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Smari M, Hamdi R, Prado-Gonjal J, Cortés-Gil R, Dhahri E, Mompean F, García-Hernández M, Schmidt R. Magnetoimpedance spectroscopy of phase-separated La 0.5Ca 0.5MnO 3 polycrystalline manganites. Phys Chem Chem Phys 2020; 22:11625-11636. [PMID: 32405632 DOI: 10.1039/d0cp00794c] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Magnetoimpedance spectroscopy was carried out on phase-separated La0.5Ca0.5MnO3 polycrystalline manganites. The La0.5Ca0.5MnO3 powder was synthesized following an adapted sol-gel route. Structural and magnetic data showed the signs of phase coexistence of ferromagnetic (FM) Pnma and charge-ordered antiferromagnetic (CO-AFM) P21/m phases. Magnetization vs. temperature (M vs. T) measurements revealed several magnetic transitions from the high temperature paramagnetic (PM) to an FM phase upon cooling (PM-FM) at ≈240 K, FM-AFM (≈170 K) and AFM-FM (≈100 K). Magnetic field (H)-dependent impedance spectroscopy data were collected from sintered pellets and fitted with an equivalent circuit model to separately analyze the different dielectric contributions from the grain boundary (GB) and the grain interior bulk areas. This allowed separating the GB and bulk magnetoresistance (MR), which was shown to amount to a maximum of ≈80% for both GB and bulk at H = 10 T near the metal-insulator transition (MIT) at ≈100 K. The GB resistance was found to be larger than the bulk resistance by a factor of ≈3, which implies that the direct current (DC) resistance and DC MR are dominated by contributions from the GBs. The magnetocapacitance (MC) effects detected were all found to be small below ≈3%, including in the presence of a CO phase.
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Affiliation(s)
- Mourad Smari
- CICECO, Aveiro Institute of Materials, Department of Materials and Ceramic Engineering, University of Aveiro, 3810-193 Aveiro, Portugal.
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Gao S, Liu G, Yang H, Hu C, Chen Q, Gong G, Xue W, Yi X, Shang J, Li RW. An Oxide Schottky Junction Artificial Optoelectronic Synapse. ACS NANO 2019; 13:2634-2642. [PMID: 30730696 DOI: 10.1021/acsnano.9b00340] [Citation(s) in RCA: 88] [Impact Index Per Article: 17.6] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
The rapid development of artificial intelligence techniques and future advanced robot systems sparks emergent demand on the accurate perception and understanding of the external environments via visual sensing systems that can co-locate the self-adaptive detecting, processing, and memorizing of optical signals. In this contribution, a simple indium-tin oxide/Nb-doped SrTiO3 (ITO/Nb:SrTiO3) heterojunction artificial optoelectronic synapse is proposed and demonstrated. Through the light and electric field co-modulation of the Schottky barrier profile at the ITO/Nb:SrTiO3 interface, the oxide heterojunction device can respond to the entire visible light region in a neuromorphic manner, allowing synaptic paired-pulse facilitation, short/long-term memory, and "learning-experience" behavior for optical information manipulation. More importantly, the photoplasticity of the artificial synapse has been modulated by heterosynaptic means with a sub-1 V external voltage, not only enabling an optoelectronic analog of the mechanical aperture device showing adaptive and stable optical perception capability under different illuminating conditions but also making the artificial synapse suitable for the mimicry of interest-modulated human visual memories.
