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Fereiro JA, Pecht I, Sheves M, Cahen D. Inelastic Electron Tunneling Spectroscopic Analysis of Bias-Induced Structural Changes in a Solid-State Protein Junction. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2021; 17:e2008218. [PMID: 33783130 DOI: 10.1002/smll.202008218] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/31/2020] [Revised: 02/10/2021] [Indexed: 05/25/2023]
Abstract
A central issue in protein electronics is how far the structural stability of the protein is preserved under the very high electrical field that it will experience once a bias voltage is applied. This question is studied on the redox protein Azurin in the solid-state Au/protein/Au junction by monitoring protein vibrations during current transport under applied bias, up to ≈1 GV m-1 , by electrical detection of inelastic electron transport effects. Characteristic vibrational modes, such as CH stretching, amide (NH) bending, and AuS (of the bonds that connect the protein to an Au electrode), are not found to change noticeably up to 1.0 V. At >1.0 V, the NH bending and CH stretching inelastic features have disappeared, while the AuS features persist till ≈2 V, i.e., the proteins remain Au bound. Three possible causes for the disappearance of the NH and CH inelastic features at high bias, namely, i) resonance transport, ii) metallic filament formation, and iii) bond rupture leading to structural changes in the protein are proposed and tested. The results support the last option and indicate that spectrally resolved inelastic features can serve to monitor in operando structural stability of biological macromolecules while they serve as electronic current conduit.
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Affiliation(s)
- Jerry A Fereiro
- Department of Materials and Interfaces, Weizmann Institute of Science, Rehovot, 7610001, Israel
| | - Israel Pecht
- Department of Immunology, Weizmann Institute of Science, Rehovot, 7610001, Israel
| | - Mordechai Sheves
- Department of Organic Chemistry, Weizmann Institute of Science, Rehovot, 7610001, Israel
| | - David Cahen
- Department of Materials and Interfaces, Weizmann Institute of Science, Rehovot, 7610001, Israel
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2
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Dodin A, Aull B, Kunz RR, Willard AP. Theoretical Bounds on Electron Energy Filtering in Disordered Nanomaterials. NANO LETTERS 2019; 19:8441-8446. [PMID: 31670966 DOI: 10.1021/acs.nanolett.9b02701] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Electron energy filters have recently been proposed as a method of reducing the effects of thermal broadening in device and sensing applications, enabling substantial improvements in their room temperature performance. Nanostructured materials can act as electron energy filters by funneling thermally broadened electrons through discrete energy levels. In this study, we develop a theoretical model of the electron filtering properties of nanostructured materials that explicitly includes the effects of thermal broadening and size heterogeneity on the heterogeneity of nanostructure energy levels. We find that under certain conditions quantum dot solids can perform as effective electronic energy filters. We identify a material-specific length scale parameter, Lcrit, that specifies the maximum mean quantum dot size that can yield effective energy filtering. Moreover, we show that energy filtering materials composed of quantum dots with size near Lcrit are maximally robust to heterogeneity in quantum dot size, tolerating variations ∼10% of the mean size. The length scale Lcrit can be estimated directly from the widely tabulated density of states effective mass and shows that semiconductors with light conduction band electrons, such as III-V type materials InSb and GaAs, are the most forgiving for energy filtering applications. Taken together, these results provide a practical set of quantitative design principles for semiconductor electron filters.
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Affiliation(s)
- Amro Dodin
- Department of Chemistry , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States
| | - Brian Aull
- Lincoln Laboratory , Massachusetts Institute of Technology , Lexington , Massachusetts 02421 , United States
| | - Roderick R Kunz
- Lincoln Laboratory , Massachusetts Institute of Technology , Lexington , Massachusetts 02421 , United States
| | - Adam P Willard
- Department of Chemistry , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States
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3
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Gibbs J, Otero de la Roza A, Bergren AJ, DiLabio GA. Interpretation of molecular device transport calculations. CAN J CHEM 2016. [DOI: 10.1139/cjc-2016-0279] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
Abstract
The field of molecular electronics will benefit from rational design approaches based on a complete understanding of the electronic structure of molecule-based devices. However, many computational approaches that are used to study molecular-scale devices are based on methods that have deficiencies that must be understood in order for those methods to be useful to the modeling and experimental community. Density-functional theory based methods have some well-known pitfalls that limit their application to the study of electron transport in models of molecular junction devices. Some of the impacts of these deficiencies are highlighted in this work through the use of a graphene model system and a variety of simple hydrocarbon molecules. Self-interaction error in simple functionals built from the local density approximation and the generalized gradient approximation results in very large errors in predicted absolute and relative ionization potentials. This demonstrates that electron transmission spectra predicted using these functionals should be considered with caution. We also demonstrate that care must be taken with the use of finite models for electrodes.
