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Pospiskova K, Safarik I. Textile‐Bound Copper Silicate as a New Peroxidase‐Like Nanozyme for Organic Dye Decolorization. Chem Eng Technol 2022. [DOI: 10.1002/ceat.202000538] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
Affiliation(s)
- Kristyna Pospiskova
- Palacky University Regional Centre of Advanced Technologies and Materials Czech Advanced Technology and Research Institute Slechtitelu 27 783 71 Olomouc Czech Republic
- Biology Centre, ISB, CAS Department of Nanobiotechnology Na Sadkach 7 370 05 Ceske Budejovice Czech Republic
| | - Ivo Safarik
- Palacky University Regional Centre of Advanced Technologies and Materials Czech Advanced Technology and Research Institute Slechtitelu 27 783 71 Olomouc Czech Republic
- Biology Centre, ISB, CAS Department of Nanobiotechnology Na Sadkach 7 370 05 Ceske Budejovice Czech Republic
- Institute of Experimental Physics, SAS Department of Magnetism Watsonova 47 040 01 Kosice Slovakia
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Sreedharan R, Mohan M, Saini S, Roy A, Bhattacharjee K. Intermediate Cu-O-Si Phase in the Cu-SiO 2/Si(111) System: Growth, Elemental, and Electrical Studies. ACS OMEGA 2021; 6:23826-23836. [PMID: 34568662 PMCID: PMC8459365 DOI: 10.1021/acsomega.1c02646] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/20/2021] [Indexed: 06/13/2023]
Abstract
We investigate here the strain-induced growth of Cu at 600 °C and its interactions with a thermally grown, 270 nm-thick SiO2 layer on the Si(111) substrate. Our results show clear evidence of triangular voids and formation of triangular islands on the surface via a void-filling mechanism upon Cu deposition, even on a 270 nm-thick dielectric. Different coordination states, oxidation numbers, and chemical compositions of the Cu-grown film are estimated from the core level X-ray photoelectron spectroscopy (XPS) measurements. We find evidence of different compound phases including an intermediate mixed-state of Cu-O-Si at the interface. Emergence of a mixed Cu-O-Si intermediate state is attributed to the new chemical states of Cu x+, O x , and Si x+ observed in the high-resolution XPS spectra. This intermediate state, which is supposed to be highly catalytic, is found in the sample with a concentration as high as ∼41%. Within the Cu-O-Si phase, the atomic percentages of Cu, O, and Si are ∼1, ∼86, and ∼13%, respectively. The electrical measurements carried out on the sample reveal different resistive channels across the film and an overall n-type semiconducting nature with a sheet resistance of the order of 106 Ω.
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Affiliation(s)
- Reshmi Sreedharan
- Institute
of Physics, Sachivalaya Marg, Bhubaneswar, Odisha 751005, India
- Department
of Space, Indian Institute of Space Science
and Technology, Valiyamala, Thiruvananthapuram, Kerala 695 547, India
| | - Manu Mohan
- Department
of Space, Indian Institute of Space Science
and Technology, Valiyamala, Thiruvananthapuram, Kerala 695 547, India
| | - Sonia Saini
- Department
of Space, Indian Institute of Space Science
and Technology, Valiyamala, Thiruvananthapuram, Kerala 695 547, India
- Laboratory
for Electro-Optics Systems (LEOS), ISRO, First Cross, First Phase, Peenya, Bengaluru 560057, India
| | - Anupam Roy
- Microelectronics
Research Center, The University of Texas
at Austin, 10100 Burnet Road, Austin, Texas 787 758, United
States
| | - Kuntala Bhattacharjee
- Institute
of Physics, Sachivalaya Marg, Bhubaneswar, Odisha 751005, India
- Department
of Space, Indian Institute of Space Science
and Technology, Valiyamala, Thiruvananthapuram, Kerala 695 547, India
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Ag–Pd Alloy Immobilized on Semi-heterogeneous Support as a Novel Highly Efficient Artificial Nitroreductase: Experimental Design Optimization and Kinetic Study. Catal Letters 2020. [DOI: 10.1007/s10562-020-03418-2] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
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