Antoja-Lleonart J, Ocelík V, Zhou S, de Hond K, Koster G, Rijnders G, Noheda B. Growth and Crystallization of SiO
2/GeO
2 Thin Films on Si(100) Substrates.
NANOMATERIALS (BASEL, SWITZERLAND) 2021;
11:1654. [PMID:
34201843 PMCID:
PMC8305750 DOI:
10.3390/nano11071654]
[Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/02/2021] [Revised: 06/16/2021] [Accepted: 06/21/2021] [Indexed: 11/17/2022]
Abstract
The growth of α-quartz-based piezoelectric thin films opens the door to higher-frequency electromechanical devices than those available through top-down approaches. We report on the growth of SiO2/GeO2 thin films by pulsed laser deposition and their subsequent crystallization. By introducing a devitrifying agent uniformly within the film, we are able to obtain the α-quartz phase in the form of platelets with lateral sizes above 100 μm at accessible temperatures. Films containing different amounts of devitrifying agent are investigated, and their crystallinity is ascertained with X-ray diffraction and electron back-scatter diffraction. Our work highlights the difficulty in crystallization when competing phases arise that have markedly different crystalline orientation.
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