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Segawa Y, Yamazaki K, Yamasaki J, Gohara K. Quasi-static 3D structure of graphene ripple measured using aberration-corrected TEM. NANOSCALE 2021; 13:5847-5856. [PMID: 33720239 DOI: 10.1039/d1nr00237f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Free-standing graphene has a three-dimensional (3D) structure, called a ripple, rather than a perfect two-dimensional (2D) crystal. Since theoretical calculations suggest that a ripple strongly influences various fundamental physicochemical properties of graphene, it is important to clarify the ripple structure quantitatively in experiments. This paper proposes a new method of measuring the 3D atomic structure of a ripple by using aberration-corrected transmission electron microscopy (TEM). The method utilizes the fact that the 2D contrast of a TEM image is sensitive to the height of a six-membered ring. The proposed method is experimentally applied to a monolayer graphene, and the 3D atomic arrangements of consecutively acquired TEM images are reconstructed. In that experiment, the specimen is found to be moving upward. Furthermore, the atomic arrangement can be approximated as a composite of two structures consisting of a 3D ripple and a 2D plane. The ripple is represented as a superposition of sinusoidal waves, with their wave vectors coinciding with the specific direction of the six-membered ring. The time dependences of the height and lateral size of the ripple are also measured.
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Affiliation(s)
- Yuhiro Segawa
- Division of Applied Physics, Faculty of Engineering, Hokkaido University, Sapporo 060-8628, Japan.
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Yamasaki J. Wave field reconstruction and phase imaging by electron diffractive imaging. Microscopy (Oxf) 2021; 70:116-130. [PMID: 33104192 DOI: 10.1093/jmicro/dfaa063] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/17/2020] [Revised: 10/16/2020] [Accepted: 10/22/2020] [Indexed: 11/13/2022] Open
Abstract
In electron diffractive imaging, the phase image of a sample is reconstructed from its diffraction intensity through iterative calculations. The principle of this method is based on the Fourier transform relation between the real-space wave field transmitted by the sample and its Fraunhofer diffraction wave field. Since Gerchberg's experimental work in 1972, various advancements have been achieved, which have substantially improved the quality of the reconstructed phase images and extended the applicable range of the method. In this review article, the principle of diffractive imaging, various experimental processes using electron beams and application to specific samples are explained in detail.
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Affiliation(s)
- Jun Yamasaki
- Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka, Japan.,Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Aichi, Japan
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Transmission Electron Microscopy of Carbon: A Brief History. C — JOURNAL OF CARBON RESEARCH 2018. [DOI: 10.3390/c4010004] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/02/2022]
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Yamasaki J, Hirata A, Hirotsu Y, Hirahara K, Tanaka N. B11-O-06Depth-Resolution Imaging of Crystalline Nano Clusters Using Aberration-Corrected TEM. Microscopy (Oxf) 2015. [DOI: 10.1093/jmicro/dfv076] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022] Open
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Yamasaki J, Mori M, Hirata A, Hirotsu Y, Tanaka N. Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM. Ultramicroscopy 2014; 151:224-231. [PMID: 25432326 DOI: 10.1016/j.ultramic.2014.11.005] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/09/2014] [Revised: 10/26/2014] [Accepted: 11/06/2014] [Indexed: 11/26/2022]
Abstract
For observations of crystalline nanoclusters, the features and capabilities of depth-resolution imaging by aberration-corrected transmission electron microscopy (TEM) were investigated using image simulations and experiments for two types of samples. The first sample was gold clusters attached on an amorphous carbon film. The experimental through-focal series indicated that the focal plane for the cluster was shifted 3 nm from that for the supporting film. This difference is due to the depth-resolution imaging of the cluster and film, the mid-planes of which are separated by 3 nm along the depth direction (the electron incident direction). On the basis of this information, the three-dimensional configuration of the sample, such as the film thickness of 2 nm, was successfully illustrated. The second sample was a Zr₆₆.₇Ni₃₃.₃ metallic glass including a medium-range-order (MRO) structure, which was approximately considered to be a crystalline cluster with a diameter of 1.6 nm. In the experimental through-focal series, the lattice fringe of the MRO cluster was visible at limited focal conditions. Image simulations reproduced well the focal conditions and also indicated a structural condition for the visualization that the embedded cluster must be apart from the mid-plane of the matrix film. Similar to the case of the first sample, this result can be explained by the idea that the "effective focal planes" for the film and cluster are at different heights. This type of depth-resolution phase contrast imaging is possible only in aberration-corrected TEM and when the sample has a simple structure and is sufficiently thin for the kinematical scattering approximation.