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Affiliation(s)
- Josh Gibbs
- Department of Chemistry, University of British Columbia, Fipke Centre 357, Okanagan Campus, 3247 University Way, Kelowna, BC V1V 1V7, Canada
| | - Alberto Otero de la Roza
- Department of Chemistry, University of British Columbia, Fipke Centre 357, Okanagan Campus, 3247 University Way, Kelowna, BC V1V 1V7, Canada
| | - Adam Johan Bergren
- National Institute for Nanotechnology, National Research Council of Canada, 11421 Saskatchewan Drive, Edmonton, AB T6G 2M9, Canada
| | - Gino A. DiLabio
- Department of Chemistry, University of British Columbia, Fipke Centre 357, Okanagan Campus, 3247 University Way, Kelowna, BC V1V 1V7, Canada
- National Institute for Nanotechnology, National Research Council of Canada, 11421 Saskatchewan Drive, Edmonton, AB T6G 2M9, Canada
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4
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Fereiro JA, Kondratenko M, Bergren AJ, McCreery RL. Internal Photoemission in Molecular Junctions: Parameters for Interfacial Barrier Determinations. J Am Chem Soc 2015; 137:1296-304. [DOI: 10.1021/ja511592s] [Citation(s) in RCA: 31] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/18/2023]
Affiliation(s)
- Jerry A. Fereiro
- Department
of Chemistry, University of Alberta, 11227 Saskatchewan Drive Northwest, Edmonton, Alberta T6G 2G2, Canada
| | - Mykola Kondratenko
- Department
of Chemistry, University of Alberta, 11227 Saskatchewan Drive Northwest, Edmonton, Alberta T6G 2G2, Canada
- National
Institute for Nanotechnology, National Research Council Canada, 11421
Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada
| | - Adam Johan Bergren
- National
Institute for Nanotechnology, National Research Council Canada, 11421
Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada
| | - Richard L. McCreery
- Department
of Chemistry, University of Alberta, 11227 Saskatchewan Drive Northwest, Edmonton, Alberta T6G 2G2, Canada
- National
Institute for Nanotechnology, National Research Council Canada, 11421
Saskatchewan Drive, Edmonton, Alberta T6G 2M9, Canada
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5
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Zhang Y, Zhao Z, Fracasso D, Chiechi RC. Bottom-Up Molecular Tunneling Junctions Formed by Self-Assembly. Isr J Chem 2014. [DOI: 10.1002/ijch.201400033] [Citation(s) in RCA: 33] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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6
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Schukfeh MI, Storm K, Mahmoud A, Søndergaard RR, Szwajca A, Hansen A, Hinze P, Weimann T, Svensson SF, Bora A, Dick KA, Thelander C, Krebs FC, Lugli P, Samuelson L, Tornow M. Conductance enhancement of InAs/InP heterostructure nanowires by surface functionalization with oligo(phenylene vinylene)s. ACS NANO 2013; 7:4111-4118. [PMID: 23631558 DOI: 10.1021/nn400380g] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We have investigated the electronic transport through 3 μm long, 45 nm diameter InAs nanowires comprising a 5 nm long InP segment as electronic barrier. After assembly of 12 nm long oligo(phenylene vinylene) derivative molecules onto these InAs/InP nanowires, we observed a pronounced, nonlinear I-V characteristic with significantly increased currents of up to 1 μA at 1 V bias, for a back-gate voltage of 3 V. As supported by our model calculations based on a nonequilibrium Green Function approach, we attribute this effect to charge transport through those surface-bound molecules, which electrically bridge both InAs regions across the embedded InP barrier.
