• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4635019)   Today's Articles (6944)   Subscriber (50004)
For: De Caro L, Altamura D, Arciniegas M, Siliqi D, Kim MR, Sibillano T, Manna L, Giannini C. Ptychographic Imaging of Branched Colloidal Nanocrystals Embedded in Free-Standing Thick Polystyrene Films. Sci Rep 2016;6:19397. [PMID: 26775682 PMCID: PMC4726119 DOI: 10.1038/srep19397] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/13/2015] [Accepted: 12/07/2015] [Indexed: 12/30/2022]  Open
Number Cited by Other Article(s)
1
Yamada K, Akaishi N, Yatabe K, Takayama Y. Ptychographic phase retrieval via a deep-learning-assisted iterative algorithm. J Appl Crystallogr 2024;57:1323-1335. [PMID: 39387085 PMCID: PMC11460392 DOI: 10.1107/s1600576724006897] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/14/2024] [Accepted: 07/13/2024] [Indexed: 10/12/2024]  Open
2
De Caro L, Scattarella F, Altamura D, Arciniegas MP, Siliqi D, Manna L, Giannini C. X-ray ptychographic mode of self-assembled CdSe/CdS octapod-shaped nanocrystals in thick polymers. J Appl Crystallogr 2020;53:741-747. [PMID: 32684889 PMCID: PMC7312151 DOI: 10.1107/s160057672000583x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/11/2020] [Accepted: 04/27/2020] [Indexed: 11/10/2022]  Open
3
Arciniegas MP, Castelli A, Ceseracciu L, Bianchini P, Marras S, Brescia R, Manna L. Assembly of Branched Colloidal Nanocrystals in Polymer Films Leads to Enhanced Viscous Deformation Resistance. NANO LETTERS 2016;16:6154-6163. [PMID: 27602602 DOI: 10.1021/acs.nanolett.6b02371] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
4
X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials. CRYSTALS 2016. [DOI: 10.3390/cryst6080087] [Citation(s) in RCA: 28] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/18/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA