Near-Field Scanning Microwave Microscopy in the Single Photon Regime

MilliKelvin microwave impedance microscopy in a dry dilution refrigerator

Microwave impedance microscopy (MIM) is a near-field imaging technique that has been used to visualize the local conductivity of materials with nanoscale resolution across the GHz regime. In recent years, MIM has shown great promise for the investigation of topological states of matter, correlated electronic states, and emergent phenomena in quantum materials. To explore these low-energy phenomena, many of which are only detectable in the milliKelvin regime, we have developed a novel low-temperature MIM incorporated into a dilution refrigerator. This setup, which consists of a tuning-fork-based atomic force microscope with microwave reflectometry capabilities, is capable of reaching temperatures down to 70 mK during imaging and magnetic fields up to 9 T. To test the performance of this microscope, we demonstrate microwave imaging of the conductivity contrast between graphite and silicon dioxide at cryogenic temperatures and discuss the resolution and noise observed in these results. We extend this methodology to visualize edge conduction in Dirac semi-metal cadmium arsenide in the quantum Hall regime.

Implementing microwave impedance microscopy in a dilution refrigerator

We report the implementation of a dilution refrigerator-based scanning microwave impedance microscope with a base temperature of ∼100 mK. The vibration noise of our apparatus with tuning-fork feedback control is as low as 1 nm. Using this setup, we have demonstrated the imaging of quantum anomalous Hall states in magnetically (Cr and V) doped (Bi, Sb)2Te3 thin films grown on mica substrates. Both the conductive edge modes and topological phase transitions near the coercive fields of Cr- and V-doped layers are visualized in the field-dependent results. Our study establishes the experimental platform for investigating nanoscale quantum phenomena at ultralow temperatures.

Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes

We present a new approach to tuning-fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 × 2 mm² drastically perturb the oscillation of the tuning fork, resulting in poor performance in its intrinsic force sensing. Therefore, restoring initial oscillatory characteristics is necessary for regaining high sensitivity. To this end, we developed a new approach consisting of three basic steps: tuning-fork rebalancing, revamping holder-sensor fixation, and electrode reconfiguration. Mass rebalancing allows the tuning fork to recover the frequency and regain high Q-factor values up to 10⁴ in air and up to 4 × 10⁴ in ultra-high vacuum conditions. The floating-like holder-fixation using soft wires significantly reduces energy dissipation from the mounting elements. Combined with the soft wires, reconfigured electrodes provide electrical access to the chip-like probe without intervening in the force-sensing signal. Finally, our easy-to-implement approach allows converting the atomic force microscopy tip from a passive tool to a dedicated microdevice with extended functionality.

High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope

The identification of the minerals composing rocks and their dielectric characterization is essential for the utilization of microwave energy in the rock industry. This paper describes the use of a near-field scanning microwave microscope with enhanced sensitivity for non-invasive measurements of permittivity maps of rock specimens at the micrometer scale in non-contact mode. The microwave system comprises a near-field probe, an in-house single-port vectorial reflectometer, and all circuitry and software needed to make a stand-alone, portable instrument. The relationship between the resonance parameters of the near-field probe and the dielectric properties of materials was determined by a combination of classical cavity perturbation theory and an image charge model. The accuracy of this approach was validated by a comparison study with reference materials. The device was employed to determine the permittivity maps of a couple of igneous rock specimens with low-loss and high-loss minerals. The dielectric results were correlated with the minerals comprising the samples and compared with the dielectric results reported in the literature, with excellent agreements.

An approach to determine solution properties in micro pipes by near-field microwave microscopy

In this article, we propose a quantitative, non-destructive and noninvasive approach to obtain electromagnetic properties of liquid specimens utilizing a home-designed near-field microwave microscopy. The responses of aqueous solutions can be acquired with varying concentrations, types (CaCl₂, MgCl₂, KCl and NaCl) and tip-sample distances. An electromagnetic simulation model also successfully predicts the behaviors of saline samples. For a certain type of solutions with varying concentrations, the results are concaves with different bottoms, and the symmetric graphs of concave extractions can clearly identify different specimens. Moreover, we obtain electromagnetic images of capillaries with various saline solutions, as well as a Photinia × fraseri Dress leaf.

Detection of Anti-Counterfeiting Markers through Permittivity Maps Using a Micrometer Scale near Field Scanning Microwave Microscope

This paper describes the use of microwave technology to identify anti-counterfeiting markers on banknotes. The proposed method is based on a robust near-field scanning microwave microscope specially developed to measure permittivity maps of heterogeneous paper specimens at the micrometer scale. The equipment has a built-in vector network analyzer to measure the reflection response of a near-field coaxial probe, which makes it a standalone and portable device. A new approach employing the information of a displacement laser and the cavity perturbation technique was used to determine the relationship between the dielectric properties of the specimens and the resonance response of the probe, avoiding the use of distance-following techniques. The accuracy of the dielectric measurements was evaluated through a comparative study with other well-established cavity methods, revealing uncertainties lower than 5%, very similar to the accuracy reported by other more sophisticated setups. The device was employed to determine the dielectric map of a watermark on a 20 EUR banknote. In addition, the penetration capabilities of microwave energy allowed for the detection of the watermark when concealed behind dielectric or metallic layers. This work demonstrates the benefits of this microwave technique as a novel method for identifying anti-counterfeiting features, which opens new perspectives with which to develop optically opaque markers only traceable through this microwave technique.

Two-level systems in superconducting quantum devices due to trapped quasiparticles

A major issue for the implementation of large-scale superconducting quantum circuits is the interaction with interfacial two-level system (TLS) defects that lead to qubit parameter fluctuations and relaxation. Another major challenge comes from nonequilibrium quasiparticles (QPs) that result in qubit relaxation and dephasing. Here, we reveal a previously unexplored decoherence mechanism in the form of a new type of TLS originating from trapped QPs, which can induce qubit relaxation. Using spectral, temporal, thermal, and magnetic field mapping of TLS-induced fluctuations in frequency tunable resonators, we identify a highly coherent subset of the general TLS population with a low reconfiguration temperature ∼300 mK and a nonuniform density of states. These properties can be understood if the TLS are formed by QPs trapped in shallow subgap states formed by spatial fluctutations of the superconducting order parameter. This implies that even very rare QP bursts will affect coherence over exponentially long time scales.