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7
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McCreery RL, Yan H, Bergren AJ. A critical perspective on molecular electronic junctions: there is plenty of room in the middle. Phys Chem Chem Phys 2013; 15:1065-81. [DOI: 10.1039/c2cp43516k] [Citation(s) in RCA: 124] [Impact Index Per Article: 11.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/22/2022]
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8
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Demir F, Kirczenow G. Inelastic tunneling spectroscopy of gold-thiol and gold-thiolate interfaces in molecular junctions: the role of hydrogen. J Chem Phys 2012; 137:094703. [PMID: 22957582 DOI: 10.1063/1.4748379] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/06/2023] Open
Abstract
It is widely believed that when a molecule with thiol (S-H) end groups bridges a pair of gold electrodes, the S atoms bond to the gold and the thiol H atoms detach from the molecule. However, little is known regarding the details of this process, its time scale, and whether molecules with and without thiol hydrogen atoms can coexist in molecular junctions. Here, we explore theoretically how inelastic tunneling spectroscopy (IETS) can shed light on these issues. We present calculations of the geometries, low bias conductances, and IETS of propanedithiol and propanedithiolate molecular junctions with gold electrodes. We show that IETS can distinguish between junctions with molecules having no, one, or two thiol hydrogen atoms. We find that in most cases, the single-molecule junctions in the IETS experiment of Hihath et al. [Nano Lett. 8, 1673 (2008)] had no thiol H atoms, but that a molecule with a single thiol H atom may have bridged their junction occasionally. We also consider the evolution of the IETS spectrum as a gold STM tip approaches the intact S-H group at the end of a molecule bound at its other end to a second electrode. We predict the frequency of a vibrational mode of the thiol H atom to increase by a factor ~2 as the gap between the tip and molecule narrows. Therefore, IETS should be able to track the approach of the tip towards the thiol group of the molecule and detect the detachment of the thiol H atom from the molecule when it occurs.
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Affiliation(s)
- Firuz Demir
- Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada.
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9
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Demir F, Kirczenow G. Identification of the atomic scale structures of the gold-thiol interfaces of molecular nanowires by inelastic tunneling spectroscopy. J Chem Phys 2012; 136:014703. [DOI: 10.1063/1.3671455] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/11/2023] Open
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10
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Teixeira JM, Ventura J, Araujo JP, Sousa JB, Wisniowski P, Cardoso S, Freitas PP. Resonant tunneling through electronic trapping states in thin MgO magnetic junctions. PHYSICAL REVIEW LETTERS 2011; 106:196601. [PMID: 21668184 DOI: 10.1103/physrevlett.106.196601] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/05/2010] [Indexed: 05/30/2023]
Abstract
We report an inelastic electron tunneling spectroscopy study on MgO magnetic junctions with thin barriers (0.85-1.35 nm). Inelastic electron tunneling spectroscopy reveals resonant electronic trapping within the barrier for voltages V>0.15 V. These trapping features are associated with defects in the barrier crystalline structure, as confirmed by high-resolution transmission electron microscopy. Such defects are responsible for resonant tunneling due to energy levels that are formed in the barrier. A model was applied to determine the average location and energy level of the traps, indicating that they are mostly located in the middle of the MgO barrier, in accordance with the high-resolution transmission electron microscopy data and trap-assisted tunneling conductance theory. Evidence of the influence of trapping on the voltage dependence of tunnel magnetoresistance is shown.
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Affiliation(s)
- J M Teixeira
- IFIMUP and IN-Institute of Nanoscience and Nanotechnology, and Departamento de Fisica, Faculdade de Ciencias, Universidade do Porto, Rua do Campo Alegre, 687, 4169-007 Porto, Portugal.
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11
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Bergren AJ, McCreery RL. Analytical chemistry in molecular electronics. ANNUAL REVIEW OF ANALYTICAL CHEMISTRY (PALO ALTO, CALIF.) 2011; 4:173-195. [PMID: 21370986 DOI: 10.1146/annurev-anchem-061010-113847] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
This review discusses the analytical characterization of molecular electronic devices and structures relevant thereto. In particular, we outline the methods for probing molecular junctions, which contain an ensemble of molecules between two contacts. We discuss the analytical methods that aid in the fabrication and characterization of molecular junctions, beginning with the confirmation of the placement of a molecular layer on a conductive or semiconductive substrate. We emphasize methods that provide information about the molecular layer in the junction and outline techniques to ensure molecular layer integrity after the complete fabrication of a device. In addition, we discuss the analytical information derived during the actual device operation.
