their application to systems of current interest. We describe the advantages and limitations of existing x-ray methods and outline the possible developments following the introduction of a new kind of coherent source: the x-ray free electron laser.
Collapse
Affiliation(s)
- Giuliano Zanchetta
- Dipartimento di Chimica, Biochimica e Biotecnologie per la Medicina, Università degli Studi di Milano, I-20133, Milano, Italy.
| | | |
Collapse
|
22
|
Roth SV, Rothkirch A, Autenrieth T, Gehrke R, Wroblewski T, Burghammer MC, Riekel C, Schulz L, Hengstler R, Müller-Buschbaum P. Spatially resolved investigation of solution cast nanoparticle films by X-ray scattering and multidimensional data set classification. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2010; 26:1496-1500. [PMID: 20099914 DOI: 10.1021/la9037414] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
A combinatorial high-throughput approach is used to investigate a solution cast gradient consisting of colloidal gold nanoparticles on top of a silicon substrate by means of a X-ray nanobeam. Classification algorithms are used to reveal and visualize structural transitions from a frozen colloidal solution to a well-defined nanostructure. Prominent length scales on the order of 100 nm are observed. A periodic change in the nanostructure along the gradient is explained by a simplified stick-slip model.
Collapse
Affiliation(s)
- Stephan V Roth
- Deutsches Elektronen-Synchrotron, Notkestr. 85, D-22607 Hamburg, Germany.
| | | | | | | | | | | | | | | | | | | |
Collapse
|