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For: Ren XY, Kim HJ, Niu CY, Jia Y, Cho JH. Origin of Symmetric Dimer Images of Si(001) Observed by Low-Temperature Scanning Tunneling Microscopy. Sci Rep 2016;6:27868. [PMID: 27292000 PMCID: PMC4904415 DOI: 10.1038/srep27868] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/17/2016] [Accepted: 05/26/2016] [Indexed: 11/09/2022]  Open
Number Cited by Other Article(s)
1
Croshaw J, Huff T, Rashidi M, Wood J, Lloyd E, Pitters J, Wolkow RA. Ionic charge distributions in silicon atomic surface wires. NANOSCALE 2021;13:3237-3245. [PMID: 33533379 DOI: 10.1039/d0nr08295c] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
2
Chiu SP, Yeh SS, Chiou CJ, Chou YC, Lin JJ, Tsuei CC. Ultralow 1/f Noise in a Heterostructure of Superconducting Epitaxial Cobalt Disilicide Thin Film on Silicon. ACS NANO 2017;11:516-525. [PMID: 28027434 DOI: 10.1021/acsnano.6b06553] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
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