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Affiliation(s)
- Adam Johan Bergren
- National Institute for Nanotechnology, National Research Council Canada, Edmonton, Alberta T6G 2M9, Canada.
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12
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Bonifas AP, McCreery RL. 'Soft' Au, Pt and Cu contacts for molecular junctions through surface-diffusion-mediated deposition. NATURE NANOTECHNOLOGY 2010; 5:612-617. [PMID: 20581834 DOI: 10.1038/nnano.2010.115] [Citation(s) in RCA: 76] [Impact Index Per Article: 5.4] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/12/2010] [Accepted: 05/13/2010] [Indexed: 05/29/2023]
Abstract
Virtually all types of molecular electronic devices depend on electronically addressing a molecule or molecular layer through the formation of a metallic contact. The introduction of molecular devices into integrated circuits will probably depend on the formation of contacts using a vapour deposition technique, but this approach frequently results in the metal atoms penetrating or damaging the molecular layer. Here, we report a method of forming 'soft' metallic contacts on molecular layers through surface-diffusion-mediated deposition, in which the metal atoms are deposited remotely and then diffuse onto the molecular layer, thus eliminating the problems of penetration and damage. Molecular junctions fabricated by this method exhibit excellent yield (typically >90%) and reproducibility, and allow examination of the effects of molecular-layer structure, thickness and contact work function.
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Affiliation(s)
- Andrew P Bonifas
- Department of Materials, Science and Engineering, The Ohio State University, 2041 College Road, Columbus, Ohio, 43210, USA
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13
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Vilan A, Yaffe O, Biller A, Salomon A, Kahn A, Cahen D. Molecules on si: electronics with chemistry. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2010; 22:140-159. [PMID: 20217681 DOI: 10.1002/adma.200901834] [Citation(s) in RCA: 74] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
Basic scientific interest in using a semiconducting electrode in molecule-based electronics arises from the rich electrostatic landscape presented by semiconductor interfaces. Technological interest rests on the promise that combining existing semiconductor (primarily Si) electronics with (mostly organic) molecules will result in a whole that is larger than the sum of its parts. Such a hybrid approach appears presently particularly relevant for sensors and photovoltaics. Semiconductors, especially Si, present an important experimental test-bed for assessing electronic transport behavior of molecules, because they allow varying the critical interface energetics without, to a first approximation, altering the interfacial chemistry. To investigate semiconductor-molecule electronics we need reproducible, high-yield preparations of samples that allow reliable and reproducible data collection. Only in that way can we explore how the molecule/electrode interfaces affect or even dictate charge transport, which may then provide a basis for models with predictive power.To consider these issues and questions we will, in this Progress Report, review junctions based on direct bonding of molecules to oxide-free Si.describe the possible charge transport mechanisms across such interfaces and evaluate in how far they can be quantified.investigate to what extent imperfections in the monolayer are important for transport across the monolayer.revisit the concept of energy levels in such hybrid systems.
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14
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McCreery RL, Bergren AJ. Progress with molecular electronic junctions: meeting experimental challenges in design and fabrication. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2009; 21:4303-4322. [PMID: 26042937 DOI: 10.1002/adma.200802850] [Citation(s) in RCA: 224] [Impact Index Per Article: 14.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/25/2008] [Revised: 01/26/2009] [Indexed: 05/28/2023]
Abstract
Molecular electronics seeks to incorporate molecular components as functional elements in electronic devices. There are numerous strategies reported to date for the fabrication, design, and characterization of such devices, but a broadly accepted example showing structure-dependent conductance behavior has not yet emerged. This progress report focuses on experimental methods for making both single-molecule and ensemble molecular junctions, and highlights key results from these efforts. Based on some general objectives of the field, particular experiments are presented to show progress in several important areas, and also to define those areas that still need attention. Some of the variable behavior of ostensibly similar junctions reported in the literature is attributable to differences in the way the junctions are fabricated. These differences are due, in part, to the multitude of methods for supporting the molecular layer on the substrate, including methods that utilize physical adsorption and covalent bonds, and to the numerous strategies for making top contacts. After discussing recent experimental progress in molecular electronics, an assessment of the current state of the field is presented, along with a proposed road map that can be used to assess progress in the future.
