Universal sensitivity of speckle intensity correlations to wavefront change in light diffusers

Soft X-ray wavefront sensing at an ellipsoidal mirror shell

A reliable `in situ' method for wavefront sensing in the soft X-ray domain is reported, developed for the characterization of rotationally symmetric optical elements, like an ellipsoidal mirror shell. In a laboratory setup, the mirror sample is irradiated by an electron-excited (4.4 keV), micrometre-sized (∼2 µm) fluorescence source (carbon Kα, 277 eV). Substantially, the three-dimensional intensity distribution I(r) is recorded by a CCD camera (2048 × 512 pixels of 13.5 µm) at two positions along the optical axis, symmetrically displaced by ±21-25% from the focus. The transport-of-intensity equation is interpreted in a geometrical sense from plane to plane and implemented as a ray tracing code, to retrieve the phase Φ(r) from the radial intensity gradient on a sub-pixel scale. For reasons of statistical reliability, five intra-/extra-focal CCD image pairs are evaluated and averaged to an annular two-dimensional map of the wavefront error {\cal W}. In units of the test wavelength (C Kα), an r.m.s. value \sigma_{\cal{W}} = ±10.9λ0 and a peak-to-valley amplitude of ±31.3λ0 are obtained. By means of the wavefront, the focus is first reconstructed with a result for its diameter of 38.4 µm, close to the direct experimental observation of 39.4 µm (FWHM). Secondly, figure and slope errors of the ellipsoid are characterized with an average of ±1.14 µm and ±8.8 arcsec (r.m.s.), respectively, the latter in reasonable agreement with the measured focal intensity distribution. The findings enable, amongst others, the precise alignment of axisymmetric X-ray mirrors or the design of a wavefront corrector for high-resolution X-ray science.

Intensity correlation scan (IC-scan) technique to characterize the optical nonlinearities of scattering media

Light scattering, whether caused by desired or spurious elements, is considered one of the main phenomena that present great challenges for the nonlinear (NL) optical characterization of turbid media. The most relevant disturbing factor is the random deformation suffered by the spatial intensity distribution of the laser beam due to multiple scattering. In this work, we report the intensity correlation scan (IC-scan) technique as a new tool to characterize the NL optical response of scattering media, by taking advantage of light scattering to generate speckle patterns sensitive to wavefront changes induced by the self-focusing and self-defocusing effects. Peak-to-valley transmittance curves, with a higher signal-to-noise ratio, are obtained by analyzing the spatial intensity correlation functions of the different speckle patterns, even in very turbid media where conventional NL spectroscopy techniques fail. To demonstrate the potential of the IC-scan technique, the NL characterization of colloids that contain a high concentration of silica nanospheres as scatterers, as well as gold nanorods, which act as NL particles and light scatterers, was performed. The results show that the IC-scan technique is more accurate, precise and robust to measure NL refractive indices in turbid media, overcoming limitations imposed by well-established Z-scan and D4σ techniques.

Disordered Optics: Exploiting Multiple Light Scattering and Wavefront Shaping for Nonconventional Optical Elements

Advances in diverse areas such as inspection, imaging, manufacturing, telecommunications, and information processing have been stimulated by novel optical devices. Conventional material ingredients for these devices are typically made of homogeneous refractive or diffractive materials and require sophisticated design and fabrication, which results in practical limitations related to their form and functional figures of merit. To overcome such limitations, recent developments in the application of disordered materials as novel optical elements have indicated great potential in enabling functionalities that go beyond their conventional counterparts, while the materials exhibit potential advantages with respect to reduced form factors. Combined with wavefront shaping, disordered materials enable dynamic transitions between multiple functionalities in a single active optical device. Recent progress in this field is summarized to gain insight into the physical principles behind disordered optics with regard to their advantages in various applications as well as their limitations compared to conventional optics.