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Gai PL, Boyes ED. Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy. Microsc Res Tech 2009;72:153-64. [DOI: 10.1002/jemt.20668] [Citation(s) in RCA: 106] [Impact Index Per Article: 7.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
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