Theory of Single-Impact Atomic Force Spectroscopy in liquids with material contrast

Viscoelastic parameterization of human skin cells characterize material behavior at multiple timescales

Countless biophysical studies have sought distinct markers in the cellular mechanical response that could be linked to morphogenesis, homeostasis, and disease. Here, an iterative-fitting methodology visualizes the time-dependent viscoelastic behavior of human skin cells under physiologically relevant conditions. Past investigations often involved parameterizing elastic relationships and assuming purely Hertzian contact mechanics, which fails to properly account for the rich temporal information available. We demonstrate the performance superiority of the proposed iterative viscoelastic characterization method over standard open-search approaches. Our viscoelastic measurements revealed that 2D adherent metastatic melanoma cells exhibit reduced elasticity compared to their normal counterparts—melanocytes and fibroblasts, and are significantly less viscous than fibroblasts over timescales spanning three orders of magnitude. The measured loss angle indicates clear differential viscoelastic responses across multiple timescales between the measured cells. This method provides insight into the complex viscoelastic behavior of metastatic melanoma cells relevant to better understanding cancer metastasis and aggression.

Parvini, Cartagena and Solares introduce an iterative viscoelastic approach based on the generalized Maxwell and Kelvin-Voigt models. The results showed that metastatic melanoma cells had lower elasticity than normal fibroblasts and melanoma cells were less viscous than the fibroblasts over a large frequency range, enhancing the understanding of cellular responses at different frequencies.

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed with the aid of force-distance relationships acquired using atomic force microscopy (AFM). The general strategy for existing methods is to fit the observed material behavior to specific viscoelastic models, such as generalized viscoelastic models or power-law rheology models, among others. Here we propose a new method to invert and obtain the viscoelastic properties of a material through the use of the Z-transform, without using a model. We present the rheological viscoelastic relations in their classical derivation and their z-domain correspondence. We illustrate the proposed technique on a model experiment involving a traditional ramp-shaped force-distance AFM curve, demonstrating good agreement between the viscoelastic characteristics extracted from the simulated experiment and the theoretical expectations. We also provide a path for calculating standard viscoelastic responses from the extracted material characteristics. The new technique based on the Z-transform is complementary to previous model-based viscoelastic analyses and can be advantageous with respect to Fourier techniques due to its generality. Additionally, it can handle the unbounded inputs traditionally used to acquire force-distance relationships in AFM, such as ramp functions, in which the cantilever position is displaced linearly with time for a finite period of time.

Data acquisition and imaging using wavelet transform: a new path for high speed transient force microscopy

The unique ability of Atomic Force Microscopy (AFM) to image, manipulate and characterize materials at the nanoscale has made it a remarkable tool in nanotechnology. In dynamic AFM, acquisition and processing of the photodetector signal originating from probe-sample interaction is a critical step in data analysis and measurements. However, details of such interaction including its nonlinearity and dynamics of the sample surface are limited due to the ultimately bounded bandwidth and limited time scales of data processing electronics of standard AFM. Similarly, transient details of the AFM probe's cantilever signal are lost due to averaging of data by techniques which correlate the frequency spectrum of the captured data with a temporally invariant physical system. Here, we introduce a fundamentally new approach for dynamic AFM data acquisition and imaging based on applying the wavelet transform on the data stream from the photodetector. This approach provides the opportunity for exploration of the transient response of the cantilever, analysis and imaging of the dynamics of amplitude and phase of the signals captured from the photodetector. Furthermore, it can be used for the control of AFM which would yield increased imaging speed. Hence the proposed method opens a pathway for high-speed transient force microscopy.

