Out-of-Plane Photoreorientation of Azo Dyes in Polymer Thin Films Studied by Surface Plasmon Resonance Spectroscopy

Thickness determination in anisotropic media with plasmon waveguide resonance imaging

This paper describes a simple procedure to determine the local thickness of a thin anisotropic layer. It also discriminates between isotropic and anisotropic regions, provided a smoothness hypothesis on the refractive index distribution is satisfied. The procedure is based on the analysis of surface plasmon resonance (SPR) data acquired in an imaging mode. The general arrangement of the setup is the Kretschmann configuration. We show, on an azobenzene modified polymer layer, good agreement between atomic force microscopy and optical measurements of thickness variation.

Waveguide spectroscopic characterization of 3D anisotropies in conventionally photooriented and annealed films of liquid crystalline and amorphous azobenzene polymers

Films of azobenzene-containing polymers were photooriented in the glassy state in such a way that the azobenzene side groups were oriented preferably perpendicular to the electric field vector. In the case of liquid crystalline polymers ,the photoinduced anisotropies generated in the glassy state were modified by thermotropic self-organization due to annealing above T(g). The conventional photoorientation process results in an oblate order. The changes in photoinduced anisotropies brought about by annealing in the liquid crystalline phase were investigated quantitatively for the first time by us for different polymer compositions and experimental conditions. Different biaxial and homeotropic orders result for liquid crystalline polymers, depending on the experimental conditions. Different polymer structures are compared and the influence of the interfaces is investigated. Orientational gradients can be induced by irradiation or annealing and are for the first time determined by the WKB (Wentzel-Kramers-Brillouin) method.

Surface plasmon resonance spectroscopy based on evanescent field treatment

The reflectance in a surface plasmon resonance (SPR) curve can be expressed in terms of the integration of the product between the evanescent electric field and the imaginary part of the dielectric constant of all absorbing media. The evanescent field in the metal film consists of two fields, one originating at the prism/metal interface and the other at the metal/dielectric interface. Near the resonance angle, the evanescent field strength at the metal/dielectric interface is much greater than that at the prism/metal interface. The evanescent field in dielectric medium has a single origin at the metal/dielectric interface. Due to the optical enhancement at the interface, the amplitude of the evanescent electric field in the dielectric medium is much greater than that in the metal film. This field, however, is not being utilized in conventional SPR where changes in the refractive index of the nonabsorbing dielectric media are of interest. In a system with an absorbing dielectric medium, the absorption of the medium is enhanced by the strong evanescent electric field. The evanescent field distributions in the metal film and in the dielectric medium are significantly altered by the absorbing dielectric, which results in shifting of the resonance angle, increasing of the reflectance, and broadening of the SPR curve. Since the absorption contribution from the absorbing dielectric can be separated from that of the metal film via knowledge of evanescent field distribution, an in-depth analysis of the SPR curve of an absorbing medium and its relationship with the material characteristics are possible.