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Zeng Q, Huang Q, Wang H, Li C, Fan Z, Chen D, Cheng Y, Zeng K. Breaking the Fundamental Limitations of Nanoscale Ferroelectric Characterization: Non-Contact Heterodyne Electrostrain Force Microscopy. SMALL METHODS 2021; 5:e2100639. [PMID: 34927968 DOI: 10.1002/smtd.202100639] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2021] [Revised: 09/09/2021] [Indexed: 06/14/2023]
Abstract
Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse Force Microscopy (PFM) invented in 1992, however, the fundamental limitations of PFM have made the nanoscale ferroelectric studies encounter significant bottlenecks. In this study, a high-resolution non-contact ferroelectric measurement, named Non-Contact Heterodyne Electrostrain Force Microscopy (NC-HEsFM), is introduced. It is demonstrated that NC-HEsFM can operate on multiple eigenmodes to perform ideal high-resolution ferroelectric domain mapping, standard ferroelectric hysteresis loop measurement, and controllable domain manipulation. By using a quartz tuning fork (QTF) sensor, multi-frequency operation, and heterodyne detection schemes, NC-HEsFM achieves a real non-contact yet non-destructive ferroelectric characterization with negligible electrostatic force effect and hence breaks the fundamental limitations of the conventional PFM. It is believed that NC-HEsFM can be extensively used in various ferroelectric or piezoelectric studies with providing substantially improved characterization performance. Meanwhile, the QTF-based force detection makes NC-HEsFM highly compatible for high-vacuum and low-temperature environments, providing ideal conditions for investigating the intrinsic ferroelectric phenomena with the possibility of achieving an atomically resolved ferroelectric characterization.
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Affiliation(s)
- Qibin Zeng
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
| | - Qicheng Huang
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Hongli Wang
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
- The Key Lab of Guangdong for Modern Surface Engineering Technology, National Engineering Laboratory for Modern Materials Surface Engineering Technology, Institute of New Materials, Guangdong Academy of Sciences, Guangzhou, 510650, China
| | - Caiwen Li
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
- Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Zhen Fan
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Deyang Chen
- Institute for Advanced Materials, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
- Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China
| | - Yuan Cheng
- Institute of High-Performance Computing, Agency for Science Technology and Research, Singapore, 138632, Singapore
- Monash Suzhou Research Institute, Suzhou, 215123, China
| | - Kaiyang Zeng
- Department of Mechanical Engineering, National University of Singapore, Singapore, 117576, Singapore
- NUS (Suzhou) Research Institute (NUSRI), Suzhou, 215123, China
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Cheng LQ, Wang K, Li JF. One dimensional lead-free (K,Na)NbO 3 nanostructures for a flexible self-powered sensor. Dalton Trans 2019; 48:3984-3989. [PMID: 30838364 DOI: 10.1039/c9dt00354a] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Lead-free (K,Na)NbO3 (KNN) nanorods (NRs), which have a relatively high piezoelectric response and good environmental compatibility, are expected to be used in the application fields of sensors, actuators, etc. In the present study, flexible composite devices with piezoelectric KNN nanostructures were successfully fabricated as a flexible and cost-effective strain sensor. The composition-controlled KNN nanorods (NRs) were synthesized via the molten salt reaction, while piezoresponse force microscopy (PFM) was utilized to characterize the three-dimensional (3-D) morphology as well as the piezoelectric properties of single crystalline KNN nanorods. Then, the KNN NR-polydimethylsiloxane (PDMS) films were fabricated through the tape casting process, and assembled into the self-powered sensor with Cu-coated polyethylene terephthalate (PET) substrates. The as-fabricated KNN-PDMS sensor was affected by the pressing and releasing activities of the human body, and the output voltage was measured concurrently. As a result, the strain sensor obtains an output signal of ∼0.5 V with KNN NR fillers of 0.5 vol% in PDMS, which implies that KNN NRs are promising in the application of lead-free flexible sensor devices.
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Affiliation(s)
- Li-Qian Cheng
- Department of Materials Science and Engineering, China University of Mining & Technology, Beijing, 100083, Beijing, P. R. China.
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Li T, Zeng K. Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:e1803064. [PMID: 30306656 DOI: 10.1002/adma.201803064] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/13/2018] [Revised: 07/22/2018] [Indexed: 06/08/2023]
Abstract
The characterization of the local multifield coupling phenomenon (MCP) in various functional/structural materials by using scanning probe microscopy (SPM)-based techniques is comprehensively reviewed. Understanding MCP has great scientific and engineering significance in materials science and engineering, as in many practical applications, materials and devices are operated under a combination of multiple physical fields, such as electric, magnetic, optical, chemical and force fields, and working environments, such as different atmospheres, large temperature fluctuations, humidity, or acidic space. The materials' responses to the synergetic effects of the multifield (physical and environmental) determine the functionalities, performance, lifetime of the materials, and even the devices' manufacturing. SPM techniques are effective and powerful tools to characterize the local effects of MCP. Here, an introduction of the local MCP, the descriptions of several important SPM techniques, especially the electrical, mechanical, chemical, and optical related techniques, and the applications of SPM techniques to investigate the local phenomena and mechanisms in oxide materials, energy materials, biomaterials, and supramolecular materials are covered. Finally, an outlook of the MCP and SPM techniques in materials research is discussed.
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Affiliation(s)
- Tao Li
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117576, Singapore
- Center for Spintronics and Quantum System, State Key Laboratory for Mechanical Behavior of Materials, School of Materials Science and Engineering, Xi'an Jiaotong University, Shaanxi, 710049, Xi'an, China
| | - Kaiyang Zeng
- Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore, 117576, Singapore
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Probing of multiple magnetic responses in magnetic inductors using atomic force microscopy. Sci Rep 2016; 6:20794. [PMID: 26852801 PMCID: PMC4745108 DOI: 10.1038/srep20794] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/04/2015] [Accepted: 01/12/2016] [Indexed: 11/09/2022] Open
Abstract
Even though nanoscale analysis of magnetic properties is of significant interest, probing methods are relatively less developed compared to the significance of the technique, which has multiple potential applications. Here, we demonstrate an approach for probing various magnetic properties associated with eddy current, coil current and magnetic domains in magnetic inductors using multidimensional magnetic force microscopy (MMFM). The MMFM images provide combined magnetic responses from the three different origins, however, each contribution to the MMFM response can be differentiated through analysis based on the bias dependence of the response. In particular, the bias dependent MMFM images show locally different eddy current behavior with values dependent on the type of materials that comprise the MI. This approach for probing magnetic responses can be further extended to the analysis of local physical features.
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