Few-cycle Regime Atomic Force Microscopy

Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever through a relatively modern mathematical tool, which has caused important developments in several scientific fields but that is still quite unknown in the AFM context: the wavelet analysis. This tool allows us to localize the time-varying spectral composition of the initial oscillations of the cantilever deflection when an impulsive excitation is given (as in the band excitation method), a mode that we call the few-cycle regime. We show that this regime encodes very meaningful information about the tip-sample interaction in a unique and extremely sensitive manner. We exploit this high sensitivity to gain detailed insight into multiple physical parameters that perturb the dynamics of the AFM probe, such as the tip radius, Hamaker constant, sample's elastic modulus and height of an adsorbed water layer. We validate these findings with experimental evidence and computational simulations and show a feasible path towards the simultaneous retrieval of multiple physical parameters.

Fast, quantitative and high resolution mapping of viscoelastic properties with bimodal AFM

Quantitative mapping of viscoelastic properties of soft matter with a nanoscale spatial resolution is an active and relevant research topic in atomic force microscopy (AFM) and nanoscale science characterization. The AFM has demonstrated its accuracy to measure the energy dissipated on a sample surface with an atomic-scale resolution. However, the transformation of energy dissipation values associated with viscoelastic interactions to a material property remains very challenging. A key issue is to establish the relationship between the AFM observables and some material properties such as viscosity coefficient or relaxation time. Another relevant issue is to determine the accuracy of the measurements. We demonstrate that bimodal atomic force microscopy enables the accurate measurement of several viscoelastic parameters such as the Young's modulus, viscosity coefficient, retardation time or loss tangent. The parameters mentioned above are measured at the same time that the true topography. We demonstrate that the loss tangent is proportional to the viscosity coefficient. We show that the mapping of viscoelastic properties neither degrades the spatial resolution nor the imaging speed of AFM. The results are presented for homogeneous polymer and block co-polymer samples with Young's modulus, viscosity and retardation times ranging from 100 MPa to 3 GPa, 10 to 400 Pa s and 50 to 400 ns, respectively. Numerical simulations validate the accuracy of bimodal AFM to determine the viscoelastic parameters.

Acquisition of time-frequency localized mechanical properties of biofilms and single cells with high spatial resolution

Biofilms are a cluster of bacteria embedded in extracellular polymeric substances (EPS) that contain a complex composition of polysaccharides, proteins, and extracellular DNA (eDNA). Desirable mechanical properties of the biofilms are critical for their survival, propagation, and dispersal, and the response of mechanical properties to different treatment conditions also sheds light on biofilm control and eradication in vivo and on engineering surfaces. However, it is challenging yet important to investigate mechanical behaviors of biofilms with a high spatial resolution because biofilms are very heterogeneous. Moreover, biofilms are viscoelastic, and their time-dependent mechanical behavior is difficult to capture. Herein, we develop a powerful technique that combines the high spatial resolution of an atomic force microscope (AFM) with a rigorous history-dependent viscoelastic analysis to deliver highly spatial-localized biofilm properties within a wide time-frequency window. By exploiting the use of static force spectroscopy in combination with an appropriate viscoelastic framework, we highlight the intensive amount of time-dependent information experimentally available that has been largely overlooked. It is shown that this technique provides a detailed nanorheological signature of the biofilms even at the single-cell level. We share the computational routines that would allow any user to perform the analysis from experimental raw data. The detailed localization of mechanical properties in space and in time-frequency domain provides insights into the understanding of biofilm stability, cohesiveness, dispersal, and control.

Wavelet analysis of higher harmonics in tapping mode atomic force microscopy

Higher harmonics have been widely used to characterize nanomechanical properties of the sample surface in tapping mode atomic force microscopy. They are usually analyzed by the Fourier transform method which provides time-averaged amplitude and phase information. In this paper, we apply the analytic wavelet transform to analyze higher harmonics. The intuitive descriptions of higher harmonics are obtained by the time-frequency analysis of the tip motion signal. The temporal evolutions of the higher harmonics are analyzed. The higher harmonics extracted by the analytic wavelet transform are closely related to the wavelet parameters. Different time and frequency features of higher harmonics can be analyzed through adjusting the wavelet parameters. Moreover, the root-mean-square amplitude and the peak amplitude obtained by the analytic wavelet transform can provide better characterization of sample properties than the amplitude obtained by the Fourier transform method.