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Affiliation(s)
- Jun Yamasaki
- Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan; EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
| | - Masayuki Mori
- Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
| | - Akihiko Hirata
- Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | - Yoshihiko Hirotsu
- Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
| | - Nobuo Tanaka
- EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Maggini L, Füstös ME, Chamberlain TW, Cebrián C, Natali M, Pietraszkiewicz M, Pietraszkiewicz O, Székely E, Kamarás K, De Cola L, Khlobystov AN, Bonifazi D. Fullerene-driven encapsulation of a luminescent Eu(III) complex in carbon nanotubes. NANOSCALE 2014; 6:2887-2894. [PMID: 24473228 DOI: 10.1039/c3nr05876j] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
A novel CNT-based hybrid luminescent material was obtained via encapsulation of a C60-based Eu(III) complex into single-, double- and multi-walled carbon nanotubes (SWCNTs, DWCNTs and MWCNTs, respectively). Specifically, a luminescent negatively charged Eu(III) complex, electrostatically bonded to an imidazolium-functionalized fullerene cage, was transported inside CNTs by exploiting the affinity of fullerenes for the inner surface of these carbonaceous containers. The filling was performed under supercritical CO2 (scCO2) conditions to facilitate the entrapment of the ion-paired assembly. Accurate elemental, spectroscopic and morphological characterization not only demonstrated the efficiency of the filling strategy, but also the occurrence of nano-ordering of the encapsulated supramolecular luminophores when SWCNTs were employed.
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Affiliation(s)
- Laura Maggini
- Namur Research College (NARC), and Department of Chemistry, University of Namur (UNamur), Rue de Bruxelles 61, 5000 Namur, Belgium.
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Hayashi T, Muramatsu H, Shimamoto D, Fujisawa K, Tojo T, Muramoto Y, Yokomae T, Asaoka T, Kim YA, Terrones M, Endo M. Determination of the stacking order of curved few-layered graphene systems. NANOSCALE 2012; 4:6419-6424. [PMID: 22955157 DOI: 10.1039/c2nr30883e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.
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Affiliation(s)
- Takuya Hayashi
- Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan.
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Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University. Micron 2012. [DOI: 10.1016/j.micron.2011.10.004] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
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Yoshida K, Miao L, Tanaka N, Tanemura S. Direct observation of TiO6 octahedron forming titanate nanotube by advanced transmission electron microscopy. NANOTECHNOLOGY 2009; 20:405709. [PMID: 19752500 DOI: 10.1088/0957-4484/20/40/405709] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
The nanostructure of titanate nanotubes known as a one-dimensional catalytic/electric subject is combinatorially characterized using x-ray diffraction (XRD), micro-Raman, photoluminescence (PL) and advanced electron microscopy. The micro-Raman and PL spectra prove the successful synthesis of TiO6 octahedron units in macroscopic scale. Cryo-high-angle annular dark-field (HAADF)-STEM and aberration-corrected (AC) TEM visualize in real-space the TiO6 octahedron unit formed as a TiO2-based tubular structure prepared by the alkaline hydrothermal methods. The chirality and scrolling-up mechanism of the TiO6 octahedron nanosheets in relation to an asymmetrical chemical environment and mechanical tensions are discussed.
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Affiliation(s)
- K Yoshida
- Department of Crystalline Materials Science and Ecotopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
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Yoshida K, Ikuhara YH, Takahashi S, Hirayama T, Saito T, Sueda S, Tanaka N, Gai PL. The three-dimensional morphology of nickel nanodots in amorphous silica and their role in high-temperature permselectivity for hydrogen separation. NANOTECHNOLOGY 2009; 20:315703. [PMID: 19597261 DOI: 10.1088/0957-4484/20/31/315703] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
We report the development of technologically important nickel (Ni) nanodots (nanoparticles) dispersed in amorphous silica (SiO2) for high-temperature permselectivity for hydrogen separation membranes, crucial in hydrocarbon reactions and H(2) production, and present the systematic reconstruction of the three-dimensional (3D) structures of the nanodots using electron nano-tomography. 3D structures using cryogenic high-angle annular dark field scanning transmission electron microscopy (Cryo-HAADF-STEM), which is a more accurate method for nanoparticle morphology than conventional chemisorption, are correlated with experimental reversible hydrogen adsorption properties. The correlations provide the first direct evidence of very high activity on the nanoparticle surface and the nature of adsorption sites. The results have important implications in general for the use of electron nano-tomography in the design of supported metallic nanoparticles for hydrogen separation membranes.
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Affiliation(s)
- Kenta Yoshida
- The Nanocentre and the Department of Chemistry, The University of York, Heslington, York YO10 5BR, UK.
