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De A, Mohammad H, Wang Y, Kubendran R, Das AK, Anantram MP. Performance analysis of DNA crossbar arrays for high-density memory storage applications. Sci Rep 2023; 13:6650. [PMID: 37095117 PMCID: PMC10126128 DOI: 10.1038/s41598-023-33004-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/04/2023] [Accepted: 04/05/2023] [Indexed: 04/26/2023] Open
Abstract
Deoxyribonucleic acid (DNA) has emerged as a promising building block for next-generation ultra-high density storage devices. Although DNA has high durability and extremely high density in nature, its potential as the basis of storage devices is currently hindered by limitations such as expensive and complex fabrication processes and time-consuming read-write operations. In this article, we propose the use of a DNA crossbar array architecture for an electrically readable read-only memory (DNA-ROM). While information can be 'written' error-free to a DNA-ROM array using appropriate sequence encodings its read accuracy can be affected by several factors such as array size, interconnect resistance, and Fermi energy deviations from HOMO levels of DNA strands employed in the crossbar. We study the impact of array size and interconnect resistance on the bit error rate of a DNA-ROM array through extensive Monte Carlo simulations. We have also analyzed the performance of our proposed DNA crossbar array for an image storage application, as a function of array size and interconnect resistance. While we expect that future advances in bioengineering and materials science will address some of the fabrication challenges associated with DNA crossbar arrays, we believe that the comprehensive body of results we present in this paper establishes the technical viability of DNA crossbar arrays as low power, high-density storage devices. Finally, our analysis of array performance vis-à-vis interconnect resistance should provide valuable insights into aspects of the fabrication process such as proper choice of interconnects necessary for ensuring high read accuracies.
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Affiliation(s)
- Arpan De
- Department of Electrical and Computer Engineering, University of Washington, Seattle, WA, 98195, USA
| | - Hashem Mohammad
- Department of Electrical and Computer Engineering, University of Washington, Seattle, WA, 98195, USA
- Department of Electrical Engineering, Kuwait University, P.O. Box 5969, 13060, Safat, Kuwait
| | - Yiren Wang
- Department of Electrical and Computer Engineering, University of Washington, Seattle, WA, 98195, USA
| | - Rajkumar Kubendran
- Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, 15261, USA
| | - Arindam K Das
- Department of Computer Science and Electrical Engineering, Eastern Washington University, Cheney, WA, 99004, USA
| | - M P Anantram
- Department of Electrical and Computer Engineering, University of Washington, Seattle, WA, 98195, USA.
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Wijesinghe P, Ankit A, Sengupta A, Roy K. An All-Memristor Deep Spiking Neural Computing System: A Step Toward Realizing the Low-Power Stochastic Brain. IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTATIONAL INTELLIGENCE 2018. [DOI: 10.1109/tetci.2018.2829924] [Citation(s) in RCA: 52] [Impact Index Per Article: 8.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Zidan MA, Jeong Y, Shin JH, Du C, Zhang Z, Lu WD. Field-Programmable Crossbar Array (FPCA) for Reconfigurable Computing. ACTA ACUST UNITED AC 2018. [DOI: 10.1109/tmscs.2017.2721160] [Citation(s) in RCA: 25] [Impact Index Per Article: 4.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Bae W, Yoon KJ, Hwang CS, Jeong DK. A crossbar resistance switching memory readout scheme with sneak current cancellation based on a two-port current-mode sensing. NANOTECHNOLOGY 2016; 27:485201. [PMID: 27796274 DOI: 10.1088/0957-4484/27/48/485201] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
This paper describes a novel readout scheme that enables the complete cancellation of sneak currents in resistive switching random-access memory (RRAM) crossbar array. The current-mode readout is employed in the proposed readout, and a few critical advantages of the current-mode readout for crossbar RRAM are elucidated in this paper. The proposed scheme is based on a floating readout scheme for low power consumption, and one more sensing port is introduced using an additional reference word line. From the additional port, information on the sneak current amount is collected, and simple current-mode arithmetic operations are implemented to cancel out the sneak current from the sensing current. In addition, a simple method of handling the overestimated-sneak-current issue is described. The proposed scheme is verified using HSPICE simulation. Moreover, an example of a current-mode sense amplifier realizing the proposed cancelling technique is presented. The proposed sense amplifier can be implemented with less hardware overhead compared to the previous works.
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Affiliation(s)
- Woorham Bae
- Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center, Seoul National University, Seoul, Korea
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Gu L, Tavakoli MM, Zhang D, Zhang Q, Waleed A, Xiao Y, Tsui KH, Lin Y, Liao L, Wang J, Fan Z. 3D Arrays of 1024-Pixel Image Sensors based on Lead Halide Perovskite Nanowires. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2016; 28:9713-9721. [PMID: 27647134 DOI: 10.1002/adma.201601603] [Citation(s) in RCA: 90] [Impact Index Per Article: 11.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/23/2016] [Revised: 07/17/2016] [Indexed: 05/21/2023]
Abstract
Large-scale and highly ordered 3D perov-skite nanowire (NW) arrays are achieved in nanoengineering templates by a unique vapor-solid-solid reaction process. The excellent material properties, in conjunction with the high integration density of the NW arrays, make them promising for 3D integrated nanoelectronics/optoelectronics. Image sensors with 1024 pixels are assembled and characterized to demonstrate the technological potency.
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Affiliation(s)
- Leilei Gu
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Mohammad Mahdi Tavakoli
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Daquan Zhang
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Qianpeng Zhang
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Aashir Waleed
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Yiqun Xiao
- Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Kwong-Hoi Tsui
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Yuanjing Lin
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Lei Liao
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-Structures of Ministry of Education, Wuhan University, Wuhan, 430072, China
| | - Jiannong Wang
- Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
| | - Zhiyong Fan
- Department of Electronic and Computer Engineering, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong SAR, China
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