Spectral X-ray dark-field signal characterization from dual-energy projection phase-stepping data with a Talbot-Lau interferometer

Energy resolving dark-field imaging with dual phase grating interferometer

X-ray dark-filed imaging is a powerful approach to quantify the dimension of micro-structures of the object. Often, a series of dark-filed signals have to be measured under various correlation lengths. For instance, this is often achieved by adjusting the sample positions by multiple times in Talbot-Lau interferometer. Moreover, such multiple measurements can also be collected via adjustments of the inter-space between the phase gratings in dual phase grating interferometer. In this study, the energy resolving capability of the dual phase grating interferometer is explored with the aim to accelerate the data acquisition speed of dark-filed imaging. To do so, both theoretical analyses and numerical simulations are investigated. Specifically, the responses of the dual phase grating interferometer at varied X-ray beam energies are studied. Compared with the mechanical position translation approach, the combination of such energy resolving capability helps to greatly shorten the total dark-field imaging time in dual phase grating interferometer.