Quinto-Su PA. Interferometric measurement of arbitrary propagating vector beams that are tightly focused.
OPTICS LETTERS 2023;
48:3693-3696. [PMID:
37450727 DOI:
10.1364/ol.492980]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/12/2023] [Accepted: 06/12/2023] [Indexed: 07/18/2023]
Abstract
In this work, we demonstrate a simple setup to generate and measure arbitrary vector beams that are tightly focused. The vector beams are created with a spatial light modulator and focused with a microscope objective with an effective numerical aperture of 1.2. The transverse polarization components (Ex, Ey) of the tightly focused vector beams are measured with three-step interferometry. The axial component Ez is reconstructed using the transverse fields with Gauss's law. We measure beams with the following polarization states: circular, radial, azimuthal, spiral, flower, and spider web.
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