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Zhu K, Ge G, Yan F, Lin J, Bai H, Li G, Jiang H, Shen B, Zhai J, Chou X. Morphotropic Relaxor Boundary Construction Highly Boosts the Piezoelectric Properties of Bi-Based Lead-Free Thin Films. ACS APPLIED MATERIALS & INTERFACES 2022; 14:8115-8125. [PMID: 35119814 DOI: 10.1021/acsami.1c18936] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
To achieve large electrostrain and low hysteresis, we further optimized a morphotropic phase boundary (MPB) by modulating its local polar symmetries. The construction of a morphotropic relaxor boundary (MRB) in thin films can be achieved by suitable introduction of Bi(Fe0.95Mn0.03Ti0.02)O3 into (Bi0.5Na0.5)TiO3-SrTiO3 to form a solid solution. The designed thin film achieves surprising piezoelectric properties with an inverse piezoelectric coefficient of 179.7 pm V-1 and negligible hysteresis. The composition of two relaxors with different local polar symmetries (tetragonal nanoregions and rhombohedral nanoregions), namely, an MRB, and the coexistence of multiscale domain structures can greatly weaken the anisotropy of polarization, degrade the energy barrier, attenuate the discontinuity of polarization, and achieve a large electrostrain and low hysteresis. The domain dynamics of the PNRs under the action of an external excitation field are analyzed to clarify the enhancement mechanism. This construction of MRBs is feasible for producing lead-free piezoelectric films with high-voltage electrical properties and low hysteresis, and various experimental design and theoretical references are provided.
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Affiliation(s)
- Kun Zhu
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Guanglong Ge
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Fei Yan
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Jinfeng Lin
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Hairui Bai
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Guohui Li
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Haitao Jiang
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
| | - Bo Shen
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Jiwei Zhai
- Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai 201804, China
| | - Xiujian Chou
- Key Laboratory of Instrumentation and Dynamic Measurement of Ministry of Education, North University of China, Taiyuan 030051, China
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Lee HY, Luo J, Zhou Z, Sun W, Li JF. Macroscopic and local approaches of phase transition in sol-gel synthesized (Bi 0.5Na 0.5)TiO 3-SrTiO 3 thin films. Phys Chem Chem Phys 2018; 20:15236-15243. [PMID: 29789846 DOI: 10.1039/c8cp01830h] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
High-quality (1 - x)(Bi0.5Na0.5)TiO3-xSrTiO3 lead-free piezoelectric thin films (x = 0, 0.1, and 0.25) on Pt(111)/Ti/SiO2/Si(100) substrates were prepared by a sol-gel method. The microstructures of the thin films as a function of SrTiO3 doping level and temperature were investigated by X-ray diffraction and Raman spectroscopy. Their temperature- and frequency-dependent piezoelectric properties were studied on the nanoscale using switching spectroscopy piezoresponse force microscopy (SS-PFM). A rhombohedral ferroelectric to pseudocubic relaxor phase transition was observed when either ST content or temperature increased. The significant frequency dependence of both ferroelectric and piezoelectric properties was also disclosed by analyzing polarization hysteresis loops on the macroscopic scale and local switching dynamics at various frequencies. It was determined that the short-range order clusters came out through the long-range ferroelectric order, thus the nanoscale approaches are consistent with macroscopic data at elevated temperatures and various frequency ranges.
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Affiliation(s)
- Hyun-Young Lee
- State Key Laboratory of New Ceramics and Fine Processing, School of Materials, Science and Engineering, Tsinghua University, 100084 Beijing, P. R. China.
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