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For: Engelund M, Zuzak R, Godlewski S, Kolmer M, Frederiksen T, García-Lekue A, Sánchez-Portal D, Szymonski M. Tunneling spectroscopy of close-spaced dangling-bond pairs in Si(001):H. Sci Rep 2015;5:14496. [PMID: 26404520 PMCID: PMC4585918 DOI: 10.1038/srep14496] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/14/2015] [Accepted: 09/01/2015] [Indexed: 11/12/2022]  Open
Number Cited by Other Article(s)
1
Pitters J, Croshaw J, Achal R, Livadaru L, Ng S, Lupoiu R, Chutora T, Huff T, Walus K, Wolkow RA. Atomically Precise Manufacturing of Silicon Electronics. ACS NANO 2024;18:6766-6816. [PMID: 38376086 PMCID: PMC10919096 DOI: 10.1021/acsnano.3c10412] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/23/2023] [Revised: 02/01/2024] [Accepted: 02/06/2024] [Indexed: 02/21/2024]
2
Liu XR, Deng H, Liu Y, Yin Z, Chen C, Zhu YP, Yang Y, Jiang Z, Liu Z, Ye M, Shen D, Yin JX, Wang K, Liu Q, Zhao Y, Liu C. Spectroscopic signature of obstructed surface states in SrIn2P2. Nat Commun 2023;14:2905. [PMID: 37217499 DOI: 10.1038/s41467-023-38589-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/15/2022] [Accepted: 05/09/2023] [Indexed: 05/24/2023]  Open
3
Shaterzadeh-Yazdi Z, Sanders BC, DiLabio GA. Ab initio characterization of coupling strength for all types of dangling-bond pairs on the hydrogen-terminated Si(100)-2 × 1 surface. J Chem Phys 2018;148:154701. [PMID: 29679977 DOI: 10.1063/1.5020873] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
4
Godlewski S, Engelund M, Peña D, Zuzak R, Kawai H, Kolmer M, Caeiro J, Guitián E, Vollhardt KPC, Sánchez-Portal D, Szymonski M, Pérez D. Site-selective reversible Diels–Alder reaction between a biphenylene-based polyarene and a semiconductor surface. Phys Chem Chem Phys 2018;20:11037-11046. [DOI: 10.1039/c8cp01094c] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
5
Engelund M, Godlewski S, Kolmer M, Zuzak R, Such B, Frederiksen T, Szymonski M, Sánchez-Portal D. The butterfly - a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations. Phys Chem Chem Phys 2016;18:19309-17. [PMID: 27375264 DOI: 10.1039/c6cp04031d] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/15/2022]
6
Dual role of CO in the stability of subnano Pt clusters at the Fe3O4(001) surface. Proc Natl Acad Sci U S A 2016;113:8921-6. [PMID: 27457953 DOI: 10.1073/pnas.1605649113] [Citation(s) in RCA: 86] [Impact Index Per Article: 10.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]  Open
7
Kislitsyn DA, Mills JM, Kocevski V, Chiu SK, DeBenedetti WJI, Gervasi CF, Taber BN, Rosenfield AE, Eriksson O, Rusz J, Goforth AM, Nazin GV. Communication: Visualization and spectroscopy of defects induced by dehydrogenation in individual silicon nanocrystals. J Chem Phys 2016;144:241102. [DOI: 10.1063/1.4954833] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
8
Ren XY, Kim HJ, Niu CY, Jia Y, Cho JH. Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy. Sci Rep 2016;6:27868. [PMID: 27292000 PMCID: PMC4904415 DOI: 10.1038/srep27868] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/17/2016] [Accepted: 05/26/2016] [Indexed: 11/09/2022]  Open
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