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Affiliation(s)
- Richard L McCreery
- Department of Chemistry, University of Alberta Edmonton, AB T6G 2G2 (Canada).
- National Institute for Nanotechnology, National Research Council Canada Edmonton, AB T6G 2M9 (Canada).
| | - Adam Johan Bergren
- National Institute for Nanotechnology, National Research Council Canada Edmonton, AB T6G 2M9 (Canada)
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15
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Taniguchi M, Tsutsui M, Yokota K, Kawai T. Inelastic electron tunneling spectroscopy of single-molecule junctions using a mechanically controllable break junction. NANOTECHNOLOGY 2009; 20:434008. [PMID: 19801761 DOI: 10.1088/0957-4484/20/43/434008] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
We report the use of electrical measurements to identify simultaneously the number and type of organic molecules within metal-molecule-metal junctions. Our strategy combines analyses of single-molecule conductance and inelastic electron tunneling spectra, exploiting a nanofabricated mechanically controllable break junction. We found that the peak linewidth of the inelastic electron tunneling spectrum decreased as the modulation voltage and temperature decreased, and that the selection rule for inelastic electron tunneling spectroscopy agrees with that for Raman spectroscopy. Furthermore, the differential conductance curve of the single-molecule junction suggests that it has asymmetrical electrode-molecule coupling.
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Affiliation(s)
- Masateru Taniguchi
- The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka, Japan.
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16
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Yang M, Wouters D, Giesbers M, Schubert US, Zuilhof H. Local probe oxidation of self-assembled monolayers on hydrogen-terminated silicon. ACS NANO 2009; 3:2887-900. [PMID: 19754133 DOI: 10.1021/nn9007059] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/21/2023]
Abstract
Local probe oxidation experiments by conductive AFM have been performed on a hexadecyl monolayer and a N-hydroxysuccinimide (NHS)-ester-functionalized undecyl (NHS-UA) monolayer assembled on hydrogen-terminated (i.e., unoxidized) silicon. The oxidation conditions for the mild oxidation of the top terminal groups of monolayers and the deep oxidation of the underlying silicon into silicon oxide were investigated. The results show that the bias threshold for the AFM tip-induced oxidation of the top groups of monolayers on oxide-free silicon can be reduced by 2 V for the methyl-terminated hexadecyl monolayer and even by 3.5 V for the active NHS-ester-terminated undecyl monolayer, in comparison to a methyl-terminated octadecyl trichlorosilane (OTS) monolayer on oxidized silicon. Upon such local mild oxidation, the active NHS ester group of the NHS-UA monolayer is selectively cleaved off to generate carboxyl-containing monolayer nanopatterns, opening further possibilities for subsequent patterned multifunctionalization.
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Affiliation(s)
- Menglong Yang
- Laboratory of Organic Chemistry, Wageningen University, Dreijenplein 8, 6703 HB Wageningen, The Netherlands
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17
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Landau A, Nitzan A, Kronik L. Cooperative Effects in Molecular Conduction II: The Semiconductor−Metal Molecular Junction. J Phys Chem A 2009; 113:7451-60. [DOI: 10.1021/jp900301f] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Affiliation(s)
- Arie Landau
- School of Chemistry, Tel Aviv University, Tel Aviv 69978, Israel
| | - Abraham Nitzan
- School of Chemistry, Tel Aviv University, Tel Aviv 69978, Israel
| | - Leeor Kronik
- Department of Materials and Interfaces, Weizmann Institute of Science, Rehovoth 76100, Israel
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Yu LH, Gergel-Hackett N, Zangmeister CD, Hacker CA, Richter CA, Kushmerick JG. Molecule-induced interface states dominate charge transport in Si-alkyl-metal junctions. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2008; 20:374114. [PMID: 21694421 DOI: 10.1088/0953-8984/20/37/374114] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Abstract
Semiconductor-molecule-metal junctions consisting of alkanethiol monolayers self-assembled on both p(+) and n(-) type highly doped Si(111) wires contacted with a 10 µm Au wire in a crossed-wire geometry are examined. Low temperature transport measurements reveal that molecule-induced semiconductor interface states control charge transport across these systems. Inelastic electron tunneling spectroscopy also highlights the strong contribution of the induced interface states to the observed charge transport.
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Affiliation(s)
- Lam H Yu
- National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
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