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Affiliation(s)
- Shuang Gao
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Gang Liu
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Huali Yang
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Chao Hu
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Qilai Chen
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Guodong Gong
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Wuhong Xue
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Xiaohui Yi
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Jie Shang
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
| | - Run-Wei Li
- CAS Key Laboratory of Magnetic Materials and Devices , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology , Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences , Ningbo , Zhejiang 315201 , China
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Ge S, Wang Y, Xiang Z, Cui Y. Reset Voltage-Dependent Multilevel Resistive Switching Behavior in CsPb 1- xBi xI 3 Perovskite-Based Memory Device. ACS APPLIED MATERIALS & INTERFACES 2018; 10:24620-24626. [PMID: 29969009 DOI: 10.1021/acsami.8b07079] [Citation(s) in RCA: 25] [Impact Index Per Article: 4.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/18/2023]
Abstract
All-inorganic CsPb1- xBi xI3 perovskite film was successfully fabricated by incorporating Bi3+ in CsPbI3 to stabilize the cubic lattice. Furthermore, the perovskite film was applied to manufacture a simple Ag/CsPb1- xBi xI3/indium tin oxide (ITO) memory device with a bipolar resistive switching behavior. Nonvolatile, reliable, and reproducible switching properties are demonstrated through retention and endurance test under fully open-air conditions. The memory device also presents highly uniform and long-term stable characteristics. Importantly, by modulating the reset stop voltages, multilevel high-resistance states are observed for the first time in lead halide perovskite memory device. The resistive switching behavior is proposed to explain the formation and partial rupture of conductive multifilament that are dominated by the migration of iodine ions and their corresponding vacancies in perovskite film. This study suggests Ag/CsPb1- xBi xI3/ITO device potential application for multilevel data storage in a nonvolatile memory device.
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Affiliation(s)
- Shuaipeng Ge
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics, Ministry of Education, Department of Physics , Beihang University , Beijing 100191 , China
| | - Yuhang Wang
- State Key Laboratory of Low-Dimensional Quantum Physics, Collaborative Innovation Center of Quantum Matter, Department of Physics , Tsinghua University , Beijing 100084 , China
| | - Zhongcheng Xiang
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics, Ministry of Education, Department of Physics , Beihang University , Beijing 100191 , China
| | - Yimin Cui
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics, Ministry of Education, Department of Physics , Beihang University , Beijing 100191 , China
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Chen Y, Cui Y, Yao JE. Dielectric characteristics of Fe-doped LaTiO 3+δ and visible light modulation. RSC Adv 2016. [DOI: 10.1039/c6ra22168h] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
Fe-doped La1−xFexTiO3+δ (x = 0.05, 0.1, and 0.3, 0.4) ceramic samples were prepared via traditional solid-state reaction route, in which the dielectric properties of visible light modulation were found at room temperature in the measured frequency range.
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Affiliation(s)
- Yan Chen
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics
- Ministry of Education
- Beihang University
- Beijing 100191
- China
| | - Yimin Cui
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics
- Ministry of Education
- Beihang University
- Beijing 100191
- China
| | - Jun-en Yao
- Key Laboratory of Micro-Nano Measurement-Manipulation and Physics
- Ministry of Education
- Beihang University
- Beijing 100191
- China
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Lim DH, Kim GY, Song JH, Jeong KS, Kim DC, Nam SW, Cho MH, Lee TG. Electric field effect dominated bipolar resistive switching through interface control in a Pt/TiO2/TiN structure. RSC Adv 2015. [DOI: 10.1039/c4ra09443c] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
The field-enhanced effect due to the oxygen vacancy distribution improves the memory performance in the TiO2-based RRAM device.
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Affiliation(s)
- Dong-Hyeok Lim
- Institute of Physics and Applied Physics
- Yonsei University
- Seoul 120-749
- Korea
| | - Ga-Yeon Kim
- Institute of Physics and Applied Physics
- Yonsei University
- Seoul 120-749
- Korea
| | - Jin-Ho Song
- Institute of Physics and Applied Physics
- Yonsei University
- Seoul 120-749
- Korea
| | - Kwang-Sik Jeong
- Institute of Physics and Applied Physics
- Yonsei University
- Seoul 120-749
- Korea
| | - Dong-Chan Kim
- Process Development Team
- Semiconductor R&D Division, Samsung
- Suwon 445-701
- Korea
| | - Seok-Woo Nam
- Process Development Team
- Semiconductor R&D Division, Samsung
- Suwon 445-701
- Korea
| | - Mann-Ho Cho
- Institute of Physics and Applied Physics
- Yonsei University
- Seoul 120-749
- Korea
| | - Tae-Geol Lee
- Korea Research Institute of Standards and Science
- Daejeon 305-340
- Korea
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