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Borhade PS, Chen T, Chen DR, Chen YX, Yao YC, Yen ZL, Tsai CH, Hsieh YP, Hofmann M. Self-Expansion Based Multi-Patterning for 2D Materials Fabrication beyond the Lithographical Limit. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2311209. [PMID: 38098342 DOI: 10.1002/smll.202311209] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/03/2023] [Revised: 12/04/2023] [Indexed: 05/30/2024]
Abstract
Two-dimensional (2D) materials are promising successors for silicon transistor channels in ultimately scaled devices, necessitating significant research efforts to study their behavior at nanoscopic length scales. Unfortunately, current research has limited itself to direct patterning approaches, which limit the achievable resolution to the diffraction limit and introduce unwanted defects into the 2D material. The potential of multi-patterning to fabricate 2D materials features with unprecedented precision and low complexity at large scale is demonstrated here. By combining lithographic patterning of a mandrel and bottom-up self-expansion, this approach enables pattern resolution one order of magnitude below the lithographical resolution. In-depth characterization of the self-expansion double patterning (SEDP) process reveals the ability to manipulate the critical dimension with nanometer precision through a self-limiting and temperature-controlled oxidation process. These results indicate that the SEDP process can regain the quality and morphology of the 2D material, as shown by high-resolution microscopy and optical spectroscopy. This approach is shown to open up new avenues for research into high-performance, ultra-scaled 2D materials devices for future electronics.
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Affiliation(s)
- Poonam Subhash Borhade
- Department of Physics, National Taiwan University, Taipei, 10617, Taiwan
- Nano Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei, 10617, Taiwan
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
| | - Tawat Chen
- Department of Physics, National Taiwan University, Taipei, 10617, Taiwan
| | - Ding-Rui Chen
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
- International Graduate Program of Molecular Science and Technology, National Taiwan University, Taipei, 10617, Taiwan
- Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei, 10617, Taiwan
| | - Yu-Xiang Chen
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
- International Graduate Program of Molecular Science and Technology, National Taiwan University, Taipei, 10617, Taiwan
- Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei, 10617, Taiwan
| | - Yu-Chi Yao
- Department of Physics, National Taiwan University, Taipei, 10617, Taiwan
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
| | - Zhi-Long Yen
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
- International Graduate Program of Molecular Science and Technology, National Taiwan University, Taipei, 10617, Taiwan
- Molecular Science and Technology Program, Taiwan International Graduate Program, Academia Sinica, Taipei, 10617, Taiwan
| | - Chun Hsiung Tsai
- Taiwan Semiconductor Manufacturing Company (TSMC), Hsinchu, 30092, Taiwan
| | - Ya-Ping Hsieh
- Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
| | - Mario Hofmann
- Department of Physics, National Taiwan University, Taipei, 10617, Taiwan
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Solid-diffusion-facilitated cleaning of copper foil improves the quality of CVD graphene. Sci Rep 2019; 9:257. [PMID: 30670729 PMCID: PMC6343028 DOI: 10.1038/s41598-018-36390-4] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/19/2018] [Accepted: 11/09/2018] [Indexed: 11/23/2022] Open
Abstract
The quality of CVD-grown graphene is limited by the parallel nucleation of grains from surface impurities which leads to increased grain boundary densities. Currently employed cleaning methods cannot completely remove surface impurities since impurity diffusion from the bulk to the surface occurs during growth. We here introduce a new method to remove impurities not only on the surface but also from the bulk. By employing a solid cap during annealing that acts as a sink for impurities and leads to an enhancement of copper purity throughout the catalyst thickness. The high efficiency of the solid-diffusion-based transport pathway results in a drastic decrease in the surface particle concentration in a relatively short time, as evident in AFM and SIMS characterization of copper foils. Graphene grown on those substrates displays enhanced grain sizes and room-temperature, large-area carrier mobilities in excess of 5000 cm2/Vs which emphasizes the suitability of our approach for future graphene applications.