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Singh P, Campidelli S, Giordani S, Bonifazi D, Bianco A, Prato M. Organic functionalisation and characterisation of single-walled carbon nanotubes. Chem Soc Rev 2009; 38:2214-30. [PMID: 19623345 DOI: 10.1039/b518111a] [Citation(s) in RCA: 487] [Impact Index Per Article: 32.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Since carbon nanotubes (CNTs) display unique structures and remarkable physical properties, a variety of applications have emerged in both materials and life sciences. In terms of applications, the functionalisation of nanotubes is extremely important, as it increases their solubility and processability, and combines the unique properties of single-walled carbon nanotubes (SWCNTs) with those of other classes of materials. A number of methods have been developed, which can be divided into two major approaches: (1) non-covalent supramolecular modifications, and (2) covalent functionalisation. In this tutorial review, we survey the covalent modification of SWCNTs with organic moieties, and illustrate the major analytical techniques routinely used to characterise the functionalised materials.
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Affiliation(s)
- Prabhpreet Singh
- CNRS, Institut de Biologie Moléculaire et Cellulaire, Laboratoire d'Immunologie et Chimie Thérapeutiques, 15 Rue René Descartes, 67000, Strasbourg, France
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Yamasaki J, Kawai T, Kondo Y, Tanaka N. A practical solution for eliminating artificial image contrast in aberration-corrected TEM. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2008; 14:27-35. [PMID: 18173866 DOI: 10.1017/s1431927608080173] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/17/2007] [Accepted: 08/07/2007] [Indexed: 05/25/2023]
Abstract
We propose a simple and practical solution to remove artificial contrast inhibiting direct interpretation of atomic arrangements in aberration-corrected TEM. The method is based on a combination of "image subtraction" for elimination of nonlinear components in images and newly improved "image deconvolution" for proper compensation of nonflat phase contrast transfer function. The efficiency of the method is shown by experimental and simulation data of typical materials such as gold, silicon, and magnesium oxide. The hypothetical results from further improvements of TEM instruments are also simulated. It is concluded that we can approach actual atomic structures by using the present method, that is, a proper combination of a Cs corrector, image subtraction, and image deconvolution processes.
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Affiliation(s)
- Jun Yamasaki
- EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan.
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Tanaka N. Chapter 10 Spherical Aberration-Corrected Transmission Electron Microscopy for Nanomaterials. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2008. [DOI: 10.1016/s1076-5670(08)01010-0] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
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Tanaka N. Present status and future prospects of spherical aberration corrected TEM/STEM for study of nanomaterials ∗. SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS 2008; 9:014111. [PMID: 27877937 PMCID: PMC5099806 DOI: 10.1088/1468-6996/9/1/014111] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/16/2007] [Revised: 06/02/2008] [Accepted: 03/03/2008] [Indexed: 05/11/2023]
Abstract
The present status of Cs-corrected TEM/STEM is described from the viewpoint of the observation of nanomaterials. Characteristic features in TEM and STEM are explained using the experimental data obtained by our group and other research groups. Cs correction up to the 3rd-order aberration of an objective lens has already been established and research interest is focused on correcting the 5th-order spherical aberration and the chromatic aberration in combination with the development of a monochromator below an electron gun for smaller point-to-point resolution in optics. Another fundamental area of interest is the limitation of TEM and STEM resolution from the viewpoint of the scattering of electrons in crystals. The minimum size of the exit-wave function below samples undergoing TEM imaging is determined from the calculation of scattering around related atomic columns in the crystals. STEM does not have this limitation because the resolution is, in principle, determined by the probe size. One of the future prospects of Cs-corrected TEM/STEM is the possibility of extending the space around the sample holder by correcting the chromatic and spherical aberrations. This wider space will contribute to the ease of performing in situ experiments and various combinations of TEM and other analysis methods. High-resolution, in situ dynamic and 3D observations/analysis are the most important keywords in the next decade of high-resolution electron microscopy.
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Affiliation(s)
- Nobuo Tanaka
- EcoTopia Science Institute, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan
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Abstract
Emerging complex functional materials often have atomic order limited to the nanoscale. Examples include nanoparticles, species encapsulated in mesoporous hosts, and bulk crystals with intrinsic nanoscale order. The powerful methods that we have for solving the atomic structure of bulk crystals fail for such materials. Currently, no broadly applicable, quantitative, and robust methods exist to replace crystallography at the nanoscale. We provide an overview of various classes of nanostructured materials and review the methods that are currently used to study their structure. We suggest that successful solutions to these nanostructure problems will involve interactions among researchers from materials science, physics, chemistry, computer science, and applied mathematics, working within a "complex modeling" paradigm that combines theory and experiment in a self-consistent computational framework.
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Affiliation(s)
- Simon J L Billinge
- Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824, USA.
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