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Sun Q, Liu W, Huang D, Huang X, Xu S, Wang J, Ye Z, Wang X, Wu S, Yue Y. Molecular dynamics study on thermal conductance between a nanotip and a substrate under vertical forces and horizontal sliding. Phys Chem Chem Phys 2023; 25:5510-5519. [PMID: 36723186 DOI: 10.1039/d2cp04655e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/11/2023]
Abstract
The heat transfer between a nanotip and its substrate is extremely complex but is a key factor in determining the measurement accuracy in tip-assisted nanomanufacturing and thermometry. In this work, the heat transfer from the nanotip to the substrate during sliding is investigated using molecular dynamics simulations. Interfacial interaction and bond formation are analyzed during the sliding process. The results show that the increase of vertical force would greatly improve the interface thermal conductance between the nanotip and the substrate. It is found that more bonds are formed and there are larger contact areas at the interface. In addition, we found that the thermal conductivity of the nanotip is another obstacle for heat transfer between the tip and substrate and it is greatly limited by the nanotip diameter near contact which is close to or even smaller than the phonon mean free path. Meanwhile, the dynamic formation and breakage of the covalent bonds during the sliding could gradually smoothen the tip apex and enhance the thermal transport at the interface. This work provides guidance for the thermal design of a nanotip-substrate system for nanoscale thermal transport measurements.
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Affiliation(s)
- Qiangsheng Sun
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Wenxiang Liu
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Dezhao Huang
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Xiaona Huang
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Shen Xu
- School of Mechanical and Automotive Engineering, Shanghai University of Engineering Science, Shanghai 201620, China
| | - Jianmei Wang
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Zhijiang Ye
- Department of Mechanical and Manufacturing Engineering, Miami University, Ohio 45056, USA
| | - Xiaosun Wang
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Shijing Wu
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
| | - Yanan Yue
- School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China. .,Department of Mechanical and Manufacturing Engineering, Miami University, Ohio 45056, USA
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He Y, She D, Liu Z, Wang X, Zhong L, Wang C, Wang G, Mao SX. Atomistic observation on diffusion-mediated friction between single-asperity contacts. NATURE MATERIALS 2022; 21:173-180. [PMID: 34621059 DOI: 10.1038/s41563-021-01091-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/04/2020] [Accepted: 07/28/2021] [Indexed: 06/13/2023]
Abstract
The field of nanotribology has long suffered from the inability to directly observe what takes place at a sliding interface. Although techniques based on atomic force microscopy have identified many friction phenomena at the nanoscale, many interpretative pitfalls still result from the indirect or ex situ characterization of contacting surfaces. Here we combined in situ high-resolution transmission electron microscopy and atomic force microscopy measurements to provide direct real-time observations of atomic-scale interfacial structure during frictional processes and discovered the formation of a loosely packed interfacial layer between two metallic asperities that enabled a low friction under tensile stress. This finding is corroborated by molecular dynamic simulations. The loosely packed interfacial layer became an ordered layer at equilibrium distances under compressive stress, which led to a transition from a low-friction to a dissipative high-friction motion. This work directly unveils a unique role of atomic diffusion in the friction of metallic contacts.
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Affiliation(s)
- Yang He
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
| | - Dingshun She
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
- School of Engineering and Technology, China University of Geosciences, Beijing, China
| | - Zhenyu Liu
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
| | - Xiang Wang
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
| | - Li Zhong
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA
| | - Chongmin Wang
- Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA, USA.
| | - Guofeng Wang
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA.
| | - Scott X Mao
- Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, USA.
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Lobato-Dauzier N, Denoual M, Sato T, Tachikawa S, Jalabert L, Fujita H. Current driven magnetic actuation of a MEMS silicon beam in a transmission electron microscope. Ultramicroscopy 2018; 197:100-104. [PMID: 30572300 DOI: 10.1016/j.ultramic.2018.12.002] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/04/2018] [Revised: 11/29/2018] [Accepted: 12/04/2018] [Indexed: 11/28/2022]
Abstract
Micro-Electro-Mechanical-System (MEMS) devices associated to Transmission Electron Microscopes (TEM) have demonstrated their high potential for atomic resolution imaging of specimen while applying stress for mechanical testing. This paper introduces a novel actuation principle for the MEMS device in TEM relying on the internal magnetic field of the TEM and current flow through the device. The actuation principle is experimentally demonstrated in TEM and entirely modeled in the case of a silicon beam. The model is validated through static and dynamic experimental studies. The thermal side-effect of current flow is taken into account. The major advantages of the proposed magnetic actuation principle are the bidirectional control of the displacement of the device, the intrinsic linear displacement of the device with applied current and the potential milliNewton (mN) range force generation.
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Affiliation(s)
- Nicolas Lobato-Dauzier
- Institute of Industrial Science, The University of Tokyo,Tokyo, Japan; LIMMS, CNRS-Institute of Industrial Science, UMI 2820, The University of Tokyo, Tokyo, Japan
| | - Matthieu Denoual
- Institute of Industrial Science, The University of Tokyo,Tokyo, Japan; LIMMS, CNRS-Institute of Industrial Science, UMI 2820, The University of Tokyo, Tokyo, Japan; GREYC-ENSICAEN, Université de Caen Basse Normandie, Caen, France.
| | - Takaaki Sato
- Institute of Industrial Science, The University of Tokyo,Tokyo, Japan
| | - Saeko Tachikawa
- Institute of Industrial Science, The University of Tokyo,Tokyo, Japan; LIMMS, CNRS-Institute of Industrial Science, UMI 2820, The University of Tokyo, Tokyo, Japan
| | - Laurent Jalabert
- LIMMS, CNRS-Institute of Industrial Science, UMI 2820, The University of Tokyo, Tokyo, Japan
| | - Hiroyuki Fujita
- Institute of Industrial Science, The University of Tokyo,Tokyo, Japan; LIMMS, CNRS-Institute of Industrial Science, UMI 2820, The University of Tokyo, Tokyo, Japan
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