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Chen DR, Chiu SK, Wu MP, Hsu CC, Ting CC, Hofmann M, Hsieh YP. Ink-jet patterning of graphene by cap assisted barrier-guided CVD. RSC Adv 2019; 9:29105-29108. [PMID: 35528442 PMCID: PMC9071809 DOI: 10.1039/c9ra03117k] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/26/2019] [Accepted: 07/21/2019] [Indexed: 11/21/2022] Open
Abstract
Barrier-guided CVD growth could provide a new route to printed electronics by combining high quality 2D materials synthesis with scalable and cost-effective deposition methods. Unfortunately, we observe the limited stability of the barrier at growth conditions which results in its removal within minutes due to hydrogen etching. This work describes a route towards enhancing the stability of an ink-jet deposited barrier for high resolution patterning of high quality graphene. By modifying the etching kinetics under confinement, the barrier film could be stabilized and high resolution barriers could be retained even after 6 hours of graphene growth. Thus produced microscopic graphene devices exhibited an increase in conductivity by 6 orders of magnitude and a decrease in defectiveness by 48 times yielding performances that are superior to devices produced by traditional lithographical patterning which indicates the potential of our approach for future electronic applications. High-resolution graphene patterning through ink-jet deposition of a barrier and subsequent CVD is achieved by a confinement-assisted growth process.![]()
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Affiliation(s)
- Ding-Rui Chen
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Sheng-Kuei Chiu
- Institute of Atomic and Molecular Sciences
- Academia Sinica
- Tainan 106
- Taiwan
| | - Meng-Ping Wu
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Chia-Chen Hsu
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Chu-Chi Ting
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Mario Hofmann
- Department of Physics
- National Taiwan University
- Tainan 106
- Taiwan
| | - Ya-Ping Hsieh
- Institute of Atomic and Molecular Sciences
- Academia Sinica
- Tainan 106
- Taiwan
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4
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Impact of growth rate on graphene lattice-defect formation within a single crystalline domain. Sci Rep 2018; 8:4046. [PMID: 29511308 PMCID: PMC5840368 DOI: 10.1038/s41598-018-22512-5] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/19/2017] [Accepted: 02/23/2018] [Indexed: 11/26/2022] Open
Abstract
Chemical vapor deposition (CVD) is promising for the large scale production of graphene and other two-dimensional materials. Optimization of the CVD process for enhancing their quality is a focus of ongoing effort and significant progress has been made in decreasing the defectiveness associated with grain boundaries and nucleation spots. However, little is known about the quality and origin of structural defects in the outgrowing lattice which are present even in single-crystalline material and represent the limit of current optimization efforts. We here investigate the formation kinetics of such defects by controlling graphene’s growth rate over a wide range using nanoscale confinements. Statistical analysis of Raman spectroscopic results shows a clear trend between growth rate and defectiveness that is in quantitative agreement with a model where defects are healed preferentially at the growth front. Our results suggest that low growth rates are required to avoid the freezing of lattice defects and form high quality material. This conclusion is confirmed by a fourfold enhancement in graphene’s carrier mobility upon optimization of the growth rate.
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Chin HT, Shih CH, Hsieh YP, Ting CC, Aoh JN, Hofmann M. How does graphene grow on complex 3D morphologies? Phys Chem Chem Phys 2017; 19:23357-23361. [PMID: 28825734 DOI: 10.1039/c7cp03207b] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
The growth of two-dimensional materials into three-dimensional geometries holds the promise for high performance hybrid materials and novel architectures. The synthesis of such structures, however, proceeds in fundamentally different flow regimes compared to conventional CVD where pressure differences and wall collisions are neglected. We here demonstrate the remarkable stability of graphene growth under varying fluid dynamic flow regimes. We investigate the growth process across different flow conditions using confined growth in refractory pores. Analysis of the growth rate reveals a transport-limited process which allows experimental determination of the gas diffusion coefficient. The diffusion coefficient was found to be constant for large pore dimension but scales with pore dimension as the pore size decreases below the mean free path providing clear evidence for previously predicted Knudsen molecular-flow conditions for atomic confinement. Surprisingly, changes to the flow conditions by two orders of magnitude do not cause qualitative changes of the graphene growth process. This unique behavior was attributed to rarefied flow conditions by scaling analysis and an analytical relation between growth rate and constriction could be extracted that proves accurate throughout the investigated conditions. Our results demonstrate a fundamentally different growth process compared to traditional CVD processes that is akin to atomic layer deposition and highlight the feasibility of high-quality 2D-material growth on 3D morphologies with ultra-high aspect ratios.
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Affiliation(s)
- H T Chin
- Graduate of Institute of Opto-Mechatronics, National Chung Cheng University, Chia-Yi, 62102, Taiwan.
| | - C H Shih
- Graduate of Institute of Opto-Mechatronics, National Chung Cheng University, Chia-Yi, 62102, Taiwan.
| | - Y P Hsieh
- Graduate of Institute of Opto-Mechatronics, National Chung Cheng University, Chia-Yi, 62102, Taiwan. and Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, 10617, Taiwan
| | - C C Ting
- Graduate of Institute of Opto-Mechatronics, National Chung Cheng University, Chia-Yi, 62102, Taiwan.
| | - J N Aoh
- Department of Mechanical Engineering, National Chung Cheng University, Chia-Yi, 62102, Taiwan
| | - M Hofmann
- Department of Physics, National Taiwan University, Taipei, Taiwan
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Hsieh YP, Chen DR, Chiang WY, Chen KJ, Hofmann M. Recrystallization of copper at a solid interface for improved CVD graphene growth. RSC Adv 2017. [DOI: 10.1039/c6ra25750j] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
Annealing of Cu in contact with a solid cap was found to relax lattice strain and minimize surface roughness which enhanced graphene growth.
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Affiliation(s)
- Ya-Ping Hsieh
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Ding-Rui Chen
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Wan-Yu Chiang
- Graduate Institute of Opto-Mechatronics
- National Chung Cheng University
- Chiayi
- Taiwan
| | - Kai-Jyun Chen
- Department of Material Science and Engineering
- National Cheng Kung University
- Tainan
- Taiwan
| | - Mario Hofmann
- Department of Material Science and Engineering
- National Cheng Kung University
- Tainan
- Taiwan
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