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Błachucki W, Johnson PJM, Usov I, Divall E, Cirelli C, Knopp G, Juranić P, Patthey L, Szlachetko J, Lemke H, Milne C, Arrell C. Correlation of refractive index based and THz streaking arrival time tools for a hard X-ray free-electron laser. JOURNAL OF SYNCHROTRON RADIATION 2024; 31:233-242. [PMID: 38252522 PMCID: PMC10914176 DOI: 10.1107/s1600577523010500] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/03/2023] [Accepted: 12/07/2023] [Indexed: 01/24/2024]
Abstract
To fully exploit ultra-short X-ray pulse durations routinely available at X-ray free-electron lasers to follow out-of-equilibrium dynamics, inherent arrival time fluctuations of the X-ray pulse with an external perturbing laser pulse need to be measured. In this work, two methods of arrival time measurement were compared to measure the arrival time jitter of hard X-ray pulses. The methods were photoelectron streaking by a THz field and a transient refractive index change of a semiconductor. The methods were validated by shot-to-shot correction of a pump-probe transient reflectivity measurement. An ultimate shot-to-shot full width at half-maximum error between the devices of 19.2 ± 0.1 fs was measured.
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Affiliation(s)
- Wojciech Błachucki
- Institute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, Poland
| | | | - Ivan Usov
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Edwin Divall
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Claudio Cirelli
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Gregor Knopp
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Pavle Juranić
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Luc Patthey
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Jakub Szlachetko
- National Synchrotron Radiation Centre Solaris, Jagiellonian University, 30-387 Kraków, Poland
| | - Henrik Lemke
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
| | - Christopher Milne
- SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland
- European XFEL GmbH, 22869 Schenefeld, Germany
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Diez M, Kirchberg H, Galler A, Schulz S, Biednov M, Bömer C, Choi TK, Rodriguez-Fernandez A, Gawelda W, Khakhulin D, Kubicek K, Lima F, Otte F, Zalden P, Coffee R, Thorwart M, Bressler C. A sensitive high repetition rate arrival time monitor for X-ray free electron lasers. Nat Commun 2023; 14:2495. [PMID: 37120432 PMCID: PMC10148857 DOI: 10.1038/s41467-023-38143-y] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/20/2022] [Accepted: 04/17/2023] [Indexed: 05/01/2023] Open
Abstract
X-ray free-electron laser sources enable time-resolved X-ray studies with unmatched temporal resolution. To fully exploit ultrashort X-ray pulses, timing tools are essential. However, new high repetition rate X-ray facilities present challenges for currently used timing tool schemes. Here we address this issue by demonstrating a sensitive timing tool scheme to enhance experimental time resolution in pump-probe experiments at very high pulse repetition rates. Our method employs a self-referenced detection scheme using a time-sheared chirped optical pulse traversing an X-ray stimulated diamond plate. By formulating an effective medium theory, we confirm subtle refractive index changes, induced by sub-milli-Joule intense X-ray pulses, that are measured in our experiment. The system utilizes a Common-Path-Interferometer to detect X-ray-induced phase shifts of the optical probe pulse transmitted through the diamond sample. Owing to the thermal stability of diamond, our approach is well-suited for MHz pulse repetition rates in superconducting linear accelerator-based free-electron lasers.
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Affiliation(s)
- Michael Diez
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.
- The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.
| | - Henning Kirchberg
- I. Institut für Theoretische Physik, Universität Hamburg, Notkestr. 9, 22607, Hamburg, Germany
- Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania, 19104, USA
| | - Andreas Galler
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.
| | - Sebastian Schulz
- Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607, Hamburg, Germany
| | - Mykola Biednov
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
| | - Christina Bömer
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
- Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607, Hamburg, Germany
| | - Tae-Kyu Choi
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
- XFEL division, Pohang Accelerator Laboratory, Jigok-ro 127-80, 37673, Pohang, Republic of Korea
| | | | - Wojciech Gawelda
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
- Faculty of Physics, Adam Mickiewicz University, ul. Uniwersytetu Poznańskiego 2, 61-614, Poznań, Poland
- Department of Chemistry, Faculty of Sciences, Universidad Autónoma de Madrid, 28049, Madrid, Spain
- IMDEA-Nanociencia, Calle Faraday 9, 28049, Madrid, Spain
| | | | - Katharina Kubicek
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
- The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany
- Fachbereich Physik, Universität Hamburg, Notkestraße 9-11, 22607, Hamburg, Germany
| | - Frederico Lima
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
| | - Florian Otte
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
| | - Peter Zalden
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany
| | - Ryan Coffee
- SLAC National Accelerator Laboratory, 2575 Sand Hill Rd., Menlo Park, CA, 94025, USA
- The Pulse Institute, SLAC National Accelerator Laboratory, Menlo Park, CA, 94028, USA
| | - Michael Thorwart
- The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany
- I. Institut für Theoretische Physik, Universität Hamburg, Notkestr. 9, 22607, Hamburg, Germany
| | - Christian Bressler
- European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany.
- The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761, Hamburg, Germany.
- Fachbereich Physik, Universität Hamburg, Notkestraße 9-11, 22607, Hamburg, Germany.
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Artificial intelligence for online characterization of ultrashort X-ray free-electron laser pulses. Sci Rep 2022; 12:17809. [PMID: 36280680 PMCID: PMC9592592 DOI: 10.1038/s41598-022-21646-x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/13/2022] [Accepted: 09/28/2022] [Indexed: 11/24/2022] Open
Abstract
X-ray free-electron lasers (XFELs) as the world’s brightest light sources provide ultrashort X-ray pulses with a duration typically in the order of femtoseconds. Recently, they have approached and entered the attosecond regime, which holds new promises for single-molecule imaging and studying nonlinear and ultrafast phenomena such as localized electron dynamics. The technological evolution of XFELs toward well-controllable light sources for precise metrology of ultrafast processes has been, however, hampered by the diagnostic capabilities for characterizing X-ray pulses at the attosecond frontier. In this regard, the spectroscopic technique of photoelectron angular streaking has successfully proven how to non-destructively retrieve the exact time–energy structure of XFEL pulses on a single-shot basis. By using artificial intelligence techniques, in particular convolutional neural networks, we here show how this technique can be leveraged from its proof-of-principle stage toward routine diagnostics even at high-repetition-rate XFELs, thus enhancing and refining their scientific accessibility in all related disciplines.
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Chen M, de Oliveira TVAG, Ilyakov I, Nörenberg T, Kuschewski F, Deinert JC, Awari N, Ponomaryov A, Kuntzsch M, Kehr SC, Eng LM, Gensch M, Kovalev S. Terahertz-slicing - an all-optical synchronization for 4 th generation light sources. OPTICS EXPRESS 2022; 30:26955-26966. [PMID: 36236877 DOI: 10.1364/oe.454908] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/03/2022] [Accepted: 06/01/2022] [Indexed: 06/16/2023]
Abstract
A conceptually new approach to synchronizing accelerator-based light sources and external laser systems is presented. The concept is based on utilizing a sufficiently intense accelerator-based single-cycle terahertz pulse to slice a thereby intrinsically synchronized femtosecond-level part of a longer picosecond laser pulse in an electro-optic crystal. A precise synchronization of the order of 10 fs is demonstrated, allowing for real-time lock-in amplifier signal demodulation. We demonstrate successful operation of the concept with three benchmark experiments using a 4th generation accelerator-based terahertz light source, i.e. (i) far-field terahertz time-domain spectroscopy, (ii) terahertz high harmonic generation spectroscopy, and (iii) terahertz scattering-type scanning near-field optical microscopy.
